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1. 发明申请

US20180275629A1 MACHINE LEARNING DEVICE AND THERMAL DISPLACEMENT COMPENSATION DEVICE 审中-公开
公开(公告)号：US20180275629A1
公开(公告)日：2018-09-27
申请号：US15923534
申请日：2018-03-16
申请人： FANUC CORPORATION
发明人： Mitsunori WATANABE
IPC分类号： G05B19/404 , G01K3/00
CPC分类号： G05B19/404 , G01K3/00 , G01K13/00 , G01N25/16 , G05B2219/32335 , G05B2219/33034 , G05B2219/49219
摘要： A machine learning device includes: a measured data acquisition unit that acquires a measured data group; a thermal displacement acquisition unit that acquires a thermal displacement actual measured value about a machine element; a storage unit that uses the measured data group acquired by the measured data acquisition unit as input data, uses the thermal displacement actual measured value about the machine element acquired by the thermal displacement acquisition unit as a label, and stores the input data and the label in association with each other as teaching data; and a calculation formula learning unit that performs machine learning based on the measured data group and the thermal displacement actual measured value about the machine element, thereby setting a thermal displacement estimation calculation formula used for calculating the thermal displacement of the machine element based on the measured data group.

2. 发明申请

US20180149528A1 METHODS AND SYSTEMS USING OPTICAL FIBER INTERFEROMETRY 审中-公开
公开(公告)号：US20180149528A1
公开(公告)日：2018-05-31
申请号：US15575981
申请日：2016-05-19
申请人： Hifi Engineering Inc.
发明人： John HULL , Seyed Ehsan JALILIAN
IPC分类号： G01K11/32 , G01K1/20 , G01B11/16 , G01N25/16 , G01H9/00
CPC分类号： G01K11/32 , G01B11/161 , G01H9/004 , G01K1/20 , G01N21/45 , G01N25/16
摘要： Described are methods and systems using optical fiber interferometry to sense interference causing events in a region of interest and differentiate between a strain event and a thermal event. Other methods and systems relate to the use of optical fiber interferometry for determining temperature offset in a region of interest and using the determined temperature offset for determining temperature in the region of interest.

3. 发明申请

US20180128758A1 DEFORMATION MEASURING APPARATUS AND METHOD OF EVALUATING DEFORMATION USING THEROF 审中-公开
公开(公告)号：US20180128758A1
公开(公告)日：2018-05-10
申请号：US15483776
申请日：2017-04-10
申请人： SAMSUNG ELECTRONICS CO., LTD.
发明人： Ga Hee KIM , Young Suk JUNG , Yoo Seong YANG , Young Hoon LEE , Hyun Mi LEE
IPC分类号： G01N25/16 , G01B5/30
CPC分类号： G01N25/16 , G01B5/30
摘要： A deformation measuring apparatus of a specimen includes: a holder which supports the specimen; a contact portion disposed facing the holder and including a hemispherical tip; a position controlling portion which adjusts a position of the contact portion along a thickness direction of the specimen to allow the hemispherical tip to be in contact with a surface of the specimen; a heating chamber which accommodates the holder and the contact portion and heating the specimen; and a sensing portion which measures at least one of a thermal deformation force (F) of the specimen or a thickness direction thermal expansion (Δh) of the specimen.

4. 发明授权

US09945799B2 Thermal displacement correction device for machine tool 有权
公开(公告)号：US09945799B2
公开(公告)日：2018-04-17
申请号：US14670719
申请日：2015-03-27
申请人： FANUC CORPORATION
发明人： Yasuaki Koyama , Susumu Maekawa
IPC分类号： G01N25/16 , G01M99/00 , G05B19/404
CPC分类号： G01N25/16 , G01M99/002 , G05B19/404 , G05B2219/49207
摘要： A thermal displacement correction device for a machine tool is provided with detection result determination unit configured to determine, based on an actual position and a reference position detected by position detection unit, whether or not the actual position is based on correct detection, correction error calculation unit configured to calculate a correction error in the actual position if it is determined that the result of detection is based on correct detection, and correction amount modification unit configured to modify a thermal displacement correction amount based on the correction error.

5. 发明申请

US20170003236A1 Method And Apparatus For The Thermomechanical Analysis Of A Sample 审中-公开
标题翻译：一种样品的热机械分析方法与装置
公开(公告)号：US20170003236A1
公开(公告)日：2017-01-05
申请号：US15201737
申请日：2016-07-05
申请人： Netzsch-Gerätebau GmbH
发明人： Elena Moukhina , Doreen Rapp , Markus Meyer , Thilo Hilpert , Martin Hager , Fabian Wohlfahrt
IPC分类号： G01N25/16
CPC分类号： G01N25/16
摘要： A method for the thermomechanical analysis of a sample (P) of a material including (a) controlling the temperature of the sample (P), (b) recording data representative for a length variation (dL) of the sample (P), (c) evaluating the data in order to determine a reversible component (dLrev), (d) calculating a corrected reversible component (dLrev-corr; αrev-corr) and/or of the coefficient of thermal expansion (α).
摘要翻译：一种用于材料样品（P）的热机械分析的方法，包括（a）控制样品（P）的温度，（b）记录代表样品（P）的长度变化（dL）的数据（ c）评估数据以确定可逆分量（dLrev），（d）计算校正的可逆分量（dLrev-corr;αrev-corr）和/或热膨胀系数（α）。

6. 发明申请

US20160379905A1 METHOD FOR ESTIMATING STRESS OF ELECTRONIC COMPONENT 审中-公开
标题翻译：估计电子元件应力的方法
公开(公告)号：US20160379905A1
公开(公告)日：2016-12-29
申请号：US14988747
申请日：2016-01-06
申请人： Winbond Electronics Corp.
发明人： Chien-Chang Chen , Horng-Shing Lu
IPC分类号： H01L21/66 , G01N27/00 , G01L1/00 , G01N25/00
CPC分类号： H01L22/30 , G01L1/005 , G01N25/00 , G01N25/16 , G01N27/00 , H01L22/12
摘要： A method for estimating stress of an electronic component. An electronic component including first and second elements and conductive bumps is provided. Each conductive bump has two surfaces connected to the first and second elements respectively. Two adjacent conductive bumps have a pitch therebetween. The conductive bumps includes a first conductive bump and second conductive bumps. A stress value of the first conductive bump related to a testing parameter is calculated. A stress value of each second conductive bump related to the testing parameter is calculated according to a first calculating formula. The first calculating formula is σ 2 = L D - 2  r  σ 1 , σ2 is the stress of each second conductive bump, L is a beeline distance between each second conductive bump and the first conductive bump, D is an average value of the pitches of the conductive bumps, r is a radius of each surface, and σ1 is the stress value of the first conductive bump.
摘要翻译： σ2是每个第二导电凸块的应力，L是每个第二导电凸块和第一导电凸块之间的直线距离，D是导电凸块的间距的平均值，r是每个表面的半径，σ1是第一导电凸块的应力值。

7. 发明申请

US20150098485A1 DEVICE FOR GENERATING A HIGH TEMPERATURE GRADIENT IN A SAMPLE COMPRISING OPTICAL MONITORING MEANS 审中-公开
标题翻译：用于在包含光学监测装置的样品中产生高温梯度的装置
公开(公告)号：US20150098485A1
公开(公告)日：2015-04-09
申请号：US14505363
申请日：2014-10-02
申请人： COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES
发明人： Yves PONTILLON , Eric HANUS , Helene CAPDEVILA
IPC分类号： G21C17/00 , G21C17/112 , G01N1/44
CPC分类号： G21C17/001 , G01N1/44 , G01N25/16 , G21C17/06 , G21C17/112 , G21C19/08
摘要： An assembly comprising a sample and a device for generating a high temperature gradient in said sample comprises: a chamber inside which the sample is placed; a resistor passing through the sample; first inductive means at the periphery of the chamber, for creating an electromagnetic field; and second inductive means that are arranged inside the chamber and connected to the resistor, and that are capable of picking up said electromagnetic field so as to make an induced current flow through said resistor, the chamber being transparent and the first inductive means comprising at least one first coil at least one coil of which contains windings separated by at least 2 mm, this separation being configured to allow an optical means for measuring deformation to be targeted.
摘要翻译：包括样品和用于在所述样品中产生高温梯度的装置的组件包括：其中放置样品的室; 通过样品的电阻器; 在室的周边处的第一感应装置，用于产生电磁场; 以及第二电感装置，其布置在室内并连接到电阻器，并且能够拾取所述电磁场以使感应电流流过所述电阻器，所述室是透明的，并且所述第一感应装置至少包括一个第一线圈，其至少一个线圈包含至少2mm间隔的绕组，该间隔被配置为允许用于测量变形的光学装置为目标。

8. 发明申请

US20130098176A1 Flat Laminate, Symmetrical Test Structures and Method of Use To Gauge White Bump Sensitivity 有权
标题翻译：扁平层压板，对称测试结构和使用方法来测量白色凹凸感光度
公开(公告)号：US20130098176A1
公开(公告)日：2013-04-25
申请号：US13277246
申请日：2011-10-20
申请人： William E. Bernier , Timothy H. Daubenspeck , Virendra R. Jadhav , Valerie A. Oberson , David L. Questad
发明人： William E. Bernier , Timothy H. Daubenspeck , Virendra R. Jadhav , Valerie A. Oberson , David L. Questad
IPC分类号： G01N33/00
CPC分类号： H01L22/30 , B05D1/36 , G01N3/60 , G01N19/04 , G01N25/16 , G01N2203/0296 , G01N2203/0298 , H01L24/13 , H01L2224/131 , H01L2924/10253 , H01L2924/351 , H01L2924/014 , H01L2924/00
摘要： A symmetrical, flat laminate structure used to minimize variables in a test structure to experimentally gauge white bump sensitivity to CTE mismatch is disclosed. The test structure includes a flat laminate structure. The method of using the test structure includes isolating a cause of a multivariable chip join problem that is adversely impacted by warpage and quantifying a contribution of the warpage, itself, in a formation of the multivariable chip join problem.
摘要翻译：公开了一种对称的平板层压结构，用于使测试结构中的变量最小化，以实验测量白色凸起对CTE不匹配的敏感性。测试结构包括平板层压结构。使用测试结构的方法包括隔离多变量芯片连接问题的原因，其由翘曲不利地影响并量化翘曲的贡献本身在多变量芯片连接问题的形成中。

9. 发明授权

US07978342B2 Method and apparatus for measuring expansion of materials 有权
标题翻译：用于测量材料膨胀的方法和装置
公开(公告)号：US07978342B2
公开(公告)日：2011-07-12
申请号：US12015709
申请日：2008-01-17
申请人： Hasan Fakhruddin
发明人： Hasan Fakhruddin
IPC分类号： G01B9/02 , G01N25/16
CPC分类号： G01B11/16 , G01N25/16
摘要： Methods for measuring expansion of a test sample. One method includes establishing a diffraction slit between two blades, with the position of at least one of the blades being dependent upon the length of a test sample of material. As the temperature of the sample changes, the width of the slit changes. Light is projected through the slit onto a target and an diffraction pattern is measured. Changes in the light diffraction pattern correspond to the thermal expansion of the sample. Another method includes establishing a diffraction slit between two blades, with the position of at least one of the blades being dependent upon a length along a test sample of material. As a load is applied to the test sample, the width of the slit changes. Changes in the light diffraction pattern correspond to Young's Modulus for the sample.
摘要翻译：用于测量试样膨胀的方法。一种方法包括在两个叶片之间建立衍射狭缝，其中至少一个叶片的位置取决于材料的测试样品的长度。随着样品的温度变化，狭缝的宽度变化。光通过狭缝投射到靶上，并测量衍射图。光衍射图案的变化对应于样品的热膨胀。另一种方法包括在两个叶片之间建立衍射狭缝，其中至少一个叶片的位置取决于材料的测试样品的长度。当测试样品施加负载时，狭缝的宽度变化。光衍射图中的变化对应于样品的杨氏模量。

10. 发明申请

US20100208242A1 METHOD AND APPARATUS FOR DETERMINING THE THERMAL EXPANSION OF A MATERIAL 失效
标题翻译：用于确定材料的热膨胀的方法和装置
公开(公告)号：US20100208242A1
公开(公告)日：2010-08-19
申请号：US12704879
申请日：2010-02-12
申请人： Oscar Eduardo MARTÍNEZ , Esteban Alejo DOMENE , Nélida MINGOLO , Francisco BALZAROTTI , Andrea Veronica BRAGAS
发明人： Oscar Eduardo MARTÍNEZ , Esteban Alejo DOMENE , Nélida MINGOLO , Francisco BALZAROTTI , Andrea Veronica BRAGAS
IPC分类号： G01N25/16 , G01N21/25
CPC分类号： G01N21/171 , G01B21/085 , G01N21/8422 , G01N25/16
摘要： A focus error signal resulting from the photothermically-induced expansion is measured in a sample of material under analysis. A laser is disposed as a periodically modulated heating source which is directed to the sample and a device for focus error measuring which is directed to de surface being heated. A device measuring focus error generates a signal representative of the displacement of the surface of material in perpendicular direction due to the expansion produced by the periodic heating, which is filtered, either analogically or digitally, to discriminate the displacement component at the frequency in which it was modulated or at any other related frequency, such any harmonic or a sum with any other modulation. The focus error signal, appropriately calibrated, gives a precise and sensitive measure of the magnitude the expansion. Said magnitude and its dependence with the modulation frequency allows the determination of physical properties such as the thermal expansion or thermal diffusivity coefficient, the thickness of a coating film or the absorption coefficient of the light from the heating beam. By varying the wave length of the directed radiation it is possible to determine the absorption spectrum of the sample even for very small sized particles in which the fraction of absorbed energy is very little.
摘要翻译：在分析的材料样品中测量由光热引起的膨胀产生的聚焦误差信号。将激光器设置为周期性调制的加热源，其被引导到样品，并且用于聚焦误差测量的装置被引导到被加热的表面。测量聚焦误差的装置会产生一个信号，代表材料表面在垂直方向上的位移，这是由于周期性加热产生的膨胀产生的，这种膨胀是以模拟或数字方式被过滤的，以区别其中的位移分量被调制或在任何其他相关频率，任何谐波或任何其他调制的和。聚焦误差信号被适当地校准，给出了对扩展幅度的精确和敏感的测量。所述幅度及其与调制频率的相关性允许确定诸如热膨胀或热扩散系数的物理性质，涂膜的厚度或来自加热束的光的吸收系数。通过改变定向辐射的波长，即使对于其中吸收能量的分数非常小的非常小的粒子也可以确定样品的吸收光谱。

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