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1. 发明申请

US20180330024A1 RISK EVALUATION 审中-公开
公开(公告)号：US20180330024A1
公开(公告)日：2018-11-15
申请号：US16042952
申请日：2018-07-23
申请人： Assurant Design Automation LLC
发明人： M. David McFarland
IPC分类号： G06F17/50 , G06F17/18
CPC分类号： G06F9/542 , G06F9/46 , G06F17/18 , G06F17/505 , G06F2217/10
摘要： For risk evaluation, a method encodes event data as a linear array that includes a plurality of logic states. The method estimates a success probability for each logic state and identifies path groups of the plurality of logic states. The logic states of each path group must all be healthy for each logic state to contribute to system success. The method further identifies each path combination of path groups and path nodes that result in system success. In addition, the method calculates a system success probability as a sum of success probabilities for each path combination. The success rate for each path combination is calculated as a product of the path group success probabilities for the path combination.

2. 发明申请

US20180328983A1 SYSTEM AND METHODS FOR ANALYZING AND ESTIMATING SUSCEPTIBILITY OF CIRCUITS TO RADIATION-INDUCED SINGLE-EVENT-EFFECTS 审中-公开
公开(公告)号：US20180328983A1
公开(公告)日：2018-11-15
申请号：US16041165
申请日：2018-07-20
申请人： LUCID CIRCUIT, INC.
发明人： Michel D Sika
IPC分类号： G01R31/28 , G06F17/50
CPC分类号： G01R31/2855 , G01R31/2849 , G06F17/5036 , G06F17/5068 , G06F2217/10
摘要： Systems and methods for semiconductor design evaluation. IC layout information of a circuit design is received, and the circuit design is decomposed into smaller circuit pieces. Each circuit piece has IC layout information and a netlist. For each circuit piece, a set of strike models is selected based on the layout information and the net-list of the circuit piece and received radiation environment information. Each strike model has circuit components with voltage values corresponding to a respective particle strike. For each selected strike model of a circuit piece: a radiation susceptibility metric is determined by comparing functional results of simulation of the of the strike model with functional results of simulation of the circuit piece. For each circuit piece, a radiation susceptibility metric is determined based on the radiation susceptibility metrics generated for each selected strike model of the circuit piece.

3. 发明申请

US20180260503A1 OPTIMIZATION OF PROTOTYPE AND MACHINE DESIGN WITHIN A 3D FLUID MODELING ENVIRONMENT 审中-公开
公开(公告)号：US20180260503A1
公开(公告)日：2018-09-13
申请号：US15630941
申请日：2017-06-22
申请人： General Electric Company
发明人： Zain S. Dweik , Vijay Sethuraman , Berkay Elbir
IPC分类号： G06F17/50 , G06T17/05 , G06N3/04 , G06N7/02
CPC分类号： G06F17/5009 , G06F3/04815 , G06F2217/10 , G06F2217/16 , G06N3/0427 , G06N3/0436 , G06N3/0454 , G06N5/003 , G06N7/005 , G06N7/023 , G06N20/00 , G06T17/05 , G06T2210/21
摘要： Techniques that facilitate optimization of prototype and machine design within a three-dimensional fluid modeling environment are presented. For example, a system includes a modeling component, a machine learning component, and a graphical user interface component. The modeling component generates three-dimensional model of a mechanical device based on a library of stored data elements. The machine learning component predicts one or more characteristics of the mechanical device based on a first machine learning process associated with the three-dimensional model. The machine learning component also generates physics modeling data of the mechanical device based on the one or more characteristics of the mechanical device. The graphical user interface component provides, via a graphical user interface, a three-dimensional design environment associated with the three-dimensional model and a probabilistic simulation environment associated with optimization of the three-dimensional model.

4. 发明申请

US20180259569A1 METHOD OF CHARACTERIZING AND MODELING LEAKAGE STATISTICS AND THRESHOLD VOLTAGE FOR ENSEMBLE DEVICES 审中-公开
公开(公告)号：US20180259569A1
公开(公告)日：2018-09-13
申请号：US15976349
申请日：2018-05-10
申请人： INTERNATIONAL BUSINESS MACHINES CORPORATION
发明人： Ning LU
IPC分类号： G01R31/26 , G06F17/50 , G01R31/02
CPC分类号： G01R31/2621 , G01R31/025 , G06F17/5036 , G06F17/5063 , G06F2217/10
摘要： An approach for determining leakage current and threshold voltage for ensemble semiconductor devices, implemented in a computer infrastructure having computer executable code tangibly embodied on a computer readable storage medium having program instructions, are operable to: receive a number m of individual devices within an ensemble device; identify a sub-threshold slope; determine an uplift factor; separate random variation in logarithm of a leakage current into a correlated random component and an uncorrelated random component; determine a first standard deviation of correlated random component for the ensemble device; determine a second standard deviation of the uncorrelated random component for the ensemble device; generate a statistical model for electrical features of the ensemble device, based on the number m of individual devices, the sub-threshold slope, the uplift factor, the first and second standard deviation, and statistical random variables; and determine the electrical features of the ensemble device based on the statistical model.

5. 发明申请

US20180247721A1 PLANT OPERATION ASSISTANCE SYSTEM AND PLANT OPERATION ASSISTANCE METHOD 审中-公开
公开(公告)号：US20180247721A1
公开(公告)日：2018-08-30
申请号：US15553001
申请日：2016-01-20
申请人： MITSUBISHI HEAVY INDUSTRIES, LTD.
发明人： Hitoi Ono , Satoshi Hanada , Eisuke Noda
IPC分类号： G21D3/00 , G05B17/02 , G21D3/04 , G21C7/36 , G21C17/00
CPC分类号： G21D3/001 , G05B17/02 , G05B23/0243 , G06F2217/10 , G21C7/36 , G21C17/00 , G21D3/002 , G21D3/005 , G21D3/007 , G21D3/04
摘要： A plant operation assistance system includes: a data obtaining unit-configured to obtain monitoring data indicating state quantity of a plant, the state quantity being detected by a sensor; an identifying unit configured to identify, based on the state quantity, a probability distribution of the monitoring data; a model generation unit configured to generate, based on a plant parameter composed from a database including design information of the plant, a stochastic model of the plant; a data processing unit configured to assign the probability distribution to the monitoring data obtained by the data obtaining unit; and a prediction unit configured to input the monitoring data assigned with the probability distribution, into the stochastic model, and predicts a state of the plant.

6. 发明授权

US10037402B1 Parameter collapsing and corner reduction in an integrated circuit 有权
公开(公告)号：US10037402B1
公开(公告)日：2018-07-31
申请号：US15704429
申请日：2017-09-14
申请人： INTERNATIONAL BUSINESS MACHINES CORPORATION
发明人： Eric Foreman , Jeffrey Hemmett
IPC分类号： G06F17/50
CPC分类号： G06F17/5081 , G06F17/5031 , G06F17/504 , G06F2217/10 , G06F2217/62 , G06F2217/84
摘要： Reducing the runtime overhead needed for testing of an integrated circuit design. A determination may be made of parameters that clock routing and data routing in an integrated circuit are dependent upon. A determination is made of whether the parameters are suitable for compaction, such as by determining whether the parameters are utilized in only one of clock routing or data routing. The parameters suitable for compaction are defined or redefined into at least one proxy compacted parameter. A timing analysis for the integrated circuit is performed using the proxy compacted parameter instead of performing the timing analysis using the parameters suitable for compaction.

7. 发明授权

US09977845B2 Method of performing static timing analysis for an integrated circuit 有权
公开(公告)号：US09977845B2
公开(公告)日：2018-05-22
申请号：US14982921
申请日：2015-12-29
申请人： SAMSUNG ELECTRONICS CO., LTD
发明人： Moon-Su Kim
IPC分类号： G06F17/50
CPC分类号： G06F17/50 , G06F17/5022 , G06F17/5031 , G06F2217/10 , G06F2217/84
摘要： A method of performing a static timing analysis on an integrated circuit includes loading a library that includes local random variation information of the integrated circuit and global variation information of the integrated circuit that is obtained based on a set of a plurality of global variation parameters of the integrated circuit, calculating delays of timing arcs included in the integrated circuit based on the library, and determining whether at least one timing path of a plurality of timing paths included in the integrated circuit violates a timing constraint based on the delays of the timing arcs in the at least one timing path, the local random variation information of the integrated circuit and the global variation information of the integrated circuit.

8. 发明申请

US20180089577A1 FORECASTING SYSTEMS 审中-公开
公开(公告)号：US20180089577A1
公开(公告)日：2018-03-29
申请号：US15726258
申请日：2017-10-05
申请人： iRuiz Technologies Ltd.
发明人： Ignacio Ruiz
IPC分类号： G06N7/02
CPC分类号： G06N7/02 , G06F2217/10 , G06Q10/04
摘要： A computer-implemented method of determining an approximated value of a parameter in a first domain is described. The parameter is dependent on one or more variables which vary in a second domain, and the parameter is determined by a function which relates sets of values of the one or more variables in the second domain to corresponding values in the first domain. The method is implemented on a computer system including a processor, and the method comprises: determining a plurality of anchor points in the second domain, wherein each anchor point comprises a set of values of the one or more variables in the second domain; evaluating, at each anchor point, the function to generate corresponding values of the parameter in the first domain; generating an approximation function to the function by fitting a series of orthogonal functions or an approximation to a series of orthogonal functions to the corresponding values of the parameter in the first domain; and using the approximation function to generate the approximated value of the parameter in the first domain.

9. 发明授权

US09928320B2 Techniques for estimating compound probability distribution by simulating large empirical samples with scalable parallel and distributed processing 有权
公开(公告)号：US09928320B2
公开(公告)日：2018-03-27
申请号：US15485577
申请日：2017-04-12
申请人： SAS Institute Inc.
发明人： Mahesh V. Joshi , Richard Potter , Jan Chvosta , Mark Roland Little
IPC分类号： G06G7/48 , G06F17/50 , G06F17/18
CPC分类号： G06F17/18 , G06F17/5009 , G06F2217/10 , G06Q40/08
摘要： Techniques for estimated compound probability distribution are described herein. Embodiments may include receiving, at a master node of a distributed system, a compound model specification comprising frequency models, severity models, and one or more adjustment functions, wherein at least one model of the frequency models and the severity models depend on one or more regressor and distributing the compound model specification to worker nodes of the distributed system, each of the worker nodes to at least generate a portion of samples for use in predicting compound distribution model estimates. Embodiments may also include predicting the compound distribution model estimates based on the sample portions of aggregate values and adjusted aggregate values.

10. 发明授权

US09922146B2 Tool apparatus, method and computer program for designing an integrated circuit 有权
公开(公告)号：US09922146B2
公开(公告)日：2018-03-20
申请号：US14778107
申请日：2013-03-21
申请人： Pascal Caunegre
发明人： Pascal Caunegre
IPC分类号： G06F17/50
CPC分类号： G06F17/5009 , G06F17/5036 , G06F17/5072 , G06F17/5081 , G06F2217/10
摘要： An integrated circuit design tool apparatus includes a processing resource configured to support a circuit simulator, a circuit sensitivity optimizer and a circuit sensitivity calculator. The circuit sensitivity optimizer is adapted to communicate to the circuit simulator a first dynamic list of selected devices of the circuit; and a second dynamic list of selected process parameters associated with the selected devices of the first dynamic list. The circuit simulator is configured to communicate to the circuit sensitivity calculator, a performance metrics of the circuit in response thereto. The circuit sensitivity calculator is configured to determine one sensitivity coefficient for each device of the first dynamic list in response thereto. The circuit sensitivity calculator is further configured to determine and communicate to the circuit sensitivity optimizer a variance of the performance metrics and also adapted to gradually determine whether or not to further communicate with the circuit simulator.

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