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    • 1. 发明授权
    • Memory device and method of reading data
    • US11107537B2
    • 2021-08-31
    • US16987658
    • 2020-08-07
    • SAMSUNG ELECTRONICS CO., LTD.
    • Su Chang JeonSeung Bum KimJi Young Lee
    • G11C16/26G11C16/04G11C16/24G11C16/10H01L27/115G11C16/08
    • A non-volatile memory includes a memory cell region including a first metal pad, a peripheral circuit region including a second metal pad and vertically connected to the memory cell region by the first metal pad and the second metal pad, a memory cell array region in the memory cell region including an outer region proximate a first end of the memory cell region and an inner region separated from the first end by the outer region, first and second bit lines in the memory cell region, an outer memory cell string in the memory cell region including memory cells connected to an outer pillar extending vertically upward through the outer region, and an inner memory cell string including memory cells connected to an inner pillar extending vertically upward through the inner region, and a data input/output (I/O) circuit in the peripheral circuit region including a page buffer circuit that connects the first bit line during a first read operation directed to memory cells of the outer memory cell string, and connects the second bit line during a second read operation directed to memory cells of the inner memory cell string, and a read voltage determination unit that selects a first optimal read voltage used during the first read operation, and a second optimal read voltage used during the second read operation.