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    • 10. 发明授权
    • Integrated circuit with embedded RFID
    • 集成电路与嵌入式RFID
    • US08322626B2
    • 2012-12-04
    • US13078919
    • 2011-04-01
    • Hee-Bok KangJin-Hong Ahn
    • Hee-Bok KangJin-Hong Ahn
    • G06K19/06
    • H01L23/544G06K19/07749G06K19/07775G06K19/07779H01L2223/54433H01L2223/54446H01L2924/0002H01L2924/00
    • An integrated circuit (IC) die includes a high capacitance solid state circuit region configured to perform predetermined operations and an RFID block configured for wireless communication with an external source. The RFID block is configured to record results from a plurality of stages of a manufacturing process. The RFID block is further configured to generate an internal BIST command in response to an external command wirelessly received by the RFID. The integrated circuit die also includes a built-in self-test (BIST) block coupled to carry out testing of the high capacitance solid state circuit region in response to the internal BIST command. The RFID block is configured to be capable of storing store information relating to the testing. The RFID block is further configured to enable wireless retrieval of the test results from the testing of the high capacitance solid state circuit region.
    • 集成电路(IC)管芯包括被配置为执行预定操作的高电容固态电路区域和被配置为与外部源无线通信的RFID块。 RFID块被配置为记录来自制造过程的多个阶段的结果。 RFID块还被配置为响应于RFID无线接收的外部命令而生成内部BIST命令。 集成电路管芯还包括内部自检(BIST)块,其耦合以响应于内部BIST命令执行高电容固态电路区域的测试。 RFID块被配置为能够存储与测试相关的存储信息。 RFID块还被配置为使得能够从测试高电容固态电路区域的无线检索测试结果。