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1. 发明申请

US20170099055A1 MICROWAVE AC CONDUCTIVITY OF DOMAIN WALLS 审中-公开
公开(公告)号：US20170099055A1
公开(公告)日：2017-04-06
申请号：US15285332
申请日：2016-10-04
申请人： UT-Battelle, LLC
发明人： Petro Maksymovych , Alexander Tselev , Sergei V. Kalinin
IPC分类号： H03L5/00 , H03H7/38 , H01P3/16
CPC分类号： H03L5/00 , B82Y25/00 , G11B9/02 , G11C11/2275
摘要： Microwave AC conductivity may be improved or tuned in a material, for example, a dielectric or semiconductor material, by manipulating domain wall morphology in the material. Domain walls may be created, erased or reconfigured to control the AC conductivity, for example, for crafting circuit elements. The density and placement of domain walls may increase or decrease the AC conductivity and may control AC conduction pathways through the material. An electric potential applied to the material's surface may create a desired pattern of domain walls to meet desired AC conductivity criteria. Incline angle of the domain walls may be modified relative to a crystallographic axis of the material to temporarily or permanently modify or gate AC conductivity of the material. For example, the AC conductivity of the material may be gated by domain wall incline angle to increase, decrease or throttle current flowing through the material for an electronic circuit element.

2. 发明申请

US20140003466A1 SINGLE-CONTACT TUNNELING THERMOMETRY 有权
标题翻译：单接触式隧道式热电偶
公开(公告)号：US20140003466A1
公开(公告)日：2014-01-02
申请号：US13898659
申请日：2013-05-21
申请人： UT-Battelle, LLC
发明人： Petro Maksymovych
IPC分类号： G01K7/02
CPC分类号： G01K7/021 , G01K7/028 , G01Q60/12 , G01Q60/58
摘要： A single-contact tunneling thermometry circuit includes a tunnel junction formed between two objects. Junction temperature gradient information is determined based on a mathematical relationship between a target alternating voltage applied across the junction and the junction temperature gradient. Total voltage measured across the junction indicates the magnitude of the target alternating voltage. A thermal gradient is induced across the junction. A reference thermovoltage is measured when zero alternating voltage is applied across the junction. An increasing alternating voltage is applied while measuring a thermovoltage component and a DC rectification voltage component created by the applied alternating voltage. The target alternating voltage is reached when the thermovoltage is nullified or doubled by the DC rectification voltage depending on the sign of the reference thermovoltage. Thermoelectric current and current measurements may be utilized in place of the thermovoltage and voltage measurements. The system may be automated with a feedback loop.
摘要翻译：单接触隧道温度测量电路包括在两个物体之间形成的隧道结。结温度梯度信息是基于施加在结点上的目标交变电压与结温度梯度之间的数学关系来确定的。整个结点测量的总电压表示目标交流电压的大小。在结点处引起热梯度。当在交叉点上施加零交流电压时，测量参考热电偶。在测量由施加的交流电压产生的热电压分量和直流整流电压分量的同时施加增加的交流电压。当电压根据参考热电偶的符号，直流整流电压无效或加倍时，达到目标交流电压。可以使用热电流和电流测量来代替热电压和电压测量。系统可以通过反馈回路自动化。

3. 发明授权

US11561453B2 Truncated non-linear interferometer-based sensor system 有权
公开(公告)号：US11561453B2
公开(公告)日：2023-01-24
申请号：US17472269
申请日：2021-09-10
申请人： UT-Battelle, LLC
发明人： Raphael C. Pooser , Benjamin J. Lawrie , Petro Maksymovych
IPC分类号： G01B9/02 , G02F1/35 , G01Q60/38 , B82Y35/00 , G01N21/45 , G01Q60/24 , G01Q20/02 , G02F1/29 , G01B9/02055 , H01S3/10 , G01B9/02003
摘要： A truncated non-linear interferometer-based sensor system includes an input that receives an optical beam and a non-linear amplifier that generates a probe beam and a conjugate beam from the optical beam. The system's local oscillators are related to the probe beam and the conjugate beam. The system includes a sensor that transduces an input with the probe beam and the conjugate beam. The transduction detects changes in the phase of each of the probe beam and the conjugate beam. The system's phase sensitive detectors detect phase modulations between the respective local oscillators, the probe beam, and the conjugate beam and outputs phase signals based on detected phase modulations. The system measures phase signals indicative of the sensor's input resulting from a sum or difference of the phase signals. The measurement exhibits a quantum noise reduction in an intensity difference, a phase sum, or an amplitude difference quadrature.

4. 发明申请

US20210405503A1 TRUNCATED NON-LINEAR INTERFEROMETER-BASED SENSOR SYSTEM 有权
公开(公告)号：US20210405503A1
公开(公告)日：2021-12-30
申请号：US17472269
申请日：2021-09-10
申请人： UT-Battelle, LLC
发明人： Raphael C. Pooser , Benjamin J. Lawrie , Petro Maksymovych
IPC分类号： G02F1/35 , G01Q60/38 , B82Y35/00 , G01N21/45 , G01Q60/24 , G01Q20/02 , G01B9/02 , G02F1/29 , H01S3/10
摘要： A truncated non-linear interferometer-based sensor system includes an input that receives an optical beam and a non-linear amplifier that generates a probe beam and a conjugate beam from the optical beam. The system's local oscillators are related to the probe beam and the conjugate beam. The system includes a sensor that transduces an input with the probe beam and the conjugate beam. The transduction detects changes in the phase of each of the probe beam and the conjugate beam. The system's phase sensitive detectors detect phase modulations between the respective local oscillators, the probe beam, and the conjugate beam and outputs phase signals based on detected phase modulations. The system measures phase signals indicative of the sensor's input resulting from a sum or difference of the phase signals. The measurement exhibits a quantum noise reduction in an intensity difference, a phase sum, or an amplitude difference quadrature.

5. 发明授权

US11119386B2 Truncated nonlinear interferometer-based atomic force microscopes 有权
公开(公告)号：US11119386B2
公开(公告)日：2021-09-14
申请号：US16719437
申请日：2019-12-18
申请人： UT-Battelle, LLC
发明人： Raphael C. Pooser , Benjamin J. Lawrie , Petro Maksymovych
IPC分类号： G01Q60/24 , G01B9/02 , G02F1/35 , G01Q60/38 , B82Y35/00 , G01N21/45 , G01Q20/02 , G02F1/29 , H01S3/10
摘要： A truncated non-linear interferometer-based atomic force microscope (AFM) includes an input port and a non-linear amplifier that renders a probe beam and a conjugate beam. The AFM includes local oscillators having a relationship with the probe beam and the conjugate beam. The displacement of the AFM's cantilever is transduced by the probe beam, and/or the conjugate beam or their respective local oscillators. The AFM's phase-sensitive detectors detect a phase modulation between the respective local oscillators and the probe beam and the conjugate beam. The detected phase modulation corresponds to the change in phase. The AFM's circuitry measures phase signals that are indicative of the cantilever displacement. The resulting measurement signals exhibit a quantum noise reduction in either the intensity difference or phase sum quadrature.

6. 发明申请

US20210190819A1 TRUNCATED NONLINEAR INTERFEROMETER-BASED ATOMIC FORCE MICROSCOPES 有权
公开(公告)号：US20210190819A1
公开(公告)日：2021-06-24
申请号：US16719437
申请日：2019-12-18
申请人： UT-Battelle, LLC
发明人： Raphael C. Pooser , Benjamin J. Lawrie , Petro Maksymovych
IPC分类号： G01Q60/38 , B82Y35/00 , G01Q60/36
摘要： A truncated non-linear interferometer-based atomic force microscope (AFM) includes an input port and a non-linear amplifier that renders a probe beam and a conjugate beam. The AFM includes local oscillators having a relationship with the probe beam and the conjugate beam. The displacement of the AFM's cantilever is transduced by the probe beam, and/or the conjugate beam or their respective local oscillators. The AFM's phase-sensitive detectors detect a phase modulation between the respective local oscillators and the probe beam and the conjugate beam. The detected phase modulation corresponds to the change in phase. The AFM's circuitry measures phase signals that are indicative of the cantilever displacement. The resulting measurement signals exhibit a quantum noise reduction in either the intensity difference or phase sum quadrature.

7. 发明授权

US10160645B2 Microwave AC conductivity of domain walls 有权
公开(公告)号：US10160645B2
公开(公告)日：2018-12-25
申请号：US15285332
申请日：2016-10-04
申请人： UT-Battelle, LLC
发明人： Petro Maksymovych , Alexander Tselev , Sergei V. Kalinin
IPC分类号： B82Y25/00 , H03L5/00 , G11B9/02 , G11C11/22
摘要： Microwave AC conductivity may be improved or tuned in a material, for example, a dielectric or semiconductor material, by manipulating domain wall morphology in the material. Domain walls may be created, erased or reconfigured to control the AC conductivity, for example, for crafting circuit elements. The density and placement of domain walls may increase or decrease the AC conductivity and may control AC conduction pathways through the material. An electric potential applied to the material's surface may create a desired pattern of domain walls to meet desired AC conductivity criteria. Incline angle of the domain walls may be modified relative to a crystallographic axis of the material to temporarily or permanently modify or gate AC conductivity of the material. For example, the AC conductivity of the material may be gated by domain wall incline angle to increase, decrease or throttle current flowing through the material for an electronic circuit element.

8. 发明授权

US09610608B2 Self-assembly patterning of organic molecules on a surface 有权
公开(公告)号：US09610608B2
公开(公告)日：2017-04-04
申请号：US13860291
申请日：2013-04-10
申请人： UT Battelle, LLC
发明人： Minghu Pan , Miguel Fuentes-Cabrera , Petro Maksymovych , Bobby G. Sumpter , Qing Li
IPC分类号： B05D3/06 , B05D1/18 , B82Y30/00 , B82Y40/00 , B05D3/14
CPC分类号： B05D3/06 , B05D1/185 , B05D3/14 , B82Y30/00 , B82Y40/00
摘要： The embodiments disclosed herein include all-electron control over a chemical attachment and the subsequent self-assembly of an organic molecule into a well-ordered three-dimensional monolayer on a metal surface. The ordering or assembly of the organic molecule may be through electron excitation. Hot-electron and hot-hole excitation enables tethering of the organic molecule to a metal substrate, such as an alkyne group to a gold surface. All-electron reactions may allow a direct control over the size and shape of the self-assembly, defect structures and the reverse process of molecular disassembly from single molecular level to mesoscopic scale.

9. 发明授权

US09267851B2 Single-contact tunneling thermometry 有权
标题翻译：单接触隧道温度测量
公开(公告)号：US09267851B2
公开(公告)日：2016-02-23
申请号：US13898659
申请日：2013-05-21
申请人： UT-Battelle, LLC
发明人： Petro Maksymovych
IPC分类号： G01K7/00 , G01K7/02 , G01Q60/12
CPC分类号： G01K7/021 , G01K7/028 , G01Q60/12 , G01Q60/58
摘要： A single-contact tunneling thermometry circuit includes a tunnel junction formed between two objects. Junction temperature gradient information is determined based on a mathematical relationship between a target alternating voltage applied across the junction and the junction temperature gradient. Total voltage measured across the junction indicates the magnitude of the target alternating voltage. A thermal gradient is induced across the junction. A reference thermovoltage is measured when zero alternating voltage is applied across the junction. An increasing alternating voltage is applied while measuring a thermovoltage component and a DC rectification voltage component created by the applied alternating voltage. The target alternating voltage is reached when the thermovoltage is nullified or doubled by the DC rectification voltage depending on the sign of the reference thermovoltage. Thermoelectric current and current measurements may be utilized in place of the thermovoltage and voltage measurements. The system may be automated with a feedback loop.
摘要翻译：单接触隧道温度测量电路包括在两个物体之间形成的隧道结。结温度梯度信息是基于施加在结点上的目标交变电压与结温度梯度之间的数学关系来确定的。结点上测得的总电压表示目标交流电压的大小。在结点处引起热梯度。当在交叉点上施加零交流电压时，测量参考热电偶。在测量由施加的交流电压产生的热电压分量和直流整流电压分量的同时施加增加的交流电压。当电压根据参考热电偶的符号，直流整流电压无效或加倍时，达到目标交流电压。可以使用热电流和电流测量来代替热电压和电压测量。系统可以通过反馈回路自动化。

10. 发明授权

US09285279B2 Electronic thermometry in tunable tunnel junction 有权
标题翻译：可调谐隧道结中的电子测温
公开(公告)号：US09285279B2
公开(公告)日：2016-03-15
申请号：US13911914
申请日：2013-06-06
申请人： UT-Battelle, LLC
发明人： Petro Maksymovych
IPC分类号： G01K7/00 , G01K7/01 , G01K11/00
CPC分类号： G01K7/01 , G01K11/00
摘要： A tunable tunnel junction thermometry circuit includes a variable width tunnel junction between a test object and a probe. The junction width is varied and a change in thermovoltage across the junction with respect to the change in distance across the junction is determined. Also, a change in biased current with respect to a change in distance across the junction is determined. A temperature gradient across the junction is determined based on a mathematical relationship between the temperature gradient, the change in thermovoltage with respect to distance and the change in biased current with respect to distance. Thermovoltage may be measured by nullifying a thermoelectric tunneling current with an applied voltage supply level. A piezoelectric actuator may modulate the probe, and thus the junction width, to vary thermovoltage and biased current across the junction. Lock-in amplifiers measure the derivatives of the thermovoltage and biased current modulated by varying junction width.
摘要翻译：可调谐隧道结温度测量电路包括测试对象和探头之间的可变宽度的隧道结。结合宽度是变化的，并且确定了跨越结的跨越结点处的距离变化的热电压的变化。此外，确定相对于跨越结点的距离变化的偏置电流的变化。基于温度梯度，相对于距离的热电压变化和偏置电流相对于距离的变化的数学关系来确定结点处的温度梯度。可以通过以施加的电压供应水平使热电隧穿电流无效来测量热电偶。压电致动器可以调制探针，从而调制结宽度，以改变跨越结的热电压和偏置电流。锁定放大器测量热电压的导数和通过变化的结宽调制的偏置电流。

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