专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明授权

US09411700B2 Storage tester capable of individual control for a plurality of storage 有权
标题翻译：能够对多个存储单独进行控制的存储测试器
公开(公告)号：US09411700B2
公开(公告)日：2016-08-09
申请号：US14453654
申请日：2014-08-07
申请人： UNITEST INC.
发明人： Eui Won Lee
IPC分类号： G11C29/00 , G06F11/263
CPC分类号： G06F11/263
摘要： Disclosed is a storage tester capable of individual control for a plurality of storages, which comprises a host terminal for receiving user's control signal for storage test; a communication interface unit transmitting data among the host terminal, an embedded processor and a data engine unit; a data engine unit for generating pattern data and command data and reading the data from the storage; a sequence control module for controlling respectively a plurality of SATA/SAS/PCIe interface units; and SATA/SAS/PCIe interface unit for connecting to the storage through one among SATA, SAS, PCIe interface according to the signal for interface selection generated from the embedded processor and controlling a plurality of storages according to control of the sequence control module by the embedded processor in order to test respectively connected storage.
摘要翻译：公开了能够对多个存储器进行单独控制的存储测试器，其包括用于接收用户的用于存储测试的控制信号的主机终端; 通信接口单元，在主机终端，嵌入式处理器和数据引擎单元之间传送数据; 用于产生模式数据和命令数据并从存储器读取数据的数据引擎单元; 用于分别控制多个SATA / SAS / PCIe接口单元的顺序控制模块; 和SATA / SAS / PCIe接口单元，用于根据嵌入式处理器生成的用于接口选择的信号，通过SATA，SAS，PCIe接口之一连接到存储器，并根据序列控制模块的控制来控制多个存储器嵌入式处理器为了分别测试连接存储。

2. 发明授权

US09245613B2 Storage interface apparatus for solid state drive tester 有权
标题翻译：固态硬盘测试仪存储接口设备
公开(公告)号：US09245613B2
公开(公告)日：2016-01-26
申请号：US13921829
申请日：2013-06-19
申请人： UNITEST INC
发明人： Eui Won Lee , Hyo Jin Oh
IPC分类号： G11C11/4093 , G11C29/10 , G06F11/22
CPC分类号： G11C11/4093 , G06F11/2221 , G11C29/10 , G11C29/56 , G11C29/56016
摘要： Disclosed is a storage interface apparatus for a solid state drive (SSD) tester which allows a plurality of interfaces to share a single protocol in parts where the protocol is commonly used in a multiple interface for interfacing a storage. The storage interface apparatus for the solid state driver tester includes: a host terminal for receiving a test condition for testing a storage from a user; and a test control unit for generating a test pattern corresponding to the test condition to test the storage. The test control unit includes a storage interface unit for interfacing the storage, and the storage interface unit includes a plurality of interfaces that share a protocol in parts where the protocol is commonly used.
摘要翻译：公开了一种用于固态驱动（SSD）测试器的存储接口设备，其允许多个接口在多个接口中通常使用该协议的部分中共享单个协议，用于接口存储。用于固态驱动器测试器的存储接口装置包括：主机终端，用于接收用户测试存储器的测试条件; 以及测试控制单元，用于产生与测试条件相对应的测试模式以测试存储。测试控制单元包括用于与存储器进行接口的存储接口单元，并且存储接口单元包括多个接口，其在通常使用协议的部分共享协议。

3. 发明授权

US09015545B2 Solid state drive tester 有权
标题翻译：固态硬盘测试仪
公开(公告)号：US09015545B2
公开(公告)日：2015-04-21
申请号：US13921753
申请日：2013-06-19
申请人： Unitest Inc
发明人： Eui Won Lee , Hyo Jin Oh
IPC分类号： G01R31/28 , G11C29/10 , G06F11/22 , G06F13/38 , G06F13/40 , G11C29/56 , G11C29/04
CPC分类号： G11C29/10 , G06F11/2221 , G06F13/385 , G06F13/4022 , G06F2213/0026 , G06F2213/0028 , G06F2213/0032 , G11C29/56008 , G11C2029/0401
摘要： Disclosed is a solid state drive tester which divides the functions of generating and comparing test pattern data and Frame Information Structure (FIS) data with each other into each other to implement the functions as separate logics, so that entire test time is decreased by reducing load of a processor. The solid state drive tester includes a host terminal for receiving a test condition for testing a storage from a user, and a test control unit creating a test pattern corresponding to the test condition, and adaptively selecting an interface according to an interface type of the storage to be tested to test the storage using the test pattern, wherein the test control unit is divided into a control module for controlling the test of the storage and a test execution module for practically executing the test in hardware to test a plurality of storages in real time.
摘要翻译：公开了一种固态驱动测试仪，其将生成和比较测试图形数据和帧信息结构（FIS）数据的功能彼此分开，以将功能实现为单独的逻辑，从而通过减少负载来降低整个测试时间的处理器。固态驱动测试器包括用于接收用户测试存储器的测试条件的主机终端和产生与测试条件对应的测试模式的测试控制单元，以及根据存储器的接口类型自适应地选择接口被测试以使用测试模式测试存储器，其中测试控制单元被分成用于控制存储器测试的控制模块和用于在硬件中实际执行测试的测试执行模块以实际测试多个存储器时间。

4. 发明授权

US09171643B2 Solid state drive tester 有权
标题翻译：固态硬盘测试仪
公开(公告)号：US09171643B2
公开(公告)日：2015-10-27
申请号：US13921701
申请日：2013-06-19
申请人： UNITEST INC
发明人： Eui Won Lee , Hyo Jin Oh
IPC分类号： G11C29/00 , G11C29/10 , G06F11/22 , G11C29/56 , G11C29/04
CPC分类号： G11C29/10 , G06F11/2221 , G11C29/56008 , G11C2029/0401 , G11C2029/5602 , G11C2029/5606
摘要： Disclosed is a solid state drive tester which reduces the size of the tester and easily changes a function without changing hardware (H/W) by implementing a plurality of devices for testing an SSD as one chip using a Field Programmable Gate Array (FPGA). The solid state drive tester includes: a host terminal receiving a test condition for testing a storage from a user; and a test control unit generating a test pattern corresponding to the test condition, adaptively selecting an interface according to an interface type of the storage to be tested to test the storage using the test pattern, and storing fail data generated during the test in an internal memory. The test control unit is implemented by an FPGA to reduce the size of the tester and easily change a function without hardware.
摘要翻译：公开了一种固态驱动测试仪，其通过使用现场可编程门阵列（FPGA）通过实施用于测试SSD作为一个芯片的多个设备来减小测试器的尺寸并且容易地改变功能而不改变硬件（H / W）。固态驱动测试器包括：主机终端，接收用户测试存储的测试条件; 以及测试控制单元，生成与测试条件相对应的测试模式，根据要测试的存储器的接口类型自适应地选择接口以使用测试模式测试存储器，以及将在测试期间生成的故障数据存储在内部记忆。测试控制单元由FPGA实现，以减小测试仪的尺寸，轻松改变没有硬件的功能。

5. 发明授权

US09159454B2 Failure detection apparatus for solid state drive tester 有权
标题翻译：固态驱动测试仪故障检测装置
公开(公告)号：US09159454B2
公开(公告)日：2015-10-13
申请号：US13921918
申请日：2013-06-19
申请人： UNITEST INC
发明人： Eui Won Lee
IPC分类号： G11C29/00 , G11C29/10 , G06F11/22
CPC分类号： G11C29/10 , G06F11/2221
摘要： A failure detection apparatus for a solid state driver tester is provided. The failure detection apparatus includes a host terminal for receiving a test condition for testing a storage from a user and a test control unit for creating a test pattern according to the test condition or creating a test pattern at random, and adaptively selects an interface according to a type of the storage to be tested to test the storage with the test pattern. The test control unit includes a plurality of buffer memories for storing readout data of the storage, stores the readout data in the buffer memories in an interleaving manner, and endows comparison of the created test pattern and the readout data stored in the buffer memories with continuity to test the storage in real time.
摘要翻译：提供了一种用于固态驱动器测试器的故障检测装置。故障检测装置包括用于接收用户测试存储的测试条件的主机终端和用于根据测试条件创建测试模式或随机创建测试模式的测试控制单元，并且根据一种待测试的存储类型，以便使用测试模式测试存储。测试控制单元包括用于存储存储器的读出数据的多个缓冲存储器，以读出的方式将读出的数据存储在缓冲存储器中，并且使存储在缓冲存储器中的所生成的测试图案与读出数据的比较具有连续性实时测试存储。

6. 发明授权

US09153345B2 Error generating apparatus for solid state drive tester 有权
标题翻译：固态硬盘测试仪错误发生装置
公开(公告)号：US09153345B2
公开(公告)日：2015-10-06
申请号：US13921949
申请日：2013-06-19
申请人： UNITEST INC
发明人： Eui Won Lee , Hyo Jin Oh
IPC分类号： G11C29/10 , G06F11/22 , G11C29/54 , G11C29/56 , G11C29/04
CPC分类号： G11C29/10 , G06F11/2221 , G11C29/54 , G11C29/56008 , G11C2029/0401 , G11C2029/5602 , G11C2029/5606
摘要： Disclosed is an error generating apparatus of a solid state drive tester. The error processing operation of the storage is tested by inserting errors into a specific instruction to be transmitted to the storage, and detecting the results of the error processing operation of the storage when testing the storage. The error generating apparatus includes a host terminal for receiving a test condition for a test of a storage from a user, and a test control unit for generating a test pattern according to the test condition or generating a test pattern randomly, generating error data used to test an error characteristic of the storage, and testing the storage based on the test pattern and a normal instruction or an error instruction which is formed by inserting the error data into the normal instruction.
摘要翻译：公开了一种固态驱动测试仪的误差产生装置。通过将错误插入要发送到存储器的特定指令来测试存储器的错误处理操作，并且在测试存储时检测存储器的错误处理操作的结果。误差发生装置包括：主机终端，用于接收来自用户的存储测试的测试条件;以及测试控制单元，用于根据测试条件产生测试模式或随机生成测试模式，生成用于测试存储器的错误特性，并根据测试模式和通过将错误数据插入正常指令形成的正常指令或错误指令来测试存储器。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式