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1. 发明授权

US10060720B2 Optical coherence imaging systems having a reduced effective linewidth 有权
公开(公告)号：US10060720B2
公开(公告)日：2018-08-28
申请号：US15386692
申请日：2016-12-21
申请人： Bioptigen, Inc.
发明人： Joseph A. Izatt , Eric L. Buckland , William J. Brown
IPC分类号： G01B9/02 , A61B3/10 , A61B3/12
CPC分类号： G01B9/02044 , A61B3/102 , A61B3/1225 , A61B5/0066 , G01B9/02004 , G01B9/02007 , G01B9/02008 , G01B9/02091 , G01B2290/45 , G01N21/4795
摘要： Frequency domain optical coherence imaging systems have an optical source, an optical detector and an optical transmission path between the optical source and the optical detector. The optical transmission path between the optical source and the optical detector reduces an effective linewidth of the imaging system. The optical source may be a broadband source and the optical transmission path may include a periodic optical filter.

2. 发明申请

US20180106590A1 THREE-DIMENSIONAL MEASUREMENT DEVICE 审中-公开
公开(公告)号：US20180106590A1
公开(公告)日：2018-04-19
申请号：US15820816
申请日：2017-11-22
申请人： CKD Corporation
发明人： Hiroyuki Ishigaki , Takahiro Mamiya
IPC分类号： G01B9/02 , G01J3/02 , H01L21/66 , H05K3/00
CPC分类号： G01B9/0203 , G01B9/02007 , G01B9/02011 , G01B9/02018 , G01B9/02024 , G01B9/02027 , G01B9/02057 , G01B9/02079 , G01B9/02081 , G01B11/2441 , G01B2290/45 , G01B2290/70 , G01J3/0205 , H01L22/12 , H05K3/00
摘要： A three-dimensional measurement device includes an optical system that: splits an incident light into two lights; radiates one light to a measurement object and the other light to a reference surface; and emits the combined light; a first irradiator that emits a first light that comprises a polarized light of a first wavelength and enters a first element of the optical system; a second irradiator that emits a second light that comprises a polarized light of a second wavelength and enters a second element of the optical system; a first camera that takes an image of the first light emitted from the second element when the first light enters the first element; a second camera that takes an image of the second light emitted from the first element when the second light enters the second element; and an image processor that performs measurement based on the images.

3. 发明申请

US20180070813A1 Apparatus and Method for Detecting Surface Topography 审中-公开
公开(公告)号：US20180070813A1
公开(公告)日：2018-03-15
申请号：US15802829
申请日：2017-11-03
申请人： ADOM, Advanced Optical Technologies Ltd
发明人： Yoel Arieli , Yoel Cohen , Shlomi Epstein , Dror Arbel , Ra'anan Gefen
IPC分类号： A61B3/10 , A61B3/00 , A61B3/15 , G01B9/02 , G01B11/06 , G01N21/27 , G02B3/08
CPC分类号： A61B3/101 , A61B3/0025 , A61B3/10 , A61B3/1005 , A61B3/152 , G01B9/02021 , G01B9/02025 , G01B9/02027 , G01B9/02044 , G01B9/02087 , G01B9/0209 , G01B11/06 , G01B11/0625 , G01B11/0675 , G01B2290/45 , G01J3/00 , G01N21/274 , G01N2201/066 , G01N2201/127 , G02B3/08 , G06T2207/30041
摘要： Apparatus and methods are described, for detecting the surface topography of a portion of a curved surface of an object. A beam of light is directed toward the surface from a broad angle of incidence with respect to an optical axis of a camera. Light reflected from the surface is received by the camera, via a narrow-angle aperture. One or more darkened regions in the received light are detected, and the surface topography of portion of the surface is detected at least partially in response to the detected darkened regions. Other applications are also described.

4. 发明申请

US20180017372A1 PRECISION SURFACE MEASUREMENT IN A VACUUM 审中-公开
公开(公告)号：US20180017372A1
公开(公告)日：2018-01-18
申请号：US15648154
申请日：2017-07-12
申请人： UCHICAGO ARGONNE, LLC
发明人： Raymond P. CONLEY , Jun QIAN , Mark J. ERDMANN , Elina KASMAN , Lahsen ASSOUFID , Scott J. IZZO
IPC分类号： G01B9/02 , G01B11/24
CPC分类号： G01B9/0209 , G01B9/02002 , G01B9/02022 , G01B9/02057 , G01B9/02062 , G01B9/02091 , G01B11/2441 , G01B2290/45
摘要： Methods and related equipment for dynamic on-axis in-situ interferometry where the reference surface is positioned in an vacuum chamber. The systems use a wavelength shifting, or a phase shifting interferometer that allows the freedom to eliminate the need to step the cavity length physically with the reference surface, allowing the reference surface to be placed inside the vacuum chamber.

5. 发明授权

US09833139B1 System and method for performing tear film structure measurement 有权
公开(公告)号：US09833139B1
公开(公告)日：2017-12-05
申请号：US15671413
申请日：2017-08-08
申请人： ADOM, Advanced Optical Technologies Ltd
发明人： Yoel Arieli , Yoel Cohen , Shlomi Epstein , Dror Arbel , Ra'anan Gefen
IPC分类号： A61B3/14 , A61B3/10 , G02B3/08 , G01B9/02 , A61B3/00 , A61B3/15 , G01B11/06 , G01N21/27
CPC分类号： A61B3/101 , A61B3/0025 , A61B3/1005 , A61B3/152 , G01B9/02021 , G01B9/02025 , G01B9/02027 , G01B9/02044 , G01B9/02087 , G01B9/0209 , G01B11/06 , G01B11/0625 , G01B11/0675 , G01B2290/45 , G01N21/274 , G01N2201/066 , G01N2201/127 , G02B3/08
摘要： Apparatus and methods are described for performing structure measurement on a tear film of an eye of a subject. At least a portion of a surface of the tear film is illuminated using a broadband light source. A spectrum of light of the broadband light that is reflected from at least one point of the tear film is measured, using a spectrometer. Color information for a plurality of points of the tear film is obtained, by imaging a field of view of the tear film using a color camera. Using a processing unit, data from the color camera and data from the spectrometer that are indicative of characteristics of the tear film are received, and based upon a combination of the data received from the color camera and the data received from the spectrometer, an output is generated that is indicative of a structure of the tear film.

6. 发明授权

US09791259B2 Interferometric distance sensing device and method with less dependency on environment disturbances on a fiber 有权
公开(公告)号：US09791259B2
公开(公告)日：2017-10-17
申请号：US14785367
申请日：2014-04-17
申请人： Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
发明人： Lun Kai Cheng , Ronald Antonius Jan Hagen
IPC分类号： G01B9/02
CPC分类号： G01B9/0209 , G01B9/02014 , G01B9/02057 , G01B9/02064 , G01B9/02065 , G01B9/02081 , G01B2290/45
摘要： Distance to a target is sensed using a common path interferometer, wherein a first fraction of light from a light source is collected after reflection by a partially reflective element together with reflection from a target of a second fraction of light from the light source that has been transmitted by the partially reflective element. The collected light is split in two parts, both containing a part of the first fraction and part of the reflection from the target. The parts are fed through a first and second optical branch path to an input side of a three-way optical coupler respectively. Light from at three terminals on a second side of the N way coupler is fed to respective light intensity detectors. Information representing an excess distance traveled by the first fraction from detection signals determined by the least three light intensity detectors.

7. 发明授权

US09702686B2 Multiple measurement channel detector circuit for interferometers 有权
公开(公告)号：US09702686B2
公开(公告)日：2017-07-11
申请号：US14239509
申请日：2012-08-08
申请人： Simon Richard Hattersley
发明人： Simon Richard Hattersley
IPC分类号： G01B9/02
CPC分类号： G01B9/02055 , G01B9/02004 , G01B9/02027 , G01B9/02041 , G01B9/02087 , G01B9/02091 , G01B2290/45
摘要： A detector circuit for a multi-channel interferometer, typically as may be used in an optical coherence tomography device, comprising: a plurality of measurement channels (43) each comprising a measurement detector (31); and a balance channel (44) comprising a balance detector (30), each of the measurement detectors (31) and the balance detector (30) having a light sensitive area and an electrical output configured to output a signal indicative of the intensity of light incident on the light sensitive area, in which each measurement channel (43) is provided with a feedback circuit (40) comprising: a variable gain circuit (35) having an input for the signal from the measurement detector (31) and an output, the variable gain circuit (35) being configured to output at its output the signal received at its input with a variable level of gain; a difference circuit (38) having a first input for the output of the variable gain circuit (35), a second input for the signal from the balance detector (30) and an output, and being configured to output at its output a signal indicative of a difference of the signals at its first and second inputs; and a controller (36) for each variable gain circuit (35) configured to vary the variable level of gain dependent upon a low frequency component of the output of the difference circuit (38).

8. 发明申请

US20170102223A1 Optical Coherence Imaging Systems Having a Reduced Effective Linewidth 审中-公开
公开(公告)号：US20170102223A1
公开(公告)日：2017-04-13
申请号：US15386692
申请日：2016-12-21
申请人： Bioptigen, Inc.
发明人： Joseph A. Izatt , Eric L. Buckland , William J. Brown
IPC分类号： G01B9/02 , A61B3/12 , A61B3/10
CPC分类号： G01B9/02044 , A61B3/102 , A61B3/1225 , A61B5/0066 , G01B9/02004 , G01B9/02007 , G01B9/02008 , G01B9/02091 , G01B2290/45 , G01N21/4795
摘要： Frequency domain optical coherence imaging systems have an optical source, an optical detector and an optical transmission path between the optical source and the optical detector. The optical transmission path between the optical source and the optical detector reduces an effective linewidth of the imaging system. The optical source may be a broadband source and the optical transmission path may include a periodic optical filter.

9. 发明授权

US09528817B2 Systems and methods for phase measurements 有权
标题翻译：相位测量的系统和方法
公开(公告)号：US09528817B2
公开(公告)日：2016-12-27
申请号：US13715475
申请日：2012-12-14
申请人： Massachusetts Institute of Technology
发明人： Christopher Fang-Yen , Gabriel Popescu , Changhuei Yang , Adam Wax , Ramachandra Dasari , Michael Feld
IPC分类号： G01B11/02 , G01B9/02 , A61B5/1455 , G01N21/45 , A61B5/145 , A61B5/00 , G01J9/04
CPC分类号： G01B9/02091 , A61B5/14532 , A61B5/1455 , A61B5/7232 , G01B9/02002 , G01B9/02007 , G01B9/02011 , G01B9/02057 , G01B9/02063 , G01B9/02067 , G01B9/02069 , G01B9/02071 , G01B9/02072 , G01B9/02078 , G01B9/02083 , G01B9/0209 , G01B2290/45 , G01B2290/60 , G01B2290/70 , G01J9/04 , G01N21/45
摘要： Preferred embodiments of the present invention are directed to systems for phase measurement of biological materials which can be applied to the fields of, for example, cellular physiology and neuroscience. These preferred embodiments are based on principles of phase measurements and imaging technologies. The scientific motivation for using phase measurements and imaging technologies is derived from, for example, cellular biology at the sub-micron level which can include, without limitation, imaging origins of dysplasia, cellular communication, neuronal transmission and implementation of the genetic code. The structure and dynamics of sub-cellular constituents cannot be currently studied in their native state using the existing methods and technologies including, for example, x-ray and neutron scattering.
摘要翻译：本发明的优选实施方案涉及可应用于例如细胞生理学和神经科学领域的生物材料的相位测量系统。这些优选实施例基于相位测量和成像技术的原理。使用相位测量和成像技术的科学动机源于例如亚微米级别的细胞生物学，其可以包括但不限于成像发育异常起源，细胞通讯，神经元传播和遗传密码的实现。亚细胞组分的结构和动力学目前不能使用现有的方法和技术（例如x射线和中子散射）在其天然状态下研究。

10. 发明授权

US09372068B2 Measuring apparatus including multi-wavelength interferometer 有权
标题翻译：测量装置包括多波长干涉仪
公开(公告)号：US09372068B2
公开(公告)日：2016-06-21
申请号：US13711289
申请日：2012-12-11
申请人： CANON KABUSHIKI KAISHA
发明人： Akihiro Hatada , Yoshiyuki Kuramoto
IPC分类号： G01B9/02 , G01B11/24
CPC分类号： G01B9/02096 , G01B9/02002 , G01B9/02007 , G01B9/02027 , G01B9/02061 , G01B9/02067 , G01B9/02068 , G01B9/02082 , G01B11/2441 , G01B2290/45 , G01B2290/50 , G01B2290/70
摘要： A measuring apparatus for measuring a position or a shape of a surface to be inspected includes a multi-wavelength interferometer and a control unit. The multi-wavelength interferometer includes an optical system that causes light to be inspected, which enters the surface to be inspected and is reflected by the surface to be inspected, and reference light to interfere with each other, a spectroscopic unit that divides interference light between the light to be inspected and the reference light into each wavelength, and a detector that detects the interference light and is provided for each divided interference light and an optical member that can adjust a position of a light guide portion that guides light from the spectroscopic unit to the detector. The control unit controls the optical member by using information related to inclination of the surface to be inspected to adjust the position of the light guide portion.
摘要翻译：用于测量要检查的表面的位置或形状的测量装置包括多波长干涉仪和控制单元。多波长干涉仪包括使得检查光的光学系统，其进入待检查的表面并被待检查的表面反射，并且参考光彼此干涉;分光单元，其将干涉光要检查的光和参考光到每个波长，以及检测器，其检测干涉光并为每个分开的干涉光提供;以及光学部件，其可以调节导光部分的位置，导光部分引导来自分光单元的光到检测器。控制单元通过使用与要检查的表面的倾斜相关的信息来控制光学构件，以调整导光部的位置。

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