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1. 发明授权

US10684537B2 Camera-assisted arbitrary surface characterization and correction 有权
公开(公告)号：US10684537B2
公开(公告)日：2020-06-16
申请号：US15813146
申请日：2017-11-14
申请人： Texas Instruments Incorporated
发明人： Jaime Rene De La Cruz , Jeffrey Mathew Kempf
IPC分类号： G03B21/00 , G06T5/00 , G03B21/14
摘要： In described examples, a geometric progression of structured light elements is iteratively projected for display on a projection screen surface. The displayed progression is for determining a three-dimensional characterization of the projection screen surface. Points of the three-dimensional characterization of a projection screen surface are respaced in accordance with a spacing grid and an indication of an observer position. A compensated depth for each of the respaced points is determined in response to the three-dimensional characterization of the projection screen surface. A compensated image can be projected on the projection screen surface in response to the respaced points and respective compensated depths.

2. 发明申请

US20160173842A1 Camera-Assisted Two Dimensional Keystone Correction 有权
标题翻译：相机辅助二维梯形校正
公开(公告)号：US20160173842A1
公开(公告)日：2016-06-16
申请号：US14967035
申请日：2015-12-11
申请人： Texas Instruments Incorporated
发明人： Jaime Rene De La Cruz , Jeffrey Mathew Kempf , Ramzansaheb Nadaf
IPC分类号： H04N9/31
CPC分类号： H04N9/3185 , G03B21/147 , H04N9/3194
摘要： A system and method for facilitating keystone correction in a given model of projector having an attached camera is disclosed. System calibration determines intrinsic and extrinsic parameters of the projector and camera; then control points are identified within a three-dimensional space in front of a screen. The three-dimensional space defines a throw range and maximum pitch and yaw offsets for the projector/screen combination. At each control point, the projector projects a group of structured light elements on the screen and the camera captures an image of the projected pattern. These images are used to create three-dimensional look-up tables that identify a relationship between each image and at least one of (i) pitch and yaw offset angles for the respective control point and (ii) a focal length and a principal point for the respective control point. The given model projectors use the tables in effectuating keystone correction.
摘要翻译：公开了一种用于在具有连接的摄像机的投影仪的给定型号中促进梯形校正的系统和方法。系统校准确定投影机和摄像机的固有参数和外在参数; 则在屏幕前面的三维空间内识别控制点。三维空间定义投影机/屏幕组合的投射范围和最大俯仰角和偏航偏移。在每个控制点，投影机在屏幕上投射一组结构化的光元件，相机捕获投影图案的图像。这些图像用于创建三维查找表，其识别每个图像与相应控制点的（i）俯仰偏转角和偏航偏移角之间的关系中的至少一个，以及（ii）焦距和主点各控制点。给定的模型投影机使用表来实现梯形失真校正。

3. 发明授权

US11592732B2 Camera-assisted arbitrary surface characterization and correction 有权
公开(公告)号：US11592732B2
公开(公告)日：2023-02-28
申请号：US16867390
申请日：2020-05-05
申请人： Texas Instruments Incorporated
发明人： Jaime Rene De La Cruz , Jefferey Mathew Kempf
IPC分类号： G03B21/14 , G06T5/00
摘要： In described examples, a geometric progression of structured light elements is iteratively projected for display on a projection screen surface. The displayed progression is for determining a three-dimensional characterization of the projection screen surface. Points of the three-dimensional characterization of a projection screen surface are respaced in accordance with a spacing grid and an indication of an observer position. A compensated depth for each of the respaced points is determined in response to the three-dimensional characterization of the projection screen surface. A compensated image can be projected on the projection screen surface in response to the respaced points and respective compensated depths.

4. 发明授权

US10681318B2 Camera-assisted arbitrary surface characterization and slope-based correction 有权
公开(公告)号：US10681318B2
公开(公告)日：2020-06-09
申请号：US16200614
申请日：2018-11-26
申请人： Texas Instruments Incorporated
发明人： Jaime Rene De La Cruz , Jeffrey Mathew Kempf
IPC分类号： H04N9/00 , G06T7/70 , G06T7/521 , H04N9/31 , G06T5/00
摘要： In described examples, structured light elements are projected for display on a projection screen surface. The projected light elements are captured for determining a three-dimensional characterization of the projection screen surface. A three-dimensional characterization of the projection screen surface is generated in response to the displayed structured light elements. An observer perspective characterization of the projection screen surface is generated in response to an observer position and the three-dimensional characterization. A depth for at least one point of the observer perspective characterization is determined in response to depth information of respective neighboring points of the at least one point of the observer perspective characterization. A compensated image can be projected on the projection screen surface in response to the observer perspective characterization and depth information of respective neighboring points of the at least one point of the observer perspective characterization.

5. 发明申请

US20200260060A1 CAMERA-ASSISTED ARBITRARY SURFACE CHARACTERIZATION AND SLOPE-BASED CORRECTION 审中-公开
公开(公告)号：US20200260060A1
公开(公告)日：2020-08-13
申请号：US16864831
申请日：2020-05-01
申请人： Texas Instruments Incorporated
发明人： Jaime Rene De La Cruz , Jeffrey Mathew Kempf
IPC分类号： H04N9/31 , G06T5/00 , G06T7/521 , G06T7/70
摘要： In described examples, structured light elements are projected for display on a projection screen surface. The projected light elements are captured for determining a three-dimensional characterization of the projection screen surface. A three-dimensional characterization of the projection screen surface is generated in response to the displayed structured light elements. An observer perspective characterization of the projection screen surface is generated in response to an observer position and the three-dimensional characterization. A depth for at least one point of the observer perspective characterization is determined in response to depth information of respective neighboring points of the at least one point of the observer perspective characterization. A compensated image can be projected on the projection screen surface in response to the observer perspective characterization and depth information of respective neighboring points of the at least one point of the observer perspective characterization.

6. 发明申请

US20190166339A1 CAMERA-ASSISTED ARBITRARY SURFACE CHARACTERIZATION AND SLOPE-BASED CORRECTION 审中-公开
公开(公告)号：US20190166339A1
公开(公告)日：2019-05-30
申请号：US16200614
申请日：2018-11-26
申请人： Texas Instruments Incorporated
发明人： Jaime Rene De La Cruz , Jeffrey Mathew Kempf
IPC分类号： H04N9/31 , G06T7/521 , G06T7/70
摘要： In described examples, structured light elements are projected for display on a projection screen surface. The projected light elements are captured for determining a three-dimensional characterization of the projection screen surface. A three-dimensional characterization of the projection screen surface is generated in response to the displayed structured light elements. An observer perspective characterization of the projection screen surface is generated in response to an observer position and the three-dimensional characterization. A depth for at least one point of the observer perspective characterization is determined in response to depth information of respective neighboring points of the at least one point of the observer perspective characterization. A compensated image can be projected on the projection screen surface in response to the observer perspective characterization and depth information of respective neighboring points of the at least one point of the observer perspective characterization.

7. 发明申请

US20190146313A1 CAMERA-ASSISTED ARBITRARY SURFACE CHARACTERIZATION AND CORRECTION 审中-公开
公开(公告)号：US20190146313A1
公开(公告)日：2019-05-16
申请号：US15813146
申请日：2017-11-14
申请人： Texas Instruments Incorporated
发明人： Jaime Rene De La Cruz , Jeffrey Mathew Kempf
IPC分类号： G03B21/14 , G06T5/00
摘要： In described examples, a geometric progression of structured light elements is iteratively projected for display on a projection screen surface. The displayed progression is for determining a three-dimensional characterization of the projection screen surface. Points of the three-dimensional characterization of a projection screen surface are respaced in accordance with a spacing grid and an indication of an observer position. A compensated depth for each of the respaced points is determined in response to the three-dimensional characterization of the projection screen surface. A compensated image can be projected on the projection screen surface in response to the respaced points and respective compensated depths.

8. 发明授权

US09769443B2 Camera-assisted two dimensional keystone correction 有权
公开(公告)号：US09769443B2
公开(公告)日：2017-09-19
申请号：US14967035
申请日：2015-12-11
申请人： Texas Instruments Incorporated
发明人： Jaime Rene De La Cruz , Jeffrey Mathew Kempf , Ramzansaheb Nadaf
IPC分类号： H04N9/31 , G03B21/14
CPC分类号： H04N9/3185 , G03B21/147 , H04N9/3194
摘要： A system and method for facilitating keystone correction in a given model of projector having an attached camera is disclosed. System calibration determines intrinsic and extrinsic parameters of the projector and camera; then control points are identified within a three-dimensional space in front of a screen. The three-dimensional space defines a throw range and maximum pitch and yaw offsets for the projector/screen combination. At each control point, the projector projects a group of structured light elements on the screen and the camera captures an image of the projected pattern. These images are used to create three-dimensional look-up tables that identify a relationship between each image and at least one of (i) pitch and yaw offset angles for the respective control point and (ii) a focal length and a principal point for the respective control point. The given model projectors use the tables in effectuating keystone correction.

9. 发明授权

US11258997B2 Camera-assisted arbitrary surface characterization and slope-based correction 有权
公开(公告)号：US11258997B2
公开(公告)日：2022-02-22
申请号：US16864831
申请日：2020-05-01
申请人： Texas Instruments Incorporated
发明人： Jaime Rene De La Cruz , Jeffrey Mathew Kempf
IPC分类号： H04N9/31 , G06T7/70 , G06T7/521 , G06T5/00
摘要： In described examples, structured light elements are projected for display on a projection screen surface. The projected light elements are captured for determining a three-dimensional characterization of the projection screen surface. A three-dimensional characterization of the projection screen surface is generated in response to the displayed structured light elements. An observer perspective characterization of the projection screen surface is generated in response to an observer position and the three-dimensional characterization. A depth for at least one point of the observer perspective characterization is determined in response to depth information of respective neighboring points of the at least one point of the observer perspective characterization. A compensated image can be projected on the projection screen surface in response to the observer perspective characterization and depth information of respective neighboring points of the at least one point of the observer perspective characterization.

10. 发明申请

US20200264498A1 CAMERA-ASSISTED ARBITRARY SURFACE CHARACTERIZATION AND CORRECTION 审中-公开
公开(公告)号：US20200264498A1
公开(公告)日：2020-08-20
申请号：US16867390
申请日：2020-05-05
申请人： Texas Instruments Incorporated
发明人： Jaime Rene De La Cruz , Jefferey Mathew Kempf
IPC分类号： G03B21/14 , G06T5/00
摘要： In described examples, a geometric progression of structured light elements is iteratively projected for display on a projection screen surface. The displayed progression is for determining a three-dimensional characterization of the projection screen surface. Points of the three-dimensional characterization of a projection screen surface are respaced in accordance with a spacing grid and an indication of an observer position. A compensated depth for each of the respaced points is determined in response to the three-dimensional characterization of the projection screen surface. A compensated image can be projected on the projection screen surface in response to the respaced points and respective compensated depths.

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