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    • 2. 发明授权
    • Microprocessor-based capacitance measurement
    • 基于微处理器的电容测量
    • US07592819B2
    • 2009-09-22
    • US11678158
    • 2007-02-23
    • Keith W. KawateJohn A. PowningMark GenoveseEric M. Visser
    • Keith W. KawateJohn A. PowningMark GenoveseEric M. Visser
    • G01R27/26
    • G01R27/2605G01D5/24
    • An improved system and method of performing capacitance measurements that provides a fast digital response and a reduced output error. The capacitance measurement system includes a circuit configuration that has a variable capacitor and at least one reference capacitor connected to one another at a common node, which in turn is connected to the input of an analog-to-digital converter. The circuit configuration further includes an array of switches coupled between the variable and reference capacitors and the supply voltage, a reference voltage, and ground, respectively. The switched variable and reference capacitors are employed in conjunction with the A-to-D converter to perform, at the common node, a plurality of direct voltage measurements for use in generating an expression defining the capacitance of the variable capacitor.
    • 改进的提供快速数字响应和减少的输出误差的电容测量的系统和方法。 电容测量系统包括具有可变电容器和在公共节点处彼此连接的至少一个参考电容器的电路配置,该公共节点又连接到模数转换器的输入。 电路配置还包括分别耦合在可变参考电容器和参考电容器之间的开关阵列和电源电压,参考电压和接地。 开关可变和参考电容器与A-D转换器一起使用,以在公共节点处执行多个直接电压测量,以用于产生定义可变电容器的电容的表达式。
    • 3. 发明申请
    • Microprocessor-Based Capacitance Measurement
    • 基于微处理器的电容测量
    • US20080204049A1
    • 2008-08-28
    • US11678158
    • 2007-02-23
    • Kawate W. KawateJohn A. PowningMark GenoveseEric M. Visser
    • Kawate W. KawateJohn A. PowningMark GenoveseEric M. Visser
    • G01R27/26
    • G01R27/2605G01D5/24
    • An improved system and method of performing capacitance measurements that provides a fast digital response and a reduced output error. The capacitance measurement system includes a circuit configuration that has a variable capacitor and at least one reference capacitor connected to one another at a common node, which in turn is connected to the input of an analog-to-digital converter. The circuit configuration further includes an array of switches coupled between the variable and reference capacitors and the supply voltage, a reference voltage, and ground, respectively, The switched variable and reference capacitors are employed in conjunction with the A-to-D converter to perform, at the common node, a plurality of voltage measurements for use in generating an expression defining the capacitance of the variable capacitor, The generated expression of variable capacitance is independent of a number of specified output error sources including but not limited to a sample-and-hold capacitance, the parasitic capacitance at the input of the A-to-D converter, a sample-and-hold offset voltage, and the leakage current at the input of the A-to-D converter.
    • 改进的提供快速数字响应和减少的输出误差的电容测量的系统和方法。 电容测量系统包括具有可变电容器和在公共节点处彼此连接的至少一个参考电容器的电路配置,该公共节点又连接到模数转换器的输入。 电路配置还包括耦合在可变参考电容器和电源电压,参考电压和接地之间的开关阵列。开关可变和参考电容器与A-D转换器结合使用以执行 在公共节点处,用于产生限定可变电容器的电容的表达式的多个电压测量值。所产生的可变电容的表达式与指定的输出误差源的数量无关,包括但不限于样本和 A-D转换器输入端的寄生电容,采样保持偏移电压以及A-D转换器输入端的漏电流。