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1. 发明申请

US20080302974A1 OPTICAL AUTO FOCUSING SYSTEM AND METHOD FOR ELECTRON BEAM INSPECTION TOOL 有权
标题翻译：光电自动聚焦系统和电子束检测工具的方法
公开(公告)号：US20080302974A1
公开(公告)日：2008-12-11
申请号：US11759138
申请日：2007-06-06
申请人： Yi Xiang Wang , Van-Duc Nguyen , Jian Zhang
发明人： Yi Xiang Wang , Van-Duc Nguyen , Jian Zhang
IPC分类号： G21K5/10 , G01B11/00
CPC分类号： G03B13/36 , G02B7/32 , G06T7/001 , G06T2207/30148 , H01J37/21 , H01J37/28 , H01J2237/216 , H01J2237/221 , H01J2237/2482 , H01J2237/2817
摘要： A method and system for inspecting a semiconductor wafer. The method includes providing an illumination flux through a pattern plate and a lens to a surface of a specimen to project a pattern onto the surface of the specimen. The pattern is associated with the pattern plate. Additionally, the method includes detecting the illumination flux reflected from the surface of the specimen with a detector, processing information associated with the detected illumination flux, and generating a first image based on at least information associated with the detected illumination flux. The first image includes a first image part for the pattern and a second image part for the specimen. Moreover, the method includes adjusting the lens to a state in order to achieve a first predetermined quality for the first image part, and moving the specimen to a first position.
摘要翻译：一种用于检查半导体晶片的方法和系统。该方法包括将图案板和透镜的照射通量提供到样品的表面以将图案投影到样品的表面上。图案与图案板相关联。此外，该方法包括利用检测器检测从样本表面反射的照射通量，处理与检测到的照射通量相关联的信息，以及至少基于与检测到的照射通量相关联的信息产生第一图像。第一图像包括用于图案的第一图像部分和用于样本的第二图像部分。此外，该方法包括将透镜调整到状态以便实现第一图像部分的第一预定质量，并将样本移动到第一位置。

2. 发明授权

US07767982B2 Optical auto focusing system and method for electron beam inspection tool 有权
标题翻译：光电自动对焦系统及电子束检测工具
公开(公告)号：US07767982B2
公开(公告)日：2010-08-03
申请号：US11759138
申请日：2007-06-06
申请人： Yi Xiang Wang , Van-Duc Nguyen , Jian Zhang
发明人： Yi Xiang Wang , Van-Duc Nguyen , Jian Zhang
IPC分类号： H01J49/00 , B01D59/44
CPC分类号： G03B13/36 , G02B7/32 , G06T7/001 , G06T2207/30148 , H01J37/21 , H01J37/28 , H01J2237/216 , H01J2237/221 , H01J2237/2482 , H01J2237/2817
摘要： A method and system for inspecting a semiconductor wafer. The method includes providing an illumination flux through a pattern plate and a lens to a surface of a specimen to project a pattern onto the surface of the specimen. The pattern is associated with the pattern plate. Additionally, the method includes detecting the illumination flux reflected from the surface of the specimen with a detector, processing information associated with the detected illumination flux, and generating a first image based on at least information associated with the detected illumination flux. The first image includes a first image part for the pattern and a second image part for the specimen. Moreover, the method includes adjusting the lens to a state in order to achieve a first predetermined quality for the first image part, and moving the specimen to a first position.
摘要翻译：一种用于检查半导体晶片的方法和系统。该方法包括将图案板和透镜的照射通量提供到样品的表面以将图案投影到样品的表面上。图案与图案板相关联。此外，该方法包括利用检测器检测从样本表面反射的照射通量，处理与检测到的照射通量相关联的信息，以及至少基于与检测到的照射通量相关联的信息产生第一图像。第一图像包括用于图案的第一图像部分和用于样本的第二图像部分。此外，该方法包括将透镜调整到状态以便实现第一图像部分的第一预定质量，并将样本移动到第一位置。

3. 发明授权

US08698070B2 Phase detector 有权
标题翻译：相位检测器
公开(公告)号：US08698070B2
公开(公告)日：2014-04-15
申请号：US13271811
申请日：2011-10-12
申请人： Yi-Xiang Wang , Jian Zhang
发明人： Yi-Xiang Wang , Jian Zhang
IPC分类号： G01D5/34
CPC分类号： G01J9/00
摘要： This invention provides a phase detector with more than two detector units on a printed circuit layer. A detector set includes a pair of detector units or one detector unit, and a detector row includes a plurality of detector sets in one line. The phase detector includes a plurality of detector rows and each row has a detector set in one period, wherein all detector units are interleaved to have the same interval between any two adjacent detector units, which is defined as a pitch and the pitch is equal to one period dividing the detector pair number, which is the half sum of the number of one detector set for all rows.
摘要翻译：本发明提供一种在印刷电路层上具有多于两个检测器单元的相位检测器。检测器组包括一对检测器单元或一个检测器单元，检测器行包括一行中的多个检测器组。相位检测器包括多个检测器行，并且每行具有在一个周期中设置的检测器，其中所有检测器单元被交错以在任何两个相邻检测器单元之间具有相同的间隔，其被定义为间距，并且间距等于一个分隔检测器对数的周期，它是所有行的一个检测器的数量的一半。

4. 发明申请

US20130094017A1 PHASE DETECTOR 有权
标题翻译：相位检测器
公开(公告)号：US20130094017A1
公开(公告)日：2013-04-18
申请号：US13271811
申请日：2011-10-12
申请人： Yi-Xiang WANG , Jian Zhang
发明人： Yi-Xiang WANG , Jian Zhang
IPC分类号： G01J1/00
CPC分类号： G01J9/00
摘要： This invention provides a phase detector with more than two detector units on a printed circuit layer. A detector set includes a pair of detector units or one detector unit, and a detector row includes a plurality of detector sets in one line. The phase detector includes a plurality of detector rows and each row has a detector set in one period, wherein all detector units are interleaved to have the same interval between any two adjacent detector units, which is defined as a pitch and the pitch is equal to one period dividing the detector pair number, which is the half sum of the number of one detector set for all rows.
摘要翻译：本发明提供一种在印刷电路层上具有多于两个检测器单元的相位检测器。检测器组包括一对检测器单元或一个检测器单元，检测器行包括一行中的多个检测器组。相位检测器包括多个检测器行，并且每行具有在一个周期中设置的检测器，其中所有检测器单元被交错以在任何两个相邻检测器单元之间具有相同的间隔，其被定义为间距，并且间距等于一个分隔检测器对数的周期，它是所有行的一个检测器的数量的一半。

5. 外观设计

USD980356S1 Automatic ball launcher 有权
公开(公告)号：USD980356S1
公开(公告)日：2023-03-07
申请号：US29844017
申请日：2022-06-25
申请人： Jian Zhang
设计人： Jian Zhang

6. 发明授权

US11524401B1 Learning skills from video demonstrations 有权
公开(公告)号：US11524401B1
公开(公告)日：2022-12-13
申请号：US16829277
申请日：2020-03-25
申请人： Jian Zhang , Mario J. Srouji , Ruslan Salakhutdinov
发明人： Jian Zhang , Mario J. Srouji , Ruslan Salakhutdinov
IPC分类号： G05B19/04 , B25J9/16 , G06T7/20 , G06N20/00 , G06N5/04 , G05B13/02
摘要： A method includes determining motion imitation information for causing a system to imitate a physical task using a first machine learning model that is trained using motion information that represents a performance of the physical task, determining a predicted correction based on the motion information and a current state from the system using a second machine learning model that is trained using the motion information, determining an action to be performed by the system based on the motion imitation information and the predicted correction; and controlling motion of the system in accordance with the action.

7. 发明申请

US20220005720A1 Fluxless gang die bonding arrangement 有权
公开(公告)号：US20220005720A1
公开(公告)日：2022-01-06
申请号：US16873779
申请日：2020-07-02
申请人： Jian Zhang
发明人： Jian Zhang
IPC分类号： H01L21/68 , H01L21/67 , H01L21/687 , H01L21/683 , H01L23/00
摘要： The present invention comprises an arrangement and process for the fluxless manufacture of an integrated circuit component, comprising the steps of loading a solder ball and chip arrangement, solder ball side up or down, onto a first or a second donor chuck respectively; monitoring the solder ball and chip arrangement by a computer-controlled camera; removing the solder ball and chip arrangement from the donor chuck by a computer-controlled gripper mechanism; moving the solder ball and chip arrangement via the gripper mechanism onto a computer-controlled gang carrier, the monitored by a second computer controlled camera; flipping the gang carrier about a horizontal axis so as to arrange the solder ball and chip arrangement into an inverted, solder ball side down orientation over a receiver chuck substrate, monitored and positionally controlled by a third computer-controlled camera; and compressing the solder ball side down solder ball and chip arrangement onto the receiver chuck substrate by a computer-controlled compression rod so as to bond the solder ball side down solder ball and chip arrangement onto the receiver chuck substrate so as to form an integrated circuit assembly.

8. 外观设计

USD818726S1 Swing 有权
公开(公告)号：USD818726S1
公开(公告)日：2018-05-29
申请号：US29599093
申请日：2017-03-31
申请人： Jian Zhang
设计人： Jian Zhang

9. 发明授权

US09510253B2 Method and system for determining reason for too late handover to home eNB 有权
标题翻译：确定到家庭eNB切换过迟的原因的方法和系统
公开(公告)号：US09510253B2
公开(公告)日：2016-11-29
申请号：US13520792
申请日：2010-04-26
申请人： Lifeng Han , Yin Gao , Longtao Ren , Jian Zhang , Shengyao Jin
发明人： Lifeng Han , Yin Gao , Longtao Ren , Jian Zhang , Shengyao Jin
IPC分类号： H04W36/08 , H04W36/00 , H04W92/20
CPC分类号： H04W36/08 , H04W36/0005 , H04W36/0016 , H04W36/0055 , H04W92/20
摘要： The present disclosure provides a method for determining a reason for too late handover to a Home eNB (HeNB), and the method includes that: after completing the re-establishment link of Radio. Resource Control (RRC) with User Equipment (UE), the HeNB confirms that a Radio Link Failure (RLF) event occurs when the UE is connected with a cell of another eNodeB; the HeNB generates an RLF Indication message and transmits the RLF Indication message to the another eNodeB, wherein the RLF Indication message includes information of a Closed Subscriber Group (CSG) cell currently accessed by the UE; the another eNodeB determines the reason for too late handover of the UE to the HeNB according to the RLF Indication message. The disclosure also provides a system for determining the reason for too late handover to the HeNB. The present disclosure can determine a specific reason for the RLF, and thereby, can be more useful for improving the configuration of related parameters at the network side.
摘要翻译：本公开提供了一种用于确定到家庭eNB（HeNB）的切换过晚的原因的方法，并且该方法包括：完成无线电的重新建立链路之后。资源控制（RRC）与用户设备（UE），HeNB确认当UE与另一个eNodeB的小区连接时，发生无线链路故障（RLF）事件; HeNB生成RLF指示消息并将RLF指示消息发送到另一个eNodeB，其中RLF指示消息包括UE当前访问的封闭用户组（CSG）小区的信息; 另一个eNodeB根据RLF指示消息确定UE到HeNB的切换过晚的原因。本公开还提供了一种用于确定到HeNB切换过晚的原因的系统。本公开可以确定RLF的特定原因，从而可以更有用于改善网络侧的相关参数的配置。

10. 发明申请

US20160227988A1 Sheathed Duodenoscope 审中-公开
标题翻译：护颈十二指肠镜
公开(公告)号：US20160227988A1
公开(公告)日：2016-08-11
申请号：US15098602
申请日：2016-04-14
申请人： Kerang Jiang , Xiangyang Wu , Zhenyu Zhou , Chong Chen , Jian Zhang , Ming Xu
发明人： Kerang Jiang , Xiangyang Wu , Zhenyu Zhou , Chong Chen , Jian Zhang , Ming Xu
IPC分类号： A61B1/00 , A61B1/273 , A61B1/018
CPC分类号： A61B1/00142 , A61B1/00096 , A61B1/00098 , A61B1/00101 , A61B1/00135 , A61B1/00137 , A61B1/00177 , A61B1/0615
摘要： A sheathed endoscope, includes: an endoscope and a disposable component. The disposable compartment protects the inner and outer surfaces of the endoscope. The disposable compartment includes: a cap of endoscope tip in the distal end of endoscope, a disposable tube for biopsy forceps, and an outside sheath capsule for endoscope shaft. The tip cap connects the sheath capsule and the disposable tube for biopsy forceps. There are multiple windows set on the lateral side of endoscope tip, wherein pills containing transparent fluid are placed somewhere in between of the tip cap and the distal end of endoscope. The pills will be crushed by co-fraction of the tip cap and the distal end of endoscope, to release the transparent fluid to fill in the space formed between the tip cap and the distal end of the endoscope. This disposable sheath compartment in the invention will cover all surfaces of the endoscope with disposable material, preventing contaminations on endoscope during endoscopy, meanwhile there is anti-glaring design, to prevent producing of glaring in the space formed between the tip cap and the distal end of endoscope.
摘要翻译：护套内窥镜包括：内窥镜和一次性部件。一次性隔间保护内窥镜的内表面和外表面。一次性隔室包括：内窥镜前端的内窥镜顶盖，活检钳的一次性管，以及内窥镜轴用外鞘。尖端帽连接鞘囊和用于活检钳的一次性管。在内窥镜头的侧面设置有多个窗口，其中包含透明流体的药丸放置在尖端帽和内窥镜的远端之间的某处。丸剂将被顶盖和内窥镜的远端的共同部分压碎，以释放透明流体，以填充尖端盖和内窥镜的远端之间形成的空间。本发明的这种一次性护套室将以一次性材料覆盖内窥镜的所有表面，防止在内窥镜检查时对内窥镜的污染，同时具有防眩光设计，以防止在尖端帽与远端之间形成的空间中产生眩光的内窥镜。

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