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    • 1. 发明授权
    • Methods and apparatus for controlling tunable antenna systems
    • 用于控制可调谐天线系统的方法和装置
    • US09041617B2
    • 2015-05-26
    • US13332193
    • 2011-12-20
    • Robert S. SorensenQingxiang LiMatthew A. MowJinku Kim
    • Robert S. SorensenQingxiang LiMatthew A. MowJinku Kim
    • H01Q1/50H01Q7/00H01Q23/00H03J3/20
    • H01Q5/314H01Q5/328H01Q5/335H01Q7/005H01Q23/00H03J3/20H03J2200/11H04B1/40
    • An electronic device may include an adjustable power supply, at least one antenna, and associated antenna tuning circuitry. The antenna tuning circuitry may be an integral part of the antenna and may include a control circuit and at least one tunable element. The tunable element may include radio-frequency switches, continuously/semi-continuously adjustable components such as tunable resistors, inductors, and capacitors, and other load circuits that provide desired impedance characteristics. The power supply may provide power supply voltage signals to the antenna tuning circuitry via inductive coupling. The power supply voltage signals may be modulated according to a predetermined lookup table during device startup so that the control circuit is configured to generate desired control signals. These control signals adjust the tunable element so that the antenna can support wireless operation in desired frequency bands.
    • 电子设备可以包括可调电源,至少一个天线和相关联的天线调谐电路。 天线调谐电路可以是天线的组成部分,并且可以包括控制电路和至少一个可调谐元件。 可调元件可以包括射频开关,连续/半连续可调组件,例如可调电阻器,电感器和电容器,以及提供所需阻抗特性的其它负载电路。 电源可以通过电感耦合向天线调谐电路提供电源电压信号。 在设备启动期间,可以根据预定的查找表来调制电源电压信号,使得控制电路被配置为产生期望的控制信号。 这些控制信号调节可调谐元件,使天线能够支持所需频带的无线操作。
    • 3. 发明授权
    • Methods for testing wireless electronic devices using automatic self-test mode
    • 使用自动自检模式测试无线电子设备的方法
    • US09069037B2
    • 2015-06-30
    • US13359292
    • 2012-01-26
    • Qishan YuJeffrey M. ThomaRobert S. Sorensen
    • Qishan YuJeffrey M. ThomaRobert S. Sorensen
    • G01R31/28H04M1/24
    • G01R31/2822G01R31/2843H04M1/24
    • A device under test (DUT) may be tested using a radio-frequency test station. The DUT may include at least one antenna, wireless communications circuitry associated with the antenna, and other peripheral components such as a camera module, a display module, and audio circuitry. The test station may include a shielded enclosure in which the DUT is placed during testing. The DUT need not be electrically wired to any test equipment. The DUT may be configured to operate in self test mode. The DUT may be configured to obtain baseline noise floor measurements while all the peripheral components are deactivated and may be configured to obtain elevated noise floor measurements while selectively activating desired subsets of the peripheral components. The difference between the elevated and baseline noise floor measurements may be computed to determine whether at least some of the peripheral components negatively impact the antenna performance by an excessive amount.
    • 被测设备(DUT)可以使用射频测试台进行测试。 DUT可以包括至少一个天线,与天线相关联的无线通信电路以及诸如相机模块,显示模块和音频电路的其它外围组件。 测试台可以包括在测试期间放置DUT的屏蔽外壳。 DUT不需要电连接到任何测试设备。 DUT可以配置为在自检模式下运行。 DUT可以被配置为在所有外围组件被去激活时获得基线噪声本底测量值,并且可以被配置为在选择性地激活外围组件的期望子集的同时获得提高的本底噪声测量值。 可以计算升高和基线噪声基底测量值之间的差异,以确定至少一些外围组件是否会对天线性能造成过大的负面影响。
    • 4. 发明申请
    • Methods for Testing Wireless Electronic Devices Using Automatic Self-Test Mode
    • 使用自动自检模式测试无线电子设备的方法
    • US20130197850A1
    • 2013-08-01
    • US13359292
    • 2012-01-26
    • Qishan YuJeffrey M. ThomaRobert S. Sorensen
    • Qishan YuJeffrey M. ThomaRobert S. Sorensen
    • G06F19/00G01R31/02
    • G01R31/2822G01R31/2843H04M1/24
    • A device under test (DUT) may be tested using a radio-frequency test station. The DUT may include at least one antenna, wireless communications circuitry associated with the antenna, and other peripheral components such as a camera module, a display module, and audio circuitry. The test station may include a shielded enclosure in which the DUT is placed during testing. The DUT need not be electrically wired to any test equipment. The DUT may be configured to operate in self test mode. The DUT may be configured to obtain baseline noise floor measurements while all the peripheral components are deactivated and may be configured to obtain elevated noise floor measurements while selectively activating desired subsets of the peripheral components. The difference between the elevated and baseline noise floor measurements may be computed to determine whether at least some of the peripheral components negatively impact the antenna performance by an excessive amount.
    • 被测设备(DUT)可以使用射频测试台进行测试。 DUT可以包括至少一个天线,与天线相关联的无线通信电路以及诸如相机模块,显示模块和音频电路的其它外围组件。 测试台可以包括在测试期间放置DUT的屏蔽外壳。 DUT不需要电连接到任何测试设备。 DUT可以配置为在自检模式下运行。 DUT可以被配置为在所有外围组件被去激活时获得基线噪声本底测量值,并且可以被配置为在选择性地激活外围组件的期望子集的同时获得提高的本底噪声测量值。 可以计算升高和基线噪声基底测量值之间的差异,以确定至少一些外围组件是否会对天线性能造成过大的负面影响。