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1. 发明申请

US20160231380A1 THIRD TAP CIRCUITRY CONTROLLING LINKING FIRST AND SECOND TAP CIRCUITRY 审中-公开
标题翻译：第三个TAP电路控制连接第一和第二TAP电路
公开(公告)号：US20160231380A1
公开(公告)日：2016-08-11
申请号：US15134877
申请日：2016-04-21
申请人： TEXAS INSTRUMENTS INCORPORATED
发明人： Lee D. Whetsel , Baher S. Haroun , Brian J. Lasher , Anjali Vij
IPC分类号： G01R31/3177 , G01R31/317
CPC分类号： G01R31/3177 , G01R31/31727 , G01R31/318555
摘要： IEEE 1149.1 Test Access Ports (TAPs) may be utilized at both IC and intellectual property core design levels. TAPs serve as serial communication ports for accessing a variety of embedded circuitry within ICs and cores including; IEEE 1149.1 boundary scan circuitry, built in test circuitry, internal scan circuitry, IEEE 1149.4 mixed signal test circuitry, IEEE P5001 in-circuit emulation circuitry, and IEEE P1532 in-system programming circuitry. Selectable access to TAPs within ICs is desirable since in many instances being able to access only the desired TAP(s) leads to improvements in the way testing, emulation, and programming may be performed within an IC. A TAP linking module is described that allows TAPs embedded within an IC to be selectively accessed using 1149.1 instruction scan operations.
摘要翻译： IEEE 1149.1测试接入端口（TAP）可用于IC和知识产权核心设计级别。 TAP用作用于访问IC和核心内的各种嵌入式电路的串行通信端口，包括： IEEE 1149.1边界扫描电路，内置测试电路，内部扫描电路，IEEE 1149.4混合信号测试电路，IEEE P5001在线仿真电路和IEEE P1532系统编程电路。可选择地访问IC内的TAP是理想的，因为在许多情况下，仅能够访问期望的TAP导致在IC内可以执行测试，仿真和编程的方式的改进。描述了一种TAP链接模块，其允许使用1149.1指令扫描操作来选择性地访问嵌入在IC内的TAP。

2. 发明授权

US09817070B2 Third tap circuitry controlling linking first and second tap circuitry 有权
公开(公告)号：US09817070B2
公开(公告)日：2017-11-14
申请号：US15134877
申请日：2016-04-21
申请人： TEXAS INSTRUMENTS INCORPORATED
发明人： Lee D. Whetsel , Baher S. Haroun , Brian J. Lasher , Anjali Vij
IPC分类号： G01R31/3177 , G01R31/3185 , G01R31/317
CPC分类号： G01R31/3177 , G01R31/31727 , G01R31/318555
摘要： IEEE 1149.1 Test Access Ports (TAPs) may be utilized at both IC and intellectual property core design levels. TAPs serve as serial communication ports for accessing a variety of embedded circuitry within ICs and cores including; IEEE 1149.1 boundary scan circuitry, built in test circuitry, internal scan circuitry, IEEE 1149.4 mixed signal test circuitry, IEEE P5001 in-circuit emulation circuitry, and IEEE P1532 in-system programming circuitry. Selectable access to TAPs within ICs is desirable since in many instances being able to access only the desired TAP(s) leads to improvements in the way testing, emulation, and programming may be performed within an IC. A TAP linking module is described that allows TAPs embedded within an IC to be selectively accessed using 1149.1 instruction scan operations.

3. 发明授权

US08726111B2 Shifting instruction data through IRS of IC TAP and TLM 有权
标题翻译：通过IC TAP和TLM的IRS转移指令数据
公开(公告)号：US08726111B2
公开(公告)日：2014-05-13
申请号：US13938793
申请日：2013-07-10
申请人： Texas Instruments Incorporated
发明人： Lee D. Whetsel , Baher S. Haroun , Brian J. Lasher , Anjali Vij
IPC分类号： G01R31/28
CPC分类号： G01R31/3177 , G01R31/31727 , G01R31/318555
摘要： IEEE 1149.1 Test Access Ports (TAPs) may be utilized at both IC and intellectual property core design levels. TAPs serve as serial communication ports for accessing a variety of embedded circuitry within ICs and cores including; IEEE 1149.1 boundary scan circuitry, built in test circuitry, internal scan circuitry, IEEE 1149.4 mixed signal test circuitry, IEEE P5001 in-circuit emulation circuitry, and IEEE P1532 in-system programming circuitry. Selectable access to TAPs within ICs is desirable since in many instances being able to access only the desired TAP(s) leads to improvements in the way testing, emulation, and programming may be performed within an IC. A TAP linking module is described that allows TAPs embedded within an IC to be selectively accessed using 1149.1 instruction scan operations.
摘要翻译： IEEE 1149.1测试接入端口（TAP）可用于IC和知识产权核心设计级别。 TAP用作用于访问IC和核心内的各种嵌入式电路的串行通信端口，包括： IEEE 1149.1边界扫描电路，内置测试电路，内部扫描电路，IEEE 1149.4混合信号测试电路，IEEE P5001在线仿真电路和IEEE P1532系统编程电路。可选择地访问IC内的TAP是理想的，因为在许多情况下，仅能够访问期望的TAP导致在IC内可以执行测试，仿真和编程的方式的改进。描述了一种TAP链接模块，其允许使用1149.1指令扫描操作来选择性地访问嵌入在IC内的TAP。

4. 发明申请

US20130305108A1 1149.1 TAP LINKING MODULES 有权
公开(公告)号：US20130305108A1
公开(公告)日：2013-11-14
申请号：US13938793
申请日：2013-07-10
申请人： Texas Instruments Incorporated
发明人： Lee D. Whetsel , Baher S. Haroun , Brian J. Lasher , Anjali Vij
IPC分类号： G01R31/3177
CPC分类号： G01R31/3177 , G01R31/31727 , G01R31/318555
摘要： IEEE 1149.1 Test Access Ports (TAPs) may be utilized at both IC and intellectual property core design levels. TAPs serve as serial communication ports for accessing a variety of embedded circuitry within ICs and cores including; IEEE 1149.1 boundary scan circuitry, built in test circuitry, internal scan circuitry, IEEE 1149.4 mixed signal test circuitry, IEEE P5001 in-circuit emulation circuitry, and IEEE P1532 in-system programming circuitry. Selectable access to TAPs within ICs is desirable since in many instances being able to access only the desired TAP(s) leads to improvements in the way testing, emulation, and programming may be performed within an IC. A TAP linking module is described that allows TAPs embedded within an IC to be selectively accessed using 1149.1 instruction scan operations.

5. 发明授权

US08516320B2 Output linking circuitry for multiple TAP domains 有权
标题翻译：用于多个TAP域的输出链接电路
公开(公告)号：US08516320B2
公开(公告)日：2013-08-20
申请号：US13670078
申请日：2012-11-06
申请人： Texas Instruments Incorporated
发明人： Lee D. Whetsel , Baher S. Haroun , Brian J. Lasher , Anjali Vij
IPC分类号： G01R31/28
CPC分类号： G01R31/3177 , G01R31/31727 , G01R31/318555
摘要： IEEE 1149.1 Test Access Ports (TAPs) may be utilized at both IC and intellectual property core design levels. TAPs serve as serial communication ports for accessing a variety of embedded circuitry within ICs and cores including; IEEE 1149.1 boundary scan circuitry, built in test circuitry, internal scan circuitry, IEEE 1149.4 mixed signal test circuitry, IEEE P5001 in-circuit emulation circuitry, and IEEE P1532 in-system programming circuitry. Selectable access to TAPs within ICs is desirable since in many instances being able to access only the desired TAP(s) leads to improvements in the way testing, emulation, and programming may be performed within an IC. A TAP linking module is described that allows TAPs embedded within an IC to be selectively accessed using 1149.1 instruction scan operations.
摘要翻译： IEEE 1149.1测试接入端口（TAP）可用于IC和知识产权核心设计级别。 TAP用作用于访问IC和核心内的各种嵌入式电路的串行通信端口，包括： IEEE 1149.1边界扫描电路，内置测试电路，内部扫描电路，IEEE 1149.4混合信号测试电路，IEEE P5001在线仿真电路和IEEE P1532系统编程电路。可选择地访问IC内的TAP是理想的，因为在许多情况下，仅能够访问期望的TAP导致在IC内可以执行测试，仿真和编程的方式的改进。描述了一种TAP链接模块，其允许使用1149.1指令扫描操作来选择性地访问嵌入在IC内的TAP。

6. 发明授权

US10712387B2 First, second test domains and test mode select control circuitry 有权
公开(公告)号：US10712387B2
公开(公告)日：2020-07-14
申请号：US16294408
申请日：2019-03-06
申请人： TEXAS INSTRUMENTS INCORPORATED
发明人： Lee D. Whetsel , Baher S. Haroun , Brian J. Lasher , Anjali Vij
IPC分类号： G01R31/3177 , G01R31/3185 , G01R31/317
摘要： IEEE 1149.1 Test Access Ports (TAPs) may be utilized at both IC and intellectual property core design levels. TAPs serve as serial communication ports for accessing a variety of embedded circuitry within ICs and cores including; IEEE 1149.1 boundary scan circuitry, built in test circuitry, internal scan circuitry, IEEE 1149.4 mixed signal test circuitry, IEEE P5001 in-circuit emulation circuitry, and IEEE P1532 in-system programming circuitry. Selectable access to TAPs within ICs is desirable since in many instances being able to access only the desired TAP(s) leads to improvements in the way testing, emulation, and programming may be performed within an IC. A TAP linking module is described that allows TAPs embedded within an IC to be selectively accessed using 1149.1 instruction scan operations.

7. 发明授权

US10267855B2 Tap linking module, first and second taps, input/output linking circuitry 有权
公开(公告)号：US10267855B2
公开(公告)日：2019-04-23
申请号：US15783365
申请日：2017-10-13
申请人： TEXAS INSTRUMENTS INCORPORATED
发明人： Lee D. Whetsel , Baher S. Haroun , Brian J. Lasher , Anjali Vij
IPC分类号： G01R31/3177 , G01R31/3185 , G01R31/317
摘要： IEEE 1149.1 Test Access Ports (TAPs) may be utilized at both IC and intellectual property core design levels. TAPs serve as serial communication ports for accessing a variety of embedded circuitry within ICs and cores including; IEEE 1149.1 boundary scan circuitry, built in test circuitry, internal scan circuitry, IEEE 1149.4 mixed signal test circuitry, IEEE P5001 in-circuit emulation circuitry, and IEEE P1532 in-system programming circuitry. Selectable access to TAPs within ICs is desirable since in many instances being able to access only the desired TAP(s) leads to improvements in the way testing, emulation, and programming may be performed within an IC. A TAP linking module is described that allows TAPs embedded within an IC to be selectively accessed using 1149.1 instruction scan operations.

8. 发明申请

US20140215282A1 1149.1 TAP LINKING MODULES 审中-公开
标题翻译： 1149.1 TAP链接模块
公开(公告)号：US20140215282A1
公开(公告)日：2014-07-31
申请号：US14230771
申请日：2014-03-31
申请人： Texas Instruments Incorporated
发明人： Lee D. Whetsel , Baher S. Haroun , Brian J. Lasher , Anjali Vij
IPC分类号： G01R31/3177
CPC分类号： G01R31/3177 , G01R31/31727 , G01R31/318555
摘要： IEEE 1149.1 Test Access Ports (TAPs) may be utilized at both IC and intellectual property core design levels. TAPs serve as serial communication ports for accessing a variety of embedded circuitry within ICs and cores including; IEEE 1149.1 boundary scan circuitry, built in test circuitry, internal scan circuitry, IEEE 1149.4 mixed signal test circuitry, IEEE P5001 in-circuit emulation circuitry, and IEEE P1532 in-system programming circuitry. Selectable access to TAPs within ICs is desirable since in many instances being able to access only the desired TAP(s) leads to improvements in the way testing, emulation, and programming may be performed within an IC. A TAP linking module is described that allows TAPs embedded within an IC to be selectively accessed using 1149.1 instruction scan operations.
摘要翻译： IEEE 1149.1测试接入端口（TAP）可用于IC和知识产权核心设计级别。 TAP用作用于访问IC和核心内的各种嵌入式电路的串行通信端口，包括： IEEE 1149.1边界扫描电路，内置测试电路，内部扫描电路，IEEE 1149.4混合信号测试电路，IEEE P5001在线仿真电路和IEEE P1532系统编程电路。可选择地访问IC内的TAP是理想的，因为在许多情况下，仅能够访问期望的TAP导致在IC内可以执行测试，仿真和编程的方式的改进。描述了一种TAP链接模块，其允许使用1149.1指令扫描操作来选择性地访问嵌入在IC内的TAP。

9. 发明申请

US20180038912A1 1149.1 TAP LINKING MODULES 审中-公开
公开(公告)号：US20180038912A1
公开(公告)日：2018-02-08
申请号：US15783365
申请日：2017-10-13
申请人： TEXAS INSTRUMENTS INCORPORATED
发明人： Lee D. Whetsel , Baher S. Haroun , Brian J. Lasher , Anjali Vig
IPC分类号： G01R31/3177 , G01R31/3185 , G01R31/317
CPC分类号： G01R31/3177 , G01R31/31727 , G01R31/318555
摘要： IEEE 1149.1 Test Access Ports (TAPs) may be utilized at both IC and intellectual property core design levels. TAPs serve as serial communication ports for accessing a variety of embedded circuitry within ICs and cores including; IEEE 1149.1 boundary scan circuitry, built in test circuitry, internal scan circuitry, IEEE 1149.4 mixed signal test circuitry, IEEE P5001 in-circuit emulation circuitry, and IEEE P1532 in-system programming circuitry. Selectable access to TAPs within ICs is desirable since in many instances being able to access only the desired TAP(s) leads to improvements in the way testing, emulation, and programming may be performed within an IC. A TAP linking module is described that allows TAPs embedded within an IC to be selectively accessed using 1149.1 instruction scan operations.

10. 发明授权

US09347992B2 IC and core taps with input and linking module circuitry 有权
标题翻译： IC和核心抽头与输入和链接模块电路
公开(公告)号：US09347992B2
公开(公告)日：2016-05-24
申请号：US14728580
申请日：2015-06-02
申请人： Texas Instruments Incorporated
发明人： Lee D. Whetsel , Baher S. Haroun , Brian J. Lasher , Anjali Vij
IPC分类号： G01R31/3177 , G01R31/3185
CPC分类号： G01R31/3177 , G01R31/31727 , G01R31/318555
摘要： IEEE 1149.1 Test Access Ports (TAPs) may be utilized at both IC and intellectual property core design levels. TAPs serve as serial communication ports for accessing a variety of embedded circuitry within ICs and cores including; IEEE 1149.1 boundary scan circuitry, built in test circuitry, internal scan circuitry, IEEE 1149.4 mixed signal test circuitry, IEEE P5001 in-circuit emulation circuitry, and IEEE P1532 in-system programming circuitry. Selectable access to TAPs within ICs is desirable since in many instances being able to access only the desired TAP(s) leads to improvements in the way testing, emulation, and programming may be performed within an IC. A TAP linking module is described that allows TAPs embedded within an IC to be selectively accessed using 1149.1 instruction scan operations.
摘要翻译： IEEE 1149.1测试接入端口（TAP）可用于IC和知识产权核心设计级别。 TAP用作用于访问IC和核心内的各种嵌入式电路的串行通信端口，包括： IEEE 1149.1边界扫描电路，内置测试电路，内部扫描电路，IEEE 1149.4混合信号测试电路，IEEE P5001在线仿真电路和IEEE P1532系统编程电路。可选择地访问IC内的TAP是理想的，因为在许多情况下，仅能够访问期望的TAP导致在IC内可以执行测试，仿真和编程的方式的改进。描述了一种TAP链接模块，其允许使用1149.1指令扫描操作来选择性地访问嵌入在IC内的TAP。

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