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    • 1. 发明授权
    • Corrosion-resistant bit patterned media (BPM) and discrete track media (DTM) and methods of production thereof
    • 耐腐蚀位图案介质(BPM)和离散轨道介质(DTM)及其生产方法
    • US08717710B2
    • 2014-05-06
    • US13466970
    • 2012-05-08
    • Qing DaiBruno MarchonKatsumi MabuchiMina Amo
    • Qing DaiBruno MarchonKatsumi MabuchiMina Amo
    • G11B5/667G11B5/82
    • G11B5/84B32B9/00G11B5/72G11B5/746G11B5/8412G11B5/855
    • In one embodiment, a magnetic recording medium includes a magnetic recording layer including a magnetic material characterized by having convex and concave portions, the convex portions acting as magnetic regions, a nonmagnetic material positioned within each concave portion of the magnetic material which act as nonmagnetic regions that separate the magnetic regions, an organic material layer which exhibits a corrosion-inhibiting characteristic with respect to cobalt or cobalt alloy positioned on a nonmagnetic region side of each concave portion, and an oxide layer and/or hydroxide layer positioned adjacent the organic material layer on a magnetic region side of each concave portion of the magnetic material. In another embodiment, the magnetic recording medium may be a patterned recording layer having a protective film, and the oxide layer and/or hydroxide layer may be positioned at least in defect portions of the protective film.
    • 在一个实施例中,磁记录介质包括磁记录层,该磁记录层包括磁性材料,其特征在于具有凸部和凹部,凸部作为磁区,位于磁性材料的每个凹部内的非磁性材料作为非磁性区 分离磁性区域,相对于位于每个凹部的非磁性区域侧的钴或钴合金表现出腐蚀抑制特性的有机材料层和邻近有机材料层定位的氧化物层和/或氢氧化物层 在磁性材料的每个凹部的磁性区域侧。 在另一个实施例中,磁记录介质可以是具有保护膜的图案化记录层,并且氧化物层和/或氢氧化物层可至少位于保护膜的缺陷部分中。
    • 6. 发明申请
    • Probe Microscope
    • 探头显微镜
    • US20100306886A1
    • 2010-12-02
    • US12789796
    • 2010-05-28
    • Motoko HARADAKyoko HonboKatsumi Mabuchi
    • Motoko HARADAKyoko HonboKatsumi Mabuchi
    • G01Q30/00
    • G01Q60/44G01Q60/02
    • An object of the present invention is to provide a probe microscope that permits qualitative and quantitative evaluation on ions existing near the surface of a sample and permits to detect further simply and easily such as impurities, flaws and corrosion origins existing on the sample in high sensitivity. A probe microscope according to the present invention is provided with a test cell that holds a sample and permits to receive liquid, a probe, a counter electrode, a reference electrode, a drive mechanism that causes the probe to follow the surface of the sample as well as to scan the same, a potential control portion that controls a potential between the probe and the reference electrode and a current measuring portion that measures a current flowing between the probe and the counter electrode, and is characterized in that the material of the probe is constituted by a conductive body containing any of gold or gold alloy, carbon or carbon compound, boron, zinc, lead, tin and mercury.
    • 本发明的目的是提供一种探针显微镜,其允许对存在于样品表面附近的离子进行定性和定量评估,并且允许以高灵敏度进一步简单且容易地检测样品中存在的杂质,缺陷和腐蚀起源。 。 根据本发明的探针显微镜设置有容纳样品并允许接收液体,探针,对电极,参比电极,使探针跟随样品表面的驱动机构的测试电池, 以及扫描相同的电位控制部分,其控制探针和参考电极之间的电势;以及电流测量部分,其测量在探针和对电极之间流动的电流,其特征在于探针的材料 由含有金或金合金,碳或碳化合物,硼,锌,铅,锡和汞的导电体构成。