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    • 1. 发明授权
    • Ultraviolet detecting device and manufacturing method thereof, and ultraviolet quantity measuring apparatus
    • 紫外线检测装置及其制造方法以及紫外线量测定装置
    • US08044484B2
    • 2011-10-25
    • US12915150
    • 2010-10-29
    • Noriyuki MiuraTadashi Chiba
    • Noriyuki MiuraTadashi Chiba
    • H01L29/78
    • H01L31/02162H01L27/144H01L31/105
    • The present invention provides an ultraviolet detecting device which comprises a silicon semiconductor layer having a thickness ranging from greater than or equal to 3 nm to less than or equal to 36 nm, which is formed over an insulating layer, lateral PN-junction type first and second photodiodes formed in the silicon semiconductor layer, an interlayer insulating film formed over the silicon semiconductor layer, a first filter layer made of silicon nitride, which is formed over the interlayer insulating film provided over the first photodiode and causes light lying in a wavelength range of an UV-B wave or higher to pass therethrough, and a second filter layer made of silicon nitride, which is formed over the interlayer insulating film provided over the second photodiode and allows light lying in a wavelength range of an UV-A wave or higher to pass therethrough.
    • 本发明提供了一种紫外线检测装置,其包括厚度范围大于或等于3nm至小于或等于36nm的硅半导体层,其形成在绝缘层上,首先是横向PN结型, 形成在硅半导体层中的第二光电二极管,形成在硅半导体层上的层间绝缘膜,由氮化硅制成的第一滤光层,形成在设置在第一光电二极管上的层间绝缘膜之上,并且产生波长范围的光 的UV-B波以上通过,以及由氮化硅构成的第二过滤层,其形成在设置在第二光电二极管上的层间绝缘膜的上方,并允许位于UV-A波的波长范围内的光或 较高通过。
    • 2. 发明申请
    • ULTRAVIOLET DETECTING DEVICE AND MANUFACTURING METHOD THREOF, AND ULTRAVIOLET QUANTITY MEASURING APPARATUS
    • 超紫外检测装置及制造方法及超紫外线测量装置
    • US20110042769A1
    • 2011-02-24
    • US12915150
    • 2010-10-29
    • Noriyuki MiuraTadashi Chiba
    • Noriyuki MiuraTadashi Chiba
    • H01L31/0232H01L31/18
    • H01L31/02162H01L27/144H01L31/105
    • The present invention provides an ultraviolet detecting device which comprises a silicon semiconductor layer having a thickness ranging from greater than or equal to 3 nm to less than or equal to 36 nm, which is formed over an insulating layer, lateral PN-junction type first and second photodiodes formed in the silicon semiconductor layer, an interlayer insulating film formed over the silicon semiconductor layer, a first filter layer made of silicon nitride, which is formed over the interlayer insulating film provided over the first photodiode and causes light lying in a wavelength range of an UV-B wave or higher to pass therethrough, and a second filter layer made of silicon nitride, which is formed over the interlayer insulating film provided over the second photodiode and allows light lying in a wavelength range of an UV-A wave or higher to pass therethrough.
    • 本发明提供了一种紫外线检测装置,其包括厚度范围大于或等于3nm至小于或等于36nm的硅半导体层,其形成在绝缘层上,首先是横向PN结型, 形成在硅半导体层中的第二光电二极管,形成在硅半导体层上的层间绝缘膜,由氮化硅制成的第一滤光层,形成在设置在第一光电二极管上的层间绝缘膜之上,并且产生波长范围的光 的UV-B波以上通过,以及由氮化硅构成的第二过滤层,其形成在设置在第二光电二极管上的层间绝缘膜之上,并允许位于UV-A波的波长范围内的光或 较高通过。
    • 3. 发明授权
    • Ultraviolet detecting device and manufacturing method thereof, and ultraviolet quantity measuring apparatus
    • 紫外线检测装置及其制造方法以及紫外线量测定装置
    • US07843031B2
    • 2010-11-30
    • US12036016
    • 2008-02-22
    • Noriyuki MiuraTadashi Chiba
    • Noriyuki MiuraTadashi Chiba
    • H01L29/78
    • H01L31/02162H01L27/144H01L31/105
    • The present invention provides an ultraviolet detecting device which comprises a silicon semiconductor layer having a thickness ranging from greater than or equal to 3 nm to less than or equal to 36 nm, which is formed over an insulating layer, lateral PN-junction type first and second photodiodes formed in the silicon semiconductor layer, an interlayer insulating film formed over the silicon semiconductor layer, a first filter layer made of silicon nitride, which is formed over the interlayer insulating film provided over the first photodiode and causes light lying in a wavelength range of an UV-B wave or higher to pass therethrough, and a second filter layer made of silicon nitride, which is formed over the interlayer insulating film provided over the second photodiode and allows light lying in a wavelength range of an UV-A wave or higher to pass therethrough.
    • 本发明提供了一种紫外线检测装置,其包括厚度范围大于或等于3nm至小于或等于36nm的硅半导体层,其形成在绝缘层上,首先是横向PN结型, 形成在硅半导体层中的第二光电二极管,形成在硅半导体层上的层间绝缘膜,由氮化硅制成的第一滤光层,形成在设置在第一光电二极管上的层间绝缘膜之上,并且产生波长范围的光 的UV-B波以上通过,以及由氮化硅构成的第二过滤层,其形成在设置在第二光电二极管上的层间绝缘膜之上,并允许位于UV-A波的波长范围内的光或 较高通过。
    • 4. 发明申请
    • ULTRAVIOLET DETECTING DEVICE AND MANUFACTURING METHOD THEREOF, AND ULTRAVIOLET QUANTITY MEASURING APPARATUS
    • 超紫外检测装置及其制造方法及超紫外线测量装置
    • US20080237763A1
    • 2008-10-02
    • US12036016
    • 2008-02-22
    • Noriyuki MiuraTadashi Chiba
    • Noriyuki MiuraTadashi Chiba
    • H01L31/0203H01L31/18
    • H01L31/02162H01L27/144H01L31/105
    • The present invention provides an ultraviolet detecting device which comprises a silicon semiconductor layer having a thickness ranging from greater than or equal to 3 nm to less than or equal to 36 nm, which is formed over an insulating layer, lateral PN-junction type first and second photodiodes formed in the silicon semiconductor layer, an interlayer insulating film formed over the silicon semiconductor layer, a first filter layer made of silicon nitride, which is formed over the interlayer insulating film provided over the first photodiode and causes light lying in a wavelength range of an UV-B wave or higher to pass therethrough, and a second filter layer made of silicon nitride, which is formed over the interlayer insulating film provided over the second photodiode and allows light lying in a wavelength range of an UV-A wave or higher to pass therethrough.
    • 本发明提供了一种紫外线检测装置,其包括厚度范围大于或等于3nm至小于或等于36nm的硅半导体层,其形成在绝缘层上,首先是横向PN结型, 形成在硅半导体层中的第二光电二极管,形成在硅半导体层上的层间绝缘膜,由氮化硅制成的第一滤光层,形成在设置在第一光电二极管上的层间绝缘膜之上,并且产生波长范围的光 的UV-B波以上通过,以及由氮化硅构成的第二过滤层,其形成在设置在第二光电二极管上的层间绝缘膜的上方,并允许位于UV-A波的波长范围内的光或 较高通过。
    • 5. 发明申请
    • Voltage controlled oscillator
    • 压控振荡器
    • US20080007364A1
    • 2008-01-10
    • US11783481
    • 2007-04-10
    • Tadashi Chiba
    • Tadashi Chiba
    • H03B5/12
    • H03B5/1228H03B5/1215H03B5/1253H03B5/1293H03B2200/0062
    • A voltage controlled oscillator (VCO) conducts current on two paths through parallel inductors and parallel cross-coupled metal-oxide-semiconductor transistors. A pair of varactors are connected in series on a third path extending from a node between one inductor and one transistor to a node between the other inductor and the other transistor. The oscillation frequency is controlled by a voltage applied to a node between the two varactors on the third path. Each varactor is structured as a metal-oxide-semiconductor transistor with interconnected source and drain electrodes, a gate electrode, a body region below the gate electrode, and a body terminal region extending beyond the gate electrode. An adjustment voltage applied to the body terminal region shifts the voltage-capacitance curve of the varactor and the voltage-frequency curve of the VCO without changing the shapes of these curves, providing a simple way to adjust the VCO to meet application requirements.
    • 压控振荡器(VCO)通过并联电感器和并联交叉耦合的金属氧化物半导体晶体管在两个路径上传导电流。 一对变容二极管在从一个电感器和一个晶体管之间的节点延伸到另一个电感器和另一个晶体管之间的节点的第三路径上串联连接。 振荡频率由施加到第三路径上的两个变容二极管之间的节点的电压控制。 每个变容二极管被构造为具有互连的源极和漏极电极,栅极电极,栅极电极下方的主体区域以及延伸超过栅极电极的主体端子区域的金属氧化物半导体晶体管。 施加到主体端子区域的调整电压使变容二极管的电压 - 电容曲线和VCO的电压 - 频率曲线偏移,而不改变这些曲线的形状,提供了一种调整VCO以满足应用要求的简单方法。
    • 6. 发明授权
    • Braking force distribution controlling apparatus
    • 制动力分配控制装置
    • US5938299A
    • 1999-08-17
    • US922673
    • 1997-09-03
    • Masahiro HaraTadashi Chiba
    • Masahiro HaraTadashi Chiba
    • B60T8/26B60T8/1766B60T8/28B60T8/58B60T13/00
    • B60T8/1766
    • In a braking force distribution controlling apparatus mounted on a car and arranged to perform such a control as to make a rear-wheel braking force smaller than a front-wheel braking force when predetermined initiation conditions are met, one of the initiation condition is to satisfy either one of such a first condition that a body deceleration is not less than a first predetermined deceleration K1 and that a rear-wheel slip value is a first predetermined value or more greater than a front-wheel slip value and such a second condition that the body deceleration is not less than a second predetermined deceleration K2 which is a value greater than the aforementioned first predetermined deceleration K1.
    • 在安装在轿厢上的制动力分配控制装置中,在满足规定的起动条件的情况下,配置为进行使后轮制动力小于前轮制动力的控制,起动条件之一为满足 这样的第一条件中的任何一个,即身体减速度不小于第一预定减速度K1,并且后轮滑移值是比前轮滑移值大的第一预定值或更大的第二条件, 车身减速度不小于比上述第一预定减速度K1大的值的第二预定减速度K2。
    • 9. 发明申请
    • SEMICONDUCTOR DEVICE, OPTICAL MEASURING AND DETECTING DEVICE, AND METHOD OF MANUFACTURING THE SAME
    • 半导体器件,光学测量和检测器件及其制造方法
    • US20080258155A1
    • 2008-10-23
    • US12101383
    • 2008-04-11
    • Tadashi Chiba
    • Tadashi Chiba
    • H01L27/15H01L31/0232
    • H01L31/02164H01L27/1203H01L31/02005H01L31/02019H01L2224/05554H01L2224/48091H01L2924/00014
    • Disclosed is a semiconductor device which is capable of preventing operation of the signal processing part from being unstable due to light not blocked by the light blocking layer by being obliquely incident on the signal processing part and preventing the operation of the signal processing part from being unstable due to stray charges occurring by light with which the light blocking layer is irradiated. In a light-incident part 12 having a light receiving element 36 and a signal processing circuit 38 that processes an output signal from the light receiving element 36, which are formed on a SOI substrate, a plurality of contact plugs 52 electrically connected to the light blocking layer 42 are laminated in the thickness direction of the SOI substrate along an edge of the light blocking layer that blocks the sunlight, with the uppermost of wiring layers on the signal processing circuit 38 as the light blocking layer 42. The plurality of contact plugs 52 have a ground or a potential sufficient to draw out stray charges occurring in the light blocking layer.
    • 公开了一种半导体器件,其能够防止信号处理部分的操作由于被光阻挡层不被信号处理部件倾斜入射而不被阻挡而不稳定,并且防止信号处理部件的操作不稳定 由于光遮挡层被照射的光产生杂散电荷。 在具有光接收元件36和信号处理电路38的光入射部分12中,处理来自形成在SOI衬底上的光接收元件36的输出信号,多个电连接到光的接触插塞52 阻挡层42沿着阻挡太阳光的遮光层的边缘沿着SOI衬底的厚度方向层叠,信号处理电路38上的最上层布线层作为遮光层42。 多个接触插塞52具有足以引出在阻光层中产生的杂散电荷的接地或电位。
    • 10. 发明授权
    • Semiconductor element, manufacturing method thereof, and high frequency integrated circuit using the semiconductor element
    • 半导体元件及其制造方法以及使用该半导体元件的高频集成电路
    • US07248480B2
    • 2007-07-24
    • US11056280
    • 2005-02-14
    • Tadashi Chiba
    • Tadashi Chiba
    • H01R9/00
    • H01L28/10H01L23/5227H01L27/0641H01L2924/0002H01L2924/00
    • A semiconductor element comprises a capacitance variable section and an inductor section. In the capacitance variable section, a variable capacitance diode equipped with first and second control electrodes is provided on an insulative substrate. The inductor section is formed on the capacitance variable section formed with the variable capacitance diode. The inductor section is formed in an insulating layer provided on the variable capacitance diode. A first input/output electrode, a second input/output electrode, and first and second control input/output electrodes are provided in exposed form on the upper side of the insulating layer provided on the capacitance variable section. Further, a turbinated spiral electrode that electrically connects the first input/output electrode and the second input/output electrode, a first control lead-out electrode that electrically connects between the first control electrode and the first control input/output electrode, and a second control lead-out electrode that electrically connects between the second control electrode and each second control input/output electrode, are provided within the insulating layer.
    • 半导体元件包括电容可变部分和电感器部分。 在电容可变部分中,在绝缘基板上设置配备有第一和第二控制电极的可变电容二极管。 电感器部分形成在由可变电容二极管形成的电容变量部分上。 电感器部分形成在设置在可变电容二极管上的绝缘层中。 第一输入/输出电极,第二输入/输出电极以及第一和第二控制输入/输出电极以暴露的形式设置在设置在电容可变部分上的绝缘层的上侧。 此外,电连接第一输入/输出电极和第二输入/输出电极的云化螺旋电极,电连接第一控制电极和第一控制输入/输出电极之间的第一控制引出电极和第二控制引出电极 控制引出电极,其在第二控制电极和每个第二控制输入/输出电极之间电连接,设置在绝缘层内。