会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 1. 发明授权
    • Electrostatic chuck device
    • 静电吸盘装置
    • US09209061B2
    • 2015-12-08
    • US14345967
    • 2012-09-26
    • Sumitomo Osaka Cement Co., Ltd.
    • Ryuuji HayaharaKazunori IshimuraMamoru Kosakai
    • H01L21/683H01T23/00H01L21/67
    • H01L21/6833H01L21/67109H01L21/6831
    • An electrostatic chuck device is provided in which it is possible to uniformize an in-plane temperature distribution in a placement surface on which a plate-shaped sample such as a wafer is placed and it is possible to improve in-plane uniformity of plasma etching of the plate-shaped sample by uniformizing plasma density on the plate-shaped sample. The electrostatic chuck device includes an electrostatic chuck section that has an upper surface as a placement surface on which a plate-shaped sample is placed, and is made to have an internal electrode for electrostatic adsorption built-in, and a cooling base section that cools the electrostatic chuck section, wherein a heater element (4) having a heater pattern (21) of a predetermined shape is provided between the electrostatic chuck section and the cooling base section, and an island-shaped portion (24) that is independent from the heater pattern (21) and is made of the same material as the heater pattern (21) is provided in a gap portion (23) of the heater pattern (21).
    • 提供了一种静电卡盘装置,其中可以使诸如晶片的板状样品的放置表面中的面内温度分布均匀化,并且可以提高等离子体蚀刻的面内均匀性 该板状样品通过使板状样品上的等离子体密度均匀化。 静电吸盘装置包括具有上表面作为放置表面的板状样品的静电吸盘部,并且具有内置静电吸附用内部电极和冷却基部 静电吸盘部分,其中具有预定形状的加热器图案(21)的加热器元件(4)设置在静电吸盘部分和冷却基部之间,岛形部分(24)独立于 加热器图案(21)由与加热器图案(21)的间隙部分(23)中的加热器图案(21)相同的材料制成。
    • 3. 发明申请
    • ELECTROSTATIC CHUCK DEVICE
    • 静电切割装置
    • US20140301010A1
    • 2014-10-09
    • US14345967
    • 2012-09-26
    • Sumitomo Osaka Cement Co., Ltd.
    • Ryuuji HayaharaKazunori IshimuraMamoru Kosakai
    • H01L21/683
    • H01L21/6833H01L21/67109H01L21/6831
    • An electrostatic chuck device is provided in which it is possible to uniformize an in-plane temperature distribution in a placement surface on which a plate-shaped sample such as a wafer is placed and it is possible to improve in-plane uniformity of plasma etching of the plate-shaped sample by uniformizing plasma density on the plate-shaped sample. The electrostatic chuck device includes an electrostatic chuck section that has an upper surface as a placement surface on which a plate-shaped sample is placed, and is made to have an internal electrode for electrostatic adsorption built-in, and a cooling base section that cools the electrostatic chuck section, wherein a heater element (4) having a heater pattern (21) of a predetermined shape is provided between the electrostatic chuck section and the cooling base section, and an island-shaped portion (24) that is independent from the heater pattern (21) and is made of the same material as the heater pattern (21) is provided in a gap portion (23) of the heater pattern (21).
    • 提供了一种静电卡盘装置,其中可以使诸如晶片的板状样品放置在的放置表面中的面内温度分布均匀化,并且可以提高等离子体蚀刻的面内均匀性 该板状样品通过使板状样品上的等离子体密度均匀化。 静电吸盘装置包括具有上表面作为放置表面的板状样品的静电吸盘部,并且具有内置静电吸附用内部电极和冷却基部 静电吸盘部分,其中具有预定形状的加热器图案(21)的加热器元件(4)设置在静电吸盘部分和冷却基部之间,岛形部分(24)独立于 加热器图案(21)由与加热器图案(21)的间隙部分(23)中的加热器图案(21)相同的材料制成。