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    • 2. 发明申请
    • METHOD AND APPARATUS FOR MEASURING DAMAGE TO AN ORGANIC LAYER OF A THIN FILM ENCAPSULATION
    • 用于测量薄膜覆盖有机层的损伤的方法和装置
    • US20140320853A1
    • 2014-10-30
    • US14040626
    • 2013-09-28
    • SAMSUNG DISPLAY CO., LTD.
    • Ki-Young YeonNa-Ri AhnKang-Hyun KimJung-Hwa Park
    • G01N21/88
    • G01N21/88G01N21/8422G01N2021/8438
    • A method of measuring damage of an organic layer of a thin film encapsulation includes: preparing a thin film encapsulation structure in which an inorganic layer is stacked on an organic layer, in which a light-emitting material is mixed; irradiating light to the thin film encapsulation structure so that light is emitted from the light-emitting material, the intensity of light emitted from the light emitting material decreasing over time; detecting a light emission lifetime of the light emitted from the light emitting material; and determining a degree of damage to the organic layer based on the light emission lifetime. Accordingly, a degree of the damage to the organic layer due to plasma may be easily detected, and the damage to the organic layer may be minimized based on the detected degree of the damage by improving plasma process conditions for an operation of forming an inorganic layer.
    • 测量薄膜封装的有机层的损伤的方法包括:制备其中混合有发光材料的有机层上的无机层堆叠的薄膜封装结构; 向所述薄膜封装结构照射光,使得从所述发光材料发射光,从所述发光材料发射的光的强度随时间而减小; 检测从发光材料发射的光的发光寿命; 并根据发光寿命确定有机层的损伤程度。 因此,可以容易地检测到由等离子体引起的对有机层的损伤程度,并且通过改善形成无机层的操作的等离子体处理条件,可以基于检测到的损伤程度来最小化对有机层的损伤 。
    • 3. 发明授权
    • Liquid crystal display and method of driving the same
    • 液晶显示器及其驱动方法
    • US08810496B2
    • 2014-08-19
    • US14165037
    • 2014-01-27
    • Samsung Display Co., Ltd.
    • Bong-Im ParkKang-Hyun KimJong-Hyon ParkWoo-Chul KimYun-Jae KimJae-Won JeongBong-Ju JunYong-Jun ChoiWoo-Young Lee
    • G09G3/36G09G3/20
    • G09G3/3648G09G3/2003G09G3/3607G09G2320/0252G09G2320/0261G09G2340/16
    • A liquid crystal display includes a timing controller and a liquid crystal panel. The timing controller sequentially receives first through third primitive image signals and sequentially outputs first through third corrected image signals. The liquid crystal panel displays an image based on the first through third corrected image signals. The timing controller generates a first converted image signal having a first gray level based on the first primitive image signal and stores the first converted image signal. The second primitive image signal has a second gray level and the timing controller generates a second converted image signal having a third gray level higher than the second gray level when the second gray level is lower than the first gray level. The timing controller generates the third corrected image signal using the second converted image signal and the third primitive image signal.
    • 液晶显示器包括时序控制器和液晶面板。 定时控制器顺序地接收第一至第三原始图像信号,并顺序地输出第一至第三校正图像信号。 液晶面板基于第一至第三校正图像信号显示图像。 定时控制器基于第一原始图像信号生成具有第一灰度级的第一转换图像信号,并存储第一转换图像信号。 第二原始图像信号具有第二灰度级,并且当第二灰度级低于第一灰度级时,定时控制器产生具有比第二灰度级高的第三灰度级的第二转换图像信号。 定时控制器使用第二转换图像信号和第三原始图像信号产生第三校正图像信号。
    • 9. 发明授权
    • Method and apparatus for measuring damage to an organic layer of a thin film encapsulation
    • 测量薄膜封装有机层损伤的方法和装置
    • US09091661B2
    • 2015-07-28
    • US14040626
    • 2013-09-28
    • SAMSUNG DISPLAY CO., LTD.
    • Ki-Young YeonNa-Ri AhnKang-Hyun KimJung-Hwa Park
    • G01N21/88G01N21/84
    • G01N21/88G01N21/8422G01N2021/8438
    • A method of measuring damage of an organic layer of a thin film encapsulation includes: preparing a thin film encapsulation structure in which an inorganic layer is stacked on an organic layer, in which a light-emitting material is mixed; irradiating light to the thin film encapsulation structure so that light is emitted from the light-emitting material, the intensity of light emitted from the light emitting material decreasing over time; detecting a light emission lifetime of the light emitted from the light emitting material; and determining a degree of damage to the organic layer based on the light emission lifetime. Accordingly, a degree of the damage to the organic layer due to plasma may be easily detected, and the damage to the organic layer may be minimized based on the detected degree of the damage by improving plasma process conditions for an operation of forming an inorganic layer.
    • 测量薄膜封装的有机层的损伤的方法包括:制备其中混合有发光材料的有机层上的无机层堆叠的薄膜封装结构; 向所述薄膜封装结构照射光,使得从所述发光材料发射光,从所述发光材料发射的光的强度随时间而减小; 检测从发光材料发射的光的发光寿命; 并根据发光寿命确定有机层的损伤程度。 因此,可以容易地检测到由等离子体引起的对有机层的损伤程度,并且通过改善形成无机层的操作的等离子体处理条件,可以基于检测到的损伤程度来最小化对有机层的损伤 。