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    • 5. 发明授权
    • Electronic control circuit comprising power transistors and method for monitoring the service life of the power transistors
    • 包括功率晶体管的电子控制电路和用于监视功率晶体管的使用寿命的方法
    • US09529038B2
    • 2016-12-27
    • US14352582
    • 2011-11-21
    • Helmut LippGünter HaasMartin Bürkert
    • Helmut LippGünter HaasMartin Bürkert
    • G01R31/26G01R31/28G01R31/42H02M7/5387
    • G01R31/282G01R31/2642G01R31/42H02M7/53875
    • An electronic control circuit for an electronically commutated motor (ECM) is disclosed. A plurality of power transistors controls the ECM, and a reference transistor is formed together with the power transistors on a common support. A control unit is configured to, in a test mode: apply a test current to the reference transistor and one of the power transistors respectively; measure a saturation voltage of the reference transistor and one of the power transistors; evaluate a saturation voltage difference between the measured saturation voltages of the reference transistor and the respective power transistor; evaluate a rate of change of saturation voltage differences between a first iteration of the test mode and a second iteration of the test mode; and determine an expected remaining service life of the power transistors based on the temperature of the support during the test mode and the rate of change of the saturation voltage differences.
    • 公开了一种用于电子换向电机(ECM)的电子控制电路。 多个功率晶体管控制ECM,并且在公共支撑上与功率晶体管一起形成参考晶体管。 控制单元被配置为在测试模式下:分别将测试电流施加到参考晶体管和功率晶体管之一; 测量参考晶体管和功率晶体管之一的饱和电压; 评估参考晶体管和相应功率晶体管的测量饱和电压之间的饱和电压差; 评估测试模式的第一次迭代与测试模式的第二次迭代之间的饱和电压差的变化率; 并且基于测试模式期间的支撑件的温度和饱和电压差的变化率来确定功率晶体管的期望的剩余使用寿命。
    • 7. 发明授权
    • Implantable medical device and method for monitoring the insulation of an electrode line of such a medical device
    • 用于监测这种医疗装置的电极线的绝缘的植入式医疗装置和方法
    • US09459305B2
    • 2016-10-04
    • US14463515
    • 2014-08-19
    • BIOTRONIK SE & CO. KG
    • Thomas Doerr
    • G01R31/02A61N1/37G01R31/28A61N1/375A61N1/372A61N1/08
    • G01R31/025A61N1/37A61N1/37258A61N1/3752A61N2001/083G01R31/282
    • An implantable medical device including at least one electrode line having an electrode pole, an electrode feed line, a counter electrode to the at least one electrode line, and an insulation sleeve. The insulation sleeve surrounds the electrode feed line and provides insulation between the electrode feed line and an electrolyte formed by bodily fluid. The electrode feed line and the electrode pole(s) include different materials, wherein the materials are different based on electrochemical series. The implantable medical device includes an insulation test unit having a DC voltage detector arranged between the electrode pole and the counter electrode, in order to detect an electrochemical voltage produced in the event of an insulation fault of the insulation sleeve due to defective contact between the electrolyte and the electrode feed line.
    • 一种可植入医疗装置,其包括至少一个电极线,其具有电极极,电极馈电线,至少一个电极线的对电极和绝缘套筒。 绝缘套管围绕电极馈电线,并提供电极馈电线与由体液形成的电解质之间的绝缘。 电极馈电线和电极极包括不同的材料,其中材料基于电化学系列而不同。 可植入医疗装置包括绝缘测试单元,其具有布置在电极和对电极之间的直流电压检测器,以便检测在绝缘套管的绝缘故障的情况下由于电解质之间的接触不良而产生的电化学电压 和电极馈电线。
    • 8. 发明授权
    • Potential arc fault detection and suppression
    • 电弧故障检测和抑制
    • US09190836B2
    • 2015-11-17
    • US14512417
    • 2014-10-11
    • Paul Wilkinson Dent
    • Paul Wilkinson Dent
    • H02H3/00H02H7/26G01R31/02G01R31/40H02S50/10G01R31/28H02H1/00H02H7/20
    • H02H7/268G01R15/207G01R31/024G01R31/282G01R31/42H02H1/0015H02H7/205H02S50/10Y02B10/14Y04S10/20
    • A wiring fault detector adapted specifically to address the requirement for arc fault protection specified in National Electrical Code (2011) article 690.11 comprises running at least one additional wire in parallel with the power conductors to be protected, thereby allowing evaluation at the location of a fault detector of an electrical parameter indicative of conductor integrity along its whole length.In one implementation, the additional conductor allows the voltage drop across the power conductor to be measured and verified to be small and/or noise-free. In another implementation, the additional conductor is a redundant power conductor connected in parallel with the main power conductor, allowing verification that the current flow in both the main and the additional power conductors is partitioned in an expected ratio indicative of wiring integrity.
    • 专门用于解决国家电气规范(2011)第690.11条规定的电弧故障保护要求的接线故障检测器包括与要保护的电源导体并联运行至少一根附加电线,从而允许在故障位置进行评估 检测器沿其整个长度指示导体完整性的电参数。 在一个实施方案中,附加导体允许测量和验证电力导体两端的电压降是小的和/或无噪声的。 在另一实施方案中,附加导体是与主电源导体并联连接的冗余电力导体,允许验证主电源线和附加电源线中的电流流以预期的比率分配,表示布线完整性。
    • 10. 发明申请
    • METHOD AND APPARATUS FOR DE-EMBEDDING
    • 用于去嵌入的方法和装置
    • US20150153404A1
    • 2015-06-04
    • US14604317
    • 2015-01-23
    • TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
    • Hsiu-Ying Cho
    • G01R31/28G01R31/26
    • G01R31/282G01R31/26H01L22/34H01L2924/0002Y10T29/49004H01L2924/00
    • De-embedding apparatus and methods of de-embedding are disclosed. A de-embedding apparatus includes a test structure including a device-under-test (DUT) embedded in the test structure, and a plurality of dummy test structures including an open dummy structure, a distributed open dummy structure, and a short dummy structure. The distributed open dummy structure may include a first signal transmission line coupled to a left signal test pad and a second signal transmission line coupled to a right signal test pad, the first and second signal transmission lines having a smaller total length than a total length of signal transmission lines of the open dummy structure, and intrinsic transmission characteristics of the DUT can be derived from transmission parameters of the dummy test structures and the test structure
    • 公开了去嵌入装置和解嵌入方法。 解嵌装置包括:测试结构,包括嵌入在测试结构中的被测器件(DUT);以及包括开放虚拟结构,分布式开放虚拟结构和短虚拟结构的多个虚拟测试结构。 分布式裸虚拟结构可以包括耦合到左信号测试焊盘的第一信号传输线和耦合到右信号测试焊盘的第二信号传输线,第一和第二信号传输线的总长度小于 开放虚拟结构的信号传输线和DUT的固有传输特性可以从虚拟测试结构和测试结构的传输参数导出