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1. 发明申请

US20130013224A1 Strain Measuring Method, Strain Measuring Device and Program 审中-公开
标题翻译：应变测量方法，应变测量装置和程序
公开(公告)号：US20130013224A1
公开(公告)日：2013-01-10
申请号：US13394116
申请日：2010-09-02
申请人： Yukihiro Ito , Kenyu Inoue , Hiroshi Matsuda , Masakazu Uchino
发明人： Yukihiro Ito , Kenyu Inoue , Hiroshi Matsuda , Masakazu Uchino
IPC分类号： G06F19/00 , G01L1/24
CPC分类号： G01B11/16 , G01B11/0608 , G01B11/24
摘要： A strain measuring device is provided which is not affected by a change in the intensity and irradiation direction of light received by a measurement target and which enables stable measurement. A computer functions as minute region extracting device for extracting respective surface height distributions of minute regions a and b containing points A and B in a predetermined region from an initial surface height distribution obtained by measuring the predetermined region (6) of the measurement target by a surface height measuring device, coordinate calculating device for calculating coordinates of points A′ and B′ in minute regions a′ and b′ most similar to the minute regions a and b over a time-advanced surface height distribution of the predetermined region 6 and corresponding to the points A and B in the minute regions a and b, respectively, and strain calculating device for calculating a strain in a direction of a line AB of the measurement target.
摘要翻译：提供一种应变测量装置，其不受测量对象所接收的光的强度和照射方向的变化的影响，能够进行稳定的测量。计算机用作微区域提取装置，用于从通过测量目标的预定区域（6）获得的初始表面高度分布提取预定区域中包含点A和B的微小区域a和b的各个表面高度分布，表面高度测量装置，用于计算与预定区域6的时间提前表面高度分布最相似的微小区域a'和b'的微小区域a'和b'中的点A'和B'的坐标的坐标计算装置分别与微小区域a和b中的点A和点B相对应，以及应变计算装置，用于计算测量对象的线AB的方向上的应变。

2. 发明授权

US08345333B2 Displacement/distortion measuring method and displacement/distortion measuring apparatus 失效
标题翻译：位移/失真测量方法和位移/失真测量仪器
公开(公告)号：US08345333B2
公开(公告)日：2013-01-01
申请号：US12158844
申请日：2006-12-21
申请人： Hiroshi Matsuda , Masakazu Uchino , Yukihiro Ito , Kousuke Yoshimaru , Chikara Yamazaki , Shuichi Yamazaki , Kousuke Uchida
发明人： Hiroshi Matsuda , Masakazu Uchino , Yukihiro Ito , Kousuke Yoshimaru , Chikara Yamazaki , Shuichi Yamazaki , Kousuke Uchida
IPC分类号： G03F3/08 , G06K15/00 , G06K9/00 , G02B27/42 , G01B11/14
CPC分类号： G01B11/16
摘要： Provided are a displacement/distortion measuring method and a displacement/distortion measuring apparatus for easily and highly accurately measuring displacement or distortion of an object. An image of the surface of the measuring object is picked up by a line scanner apparatus adhered or brought close to the surface of the measuring object. The image is taken, displacement or distortion is measured by image analysis of the image of the measuring object surface prior to time lapse and that after time lapse, and displacement or distortion measuring results are outputted.
摘要翻译：提供了用于容易且高精度地测量物体的位移或变形的位移/变形测量方法和位移/变形测量装置。测量对象的表面的图像由靠近测量对象表面的线扫描仪装置拾起。拍摄图像，通过在时间流逝之前的测量对象表面的图像的图像分析以及经过时间后输出位移或失真测量结果来测量位移或失真。

3. 发明申请

US20090284804A1 Displacement/Distortion Measuring Method and Displacement/Distortion Measuring Apparatus 失效
标题翻译：位移/失真测量方法和位移/失真测量仪器
公开(公告)号：US20090284804A1
公开(公告)日：2009-11-19
申请号：US12158844
申请日：2006-12-21
申请人： Hiroshi Matsuda , Masakazu Uchino , Yukihiro Ito , Kousuke Yoshimaru , Chikara Yamazaki , Shuichi Yamazaki , Kousuke Uchida
发明人： Hiroshi Matsuda , Masakazu Uchino , Yukihiro Ito , Kousuke Yoshimaru , Chikara Yamazaki , Shuichi Yamazaki , Kousuke Uchida
IPC分类号： H04N1/40 , G06K9/00
CPC分类号： G01B11/16
摘要： Provided are a displacement/distortion measuring method and a displacement/distortion measuring apparatus for easily and highly accurately measuring displacement or distortion of an object. An image of the surface of the measuring object is picked up by a line scanner apparatus adhered or brought close to the surface of the measuring object. The image is taken, displacement or distortion is measured by image analysis of the image of the measuring object surface prior to time lapse and that after time lapse, and displacement or distortion measuring results are outputted.
摘要翻译：提供了用于容易且高精度地测量物体的位移或变形的位移/变形测量方法和位移/变形测量装置。测量对象的表面的图像由靠近测量对象表面的线扫描仪装置拾起。拍摄图像，通过在时间流逝之前的测量对象表面的图像的图像分析以及经过时间后输出位移或失真测量结果来测量位移或失真。

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