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1. 发明授权

US08625880B2 Method and apparatus for human interface to a machine vision system 有权
标题翻译：用于人机接口的机器视觉系统的方法和装置
公开(公告)号：US08625880B2
公开(公告)日：2014-01-07
申请号：US13109105
申请日：2011-05-17
申请人： William Silver , Robert Shillman , Aaron Wallack
发明人： William Silver , Robert Shillman , Aaron Wallack
IPC分类号： G06K9/00
CPC分类号： G06F3/017
摘要： An apparatus and method are disclosed for setting up a vision system having a camera and a vision processor cooperative with the camera. The apparatus includes a gesture recognizer, a key recognizer, a breakout box having at least two signaling elements, and a setup control unit that is cooperative with the gesture recognizer, the key recognizer, and the breakout box. The combination of using a key and a gesture set as herein described is substantially superior, as compared with known user interfaces for setting up a vision system that has been previously been engineered, in terms of low-cost, convenience, ease-of-use, simplicity, and speed.
摘要翻译：公开了一种用于设置具有与照相机协作的照相机和视觉处理器的视觉系统的装置和方法。该装置包括手势识别器，钥匙识别器，具有至少两个信号元件的接线盒，以及与手势识别器，钥匙识别器和接线盒协作的设置控制单元。与用于建立先前已经被设计的视觉系统的已知用户界面相比，使用如本文所描述的按键和姿势组合的组合在低成本，便利性，易于使用方面相比是显着优越的，简单性和速度。

2. 发明申请

US20110298934A1 Method and Apparatus for Human Interface to a Machine Vision System 有权
标题翻译：用于人机接口的机器视觉系统的方法和装置
公开(公告)号：US20110298934A1
公开(公告)日：2011-12-08
申请号：US13109105
申请日：2011-05-17
申请人： William Silver , Robert Shillman , Aaron Wallack
发明人： William Silver , Robert Shillman , Aaron Wallack
IPC分类号： H04N17/06
CPC分类号： G06F3/017
摘要： An apparatus and method are disclosed for setting up a vision system having a camera and a vision processor cooperative with the camera. The apparatus includes a gesture recognizer, a key recognizer, a breakout box having at least two signaling elements, and a setup control unit that is cooperative with the gesture recognizer, the key recognizer, and the breakout box. The combination of using a key and a gesture set as herein described is substantially superior, as compared with known user interfaces for setting up a vision system that has been previously been engineered, in terms of low-cost, convenience, ease-of-use, simplicity, and speed.
摘要翻译：公开了一种用于设置具有与照相机协作的照相机和视觉处理器的视觉系统的装置和方法。该装置包括手势识别器，钥匙识别器，具有至少两个信号元件的接线盒，以及与手势识别器，钥匙识别器和接线盒协作的设置控制单元。与用于建立先前已经被设计的视觉系统的已知用户界面相比，使用如本文所描述的按键和姿势组合的组合在低成本，便利性，易于使用方面相比是显着优越的，简单性和速度。

3. 发明授权

US07957554B1 Method and apparatus for human interface to a machine vision system 有权
标题翻译：用于人机接口的机器视觉系统的方法和装置
公开(公告)号：US07957554B1
公开(公告)日：2011-06-07
申请号：US10335829
申请日：2002-12-31
申请人： William Silver , Robert Shillman , Aaron Wallack
发明人： William Silver , Robert Shillman , Aaron Wallack
IPC分类号： G06K9/00
CPC分类号： G06F3/017
摘要： An apparatus and method are disclosed for setting up a vision system having a camera and a vision processor cooperative with the camera. The apparatus includes a gesture recognizer, a key recognizer, a breakout box having at least two signaling elements, and a setup control unit that is cooperative with the gesture recognizer, the key recognizer, and the breakout box. The combination of using a key and a gesture set as herein described is substantially superior, as compared with known user interfaces for setting up a vision system that has been previously been engineered, in terms of low-cost, convenience, ease-of-use, simplicity, and speed.
摘要翻译：公开了一种用于设置具有与照相机协作的照相机和视觉处理器的视觉系统的装置和方法。该装置包括手势识别器，钥匙识别器，具有至少两个信号元件的接线盒，以及与手势识别器，钥匙识别器和接线盒协作的设置控制单元。与用于建立先前已经被设计的视觉系统的已知用户界面相比，使用如本文所描述的按键和姿势组合的组合在低成本，便利性，易于使用方面相比是显着优越的，简单性和速度。

4. 发明授权

US06993192B1 Fast high-accuracy multi-dimensional pattern inspection 有权
公开(公告)号：US06993192B1
公开(公告)日：2006-01-31
申请号：US10705288
申请日：2003-11-10
申请人： William Silver , Aaron Wallack , Adam Wagman
发明人： William Silver , Aaron Wallack , Adam Wagman
IPC分类号： G06K9/62
CPC分类号： G06K9/32 , G06K9/6203 , G06T7/75
摘要： A method and apparatus are provided for identifying differences between a stored pattern and a matching image subset, where variations in pattern position, orientation, and size do not give rise to false differences. The invention is also a system for analyzing an object image with respect to a model pattern so as to detect flaws in the object image. The system includes extracting pattern features from the model pattern; generating a vector-valued function using the pattern features to provide a pattern field; extracting image features from the object image; evaluating each image feature, using the pattern field and an n-dimensional transformation that associates image features with pattern features, so as to determine at least one associated feature characteristic; and using at least one feature characteristic to identify at least one flaw in the object image. The invention can find at least two distinct kinds of flaws: missing features, and extra features. The invention provides pattern inspection that is faster and more accurate than any known prior art method by using a stored pattern that represents an ideal example of the object to be found and inspected, and that can be translated, rotated, and scaled to arbitrary precision much faster than digital image re-sampling, and without pixel grid quantization errors. Furthermore, since the invention does not use digital image re-sampling, there are no pixel quantization errors to cause false differences between the pattern and image that can limit inspection performance.

5. 发明授权

US06856698B1 Fast high-accuracy multi-dimensional pattern localization 有权
标题翻译：快速高精度多维图案定位
公开(公告)号：US06856698B1
公开(公告)日：2005-02-15
申请号：US10273855
申请日：2002-10-18
申请人： William Silver , Aaron Wallack , Adam Wagman
发明人： William Silver , Aaron Wallack , Adam Wagman
IPC分类号： G06K9/48 , G06K9/62 , G06K9/64
CPC分类号： G06K9/6204
摘要： A method and apparatus are provided for rapidly refining a given approximate location of a pattern to produce a more accurate location. The invention employs a multi-dimensional space that includes translation, orientation, and scale. The invention can serve as a replacement for the fine resolution phase of any coarse-fine system for pattern location. Patterns and images are represented by a feature-based description that can be translated, rotated, and scaled to arbitrary precision much faster than digital image re-sampling, and without pixel grid quantization errors. Thus, accuracy is not limited by the ability of a grid to represent small changes in position, orientation, or size (or other degrees of freedom). The invention determines an accurate object pose from an approximate starting pose in a small, fixed number of increments that is independent of the number of dimensions of the space, and independent of the distance between the starting and final poses, provided that the starting pose is within the “capture range” of the true pose. Thus, accuracy need not be sacrificed to keep execution time acceptable for practical applications. Specifying locations in four or more dimensions will often result in better matches between the pattern and image than two-dimensional location systems, thereby improving accuracy. Accuracy is not degraded if some portion of the object is missing or occluded, or if unexpected extra features are present.
摘要翻译：提供了一种方法和装置，用于快速地精化图案的给定的近似位置以产生更准确的位置。本发明采用包括平移，取向和尺度的多维空间。本发明可以作为用于图案定位的任何粗细系统的精细分辨率相位的替代。模式和图像由基于特征的描述表示，其可以比数字图像重新采样更快地转换，旋转和缩放到任意精度，并且没有像素网格量化误差。因此，精度不受网格表示位置，方向或大小（或其他自由度）的小变化的能力的限制。本发明根据独立于空间的数量的小的固定数量的增量来确定来自近似起始姿态的准确的物体姿态，并且独立于起始和最终姿态之间的距离，只要起始姿势为在“拍摄范围”内的真实姿势。因此，不需要牺牲精度来保持实际应用可接受的执行时间。在四维或更多维度上指定位置通常会导致图形和图像之间比二维位置系统更好的匹配，从而提高准确性。如果对象的某些部分丢失或遮挡，或者如果出现意外的额外特征，则精度不会降低。

6. 发明授权

US06850646B1 Fast high-accuracy multi-dimensional pattern inspection 有权
标题翻译：快速高精度多维图案检查
公开(公告)号：US06850646B1
公开(公告)日：2005-02-01
申请号：US10705295
申请日：2003-11-10
申请人： William Silver , Aaron Wallack , Adam Wagman
发明人： William Silver , Aaron Wallack , Adam Wagman
IPC分类号： G06T7/00 , G06K9/48
CPC分类号： G06K9/6206 , G06T7/74
摘要： A method and apparatus are provided for identifying diffe rences between a stored pattern and a matching image subset, where variations in pattern position, orientation, and size do not give rise to false differences. The invention is also a system for analyzing an object image with respect to a model pattern so as to detect flaws in the object image. The system includes extracting pattern features from the model pattern; generating a vector-valued function using the pattern features to provide a pattern field; extracting image features from the object image; evaluating each image feature, using the pattern field and an n-dimensional transformation that associates image features with pattern features, so as to determine at least one associated feature characteristic; and using at least one feature characteristic to identify at least one flaw in the object image. The invention can find at least two distinct kinds of flaws: missing features, and extra features. The invention provides pattern inspection that is faster and more accurate than any known prior art method by using a stored pattern that represents an ideal example of the object to be found and inspected, and that can be translated, rotated, and scaled to arbitrary precision much faster than digital image re-sampling, and without pixel grid quantization errors. Furthermore, since the invention does not use digital image re-sampling, there are no pixel quantization errors to cause false differences between the pattern and image that can limit inspection performance.
摘要翻译：提供了一种用于识别存储的图案和匹配图像子集之间的差异的方法和装置，其中图案位置，取向和尺寸的变化不会引起错误的差异。本发明还是一种用于分析相对于模型图案的对象图像以便检测对象图像中的缺陷的系统。该系统包括从模型模式中提取模式特征; 使用所述模式特征生成向量值函数以提供模式字段; 从对象图像提取图像特征; 使用所述图案字段和将图像特征与图案特征相关联的n维变换来评估每个图像特征，以便确定至少一个相关联的特征特征; 以及使用至少一个特征特征来识别所述对象图像中的至少一个缺陷。本发明可以发现至少两种不同种类的缺陷：缺失特征和额外特征。本发明通过使用表示待发现和检查的对象的理想示例的存储模式，并且可以被转换，旋转和缩放到任意精度而提供比任何已知的现有技术方法更快更准确的模式检查比数字图像重采样更快，并且没有像素网格量化误差。此外，由于本发明不使用数字图像重新采样，因此不存在像素量化误差，导致图案和图像之间可能限制检查性能的误差。

7. 发明授权

US06690842B1 Apparatus and method for detection and sub-pixel location of edges in a digital image 有权
标题翻译：用于数字图像中边缘的检测和子像素位置的装置和方法
公开(公告)号：US06690842B1
公开(公告)日：2004-02-10
申请号：US10114357
申请日：2002-04-02
申请人： William Silver , Arman Garakani , Aaron Wallack
发明人： William Silver , Arman Garakani , Aaron Wallack
IPC分类号： G06L932
CPC分类号： G06T7/12 , G06T2207/10016
摘要： The invention provides a fast, computationally inexpensive, and highly accurate method and apparatus for edge detection in a digital image, even for edges that are not substantially parallel to the axes of the pixel grid, by exploiting computationally inexpensive estimates of gradient magnitude and direction. In particular, the method includes the steps of: estimating gradient magnitude and direction at a plurality of regularly-spaced pixel points in the image so as to provide a plurality of estimates of gradient magnitude and direction, each such estimate being associated with a respective gradient point of a regularly-spaced gradient grid; using gradient direction associated with each gradient point to select a respective set of neighboring gradient points; comparing gradient magnitude associated with each gradient point with each gradient magnitude of the respective set of neighboring gradient magnitudes so as to determine which of the gradient magnitudes is a local maximum in approximately the gradient direction; and using the local maximum of gradient magnitude and a set of neighboring gradient magnitudes to determine an interpolated edge position along a one-dimensional gradient magnitude profile. Another aspect of the invention for providing two-dimensional edge position interpolation further includes the step of determining a plane position line normal to the gradient direction of a gradient point associated with the local maximum of gradient magnitude, the plane position line also passing through the interpolated edge position, along which plane position line at least one two-dimensional interpolated position of the edge can be determined.
摘要翻译：本发明通过利用计算上便宜的梯度和方向的估计，为数字图像中的边缘检测提供了一种快速的，计算上便宜的且高度准确的方法和装置，即使对于基本上不平行于像素网格的轴的边缘也是如此。特别地，该方法包括以下步骤：估计图像中的多个规则间隔的像素点处的梯度幅度和方向，以便提供梯度幅度和方向的多个估计，每个这样的估计与相应梯度相关联一个规则间隔的梯度网格点; 使用与每个梯度点相关联的梯度方向来选择相应的相邻梯度点集合; 将与每个梯度点相关联的梯度幅度与各个相邻梯度幅度集合的每个梯度幅度进行比较，以便确定大致梯度方向上的哪个梯度幅度是局部最大值; 并且使用梯度幅度的局部最大值和一组相邻梯度幅度来确定沿着一维梯度幅度轮廓的内插边缘位置。用于提供二维边缘位置插值的本发明的另一方面还包括以下步骤：确定与梯度大小的局部最大值相关联的梯度点的梯度方向垂直的平面位置线，该平面位置线也经过内插边缘位置，沿着该位置线可以确定边缘的至少一个二维插值位置。

8. 发明授权

US07088862B1 Fast high-accuracy multi-dimensional pattern inspection 失效
公开(公告)号：US07088862B1
公开(公告)日：2006-08-08
申请号：US10705297
申请日：2003-11-10
申请人： William Silver , Aaron Wallack , Adam Wagman
发明人： William Silver , Aaron Wallack , Adam Wagman
IPC分类号： G06K9/40
CPC分类号： G06K9/32 , G06K9/6203 , G06T7/75
摘要： A method and apparatus are provided for identifying differences between a stored pattern and a matching image subset, where variations in pattern position, orientation, and size do not give rise to false differences. The invention is also a system for analyzing an object image with respect to a model pattern so as to detect flaws in the object image. The system includes extracting pattern features from the model pattern; generating a vector-valued function using the pattern features to provide a pattern field; extracting image features from the object image; evaluating each image feature, using the pattern field and an n-dimensional transformation that associates image features with pattern features, so as to determine at least one associated feature characteristic; and using at least one feature characteristic to identify at least one flaw in the object image. The invention can find at least two distinct kinds of flaws: missing features, and extra features. The invention provides pattern inspection that is faster and more accurate than any known prior art method by using a stored pattern that represents an ideal example of the object to be found and inspected, and that can be translated, rotated, and scaled to arbitrary precision much faster than digital image re-sampling, and without pixel grid quantization errors. Furthermore, since the invention does not use digital image re-sampling, there are no pixel quantization errors to cause false differences between the pattern and image that can limit inspection performance.

9. 发明授权

US07065262B1 Fast high-accuracy multi-dimensional pattern inspection 有权
公开(公告)号：US07065262B1
公开(公告)日：2006-06-20
申请号：US10705563
申请日：2003-11-10
申请人： William Silver , Aaron Wallack , Adam Wagman
发明人： William Silver , Aaron Wallack , Adam Wagman
IPC分类号： G06K9/36
CPC分类号： G06K9/32 , G06K9/6203 , G06T7/75
摘要： A method and apparatus are provided for identifying differences between a stored pattern and a matching image subset, where variations in pattern position, orientation, and size do not give rise to false differences. The invention is also a system for analyzing an object image with respect to a model pattern so as to detect flaws in the object image. The system includes extracting pattern features from the model pattern; generating a vector-valued function using the pattern features to provide a pattern field; extracting image features from the object image; evaluating each image feature, using the pattern field and an n-dimensional transformation that associates image features with pattern features, so as to determine at least one associated feature characteristic; and using at least one feature characteristic to identify at least one flaw in the object image. The invention can find at least two distinct kinds of flaws: missing features, and extra features. The invention provides pattern inspection that is faster and more accurate than any known prior art method by using a stored pattern that represents an ideal example of the object to be found and inspected, and that can be translated, rotated, and scaled to arbitrary precision much faster than digital image re-sampling, and without pixel grid quantization errors. Furthermore, since the invention does not use digital image re-sampling, there are no pixel quantization errors to cause false differences between the pattern and image that can limit inspection performance.

10. 发明授权

US07058225B1 Fast high-accuracy multi-dimensional pattern inspection 有权
公开(公告)号：US07058225B1
公开(公告)日：2006-06-06
申请号：US10705454
申请日：2003-11-10
申请人： William Silver , Aaron Wallack , Adam Wagman
发明人： William Silver , Aaron Wallack , Adam Wagman
IPC分类号： G06K9/62 , G06K9/48
CPC分类号： G06K9/32 , G06K9/6203 , G06T7/75
摘要： A method and apparatus are provided for identifying differences between a stored pattern and a matching image subset, where variations in pattern position, orientation, and size do not give rise to false differences. The invention is also a system for analyzing an object image with respect to a model pattern so as to detect flaws in the object image. The system includes extracting pattern features from the model pattern; generating a vector-valued function using the pattern features to provide a pattern field; extracting image features from the object image; evaluating each image feature, using the pattern field and an n-dimensional transformation that associates image features with pattern features, so as to determine at least one associated feature characteristic; and using at least one feature characteristic to identify at least one flaw in the object image. The invention can find at least two distinct kinds of flaws: missing features, and extra features. The invention provides pattern inspection that is faster and more accurate than any known prior art method by using a stored pattern that represents an ideal example of the object to be found and inspected, and that can be translated, rotated, and scaled to arbitrary precision much faster than digital image re-sampling, and without pixel grid quantization errors. Furthermore, since the invention does not use digital image re-sampling, there are no pixel quantization errors to cause false differences between the pattern and image that can limit inspection performance.

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