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1. 发明授权

US11493442B2 Apparatus and method for measuring surface of electronic device 有权
公开(公告)号：US11493442B2
公开(公告)日：2022-11-08
申请号：US17251037
申请日：2019-05-29
申请人： SAMSUNG ELECTRONICS CO., LTD. , 3D INDUSTRIAL IMAGING CO., LTD.
发明人： Jaeseon Kim , Kyunyeon Kim , Hyungbum Kim , Jongsu Lee , Youngjin Yi , Donghyeon Hwang
IPC分类号： G01N21/57 , G01N21/27 , G01N21/25 , G01N21/95 , G01J3/50
摘要： Various embodiments of the present invention relate to an apparatus and method for measuring the surface of an electronic device, the apparatus comprising: a seating portion on which the electronic device is seated; a first light source for irradiating first light on the surface of the electronic device; a first camera for photographing the surface using the first light; a second light source for irradiating second light on the surface of the electronic device; a second camera for photographing the surface using the second light; and an analyzer electronically connected to the first light source, the first camera, the second light source, and the second camera, wherein the analyzer is setup to analyze the color of the surface acquired using the first light source and the first camera; and the gloss of the surface acquired using the second light source and the second camera, so as to analyze the color and gloss of the surface of the electronic device using quantified and digitized data, thereby enabling quality inspection of the surface of the electronic device without deviation. Various other embodiments are possible.

2. 发明授权

US11189407B2 Grain-oriented electrical steel sheet 有权
公开(公告)号：US11189407B2
公开(公告)日：2021-11-30
申请号：US16628809
申请日：2018-07-13
申请人： NIPPON STEEL CORPORATION
发明人： Shinsuke Takatani , Yoshiyuki Ushigami , Hiroyasu Fujii , Shuichi Nakamura , Takeshi Imai
IPC分类号： H01F1/147 , G01N21/57 , C22C38/34 , C22C38/04 , C22C38/00 , C22C38/02 , C22C38/06 , C22C38/60
摘要： A grain-oriented electrical steel sheet includes: a steel sheet; and an amorphous oxide layer that is formed on the steel sheet, in which a glossiness of a surface is 150% or higher.

3. 发明授权

US11060966B2 Docking station for a surface measuring apparatus 有权
公开(公告)号：US11060966B2
公开(公告)日：2021-07-13
申请号：US16626444
申请日：2018-06-15
申请人： BYK-GARDNER GMBH
发明人： Peter Schwarz
IPC分类号： G01N21/25 , G01B11/25 , G01N21/27 , G01N21/57
摘要： The invention relates to a docking station 2 for a surface measuring apparatus 1, more particularly an optical surface measuring apparatus. The docking station has a reference measuring surface 4 which can be brought into a covered state in which it is covered from the environment of the docking station 2 and an uncovered state in which it is not covered from the environment of the docking station 2. When the surface measuring apparatus 1 is in the docking station 2 and the reference measuring surface 4 is in the uncovered state, the surface measuring apparatus 1 can perform a reference measurement of the reference measuring surface 4 and can calibrate the surface measuring apparatus 1 using the reference measurement. In contrast, when the reference measuring surface 4 is in the covered state, it is not exposed to the environment of the docking station 2 and is therefore protected from, for example, dust, light, moisture or mechanical impacts. The covered and uncovered states of the reference measuring surface 4 are preferably reached through a movement of the reference measuring surface 4 itself or through a movement of a cover for the reference measuring surface 4.

4. 发明授权

US11060918B2 Evaluator, measurement apparatus, evaluating method, and non-transitory recording medium 有权
公开(公告)号：US11060918B2
公开(公告)日：2021-07-13
申请号：US16502290
申请日：2019-07-03
申请人： Takuroh Sone , Takafumi Hiroi , Takashi Soma , Shuhei Watanabe , Hideyuki Kihara
发明人： Takuroh Sone , Takafumi Hiroi , Takashi Soma , Shuhei Watanabe , Hideyuki Kihara
IPC分类号： G01J3/50 , G06T7/136 , G06T7/11 , G01J3/02 , G01J3/42 , G01N21/57 , G06T7/00
摘要： An evaluating method includes obtaining, by an imaging device, a two-dimensional reflected light amount distribution of a surface of a target; classifying, by one or more processors, the surface into a plurality of areas on the basis of chromaticity information of the two-dimensional reflected light amount distribution; and evaluating, by one or more processors, appearance characteristics of the target on the basis of respective sets of chromaticity information of the areas.

5. 发明申请

US20210055216A1 Gloss Value Calculating Device, Gloss Value Measuring Device, Color Tone Quantifying Device For Glossy Color, And Gloss Value Calculating Method 有权
公开(公告)号：US20210055216A1
公开(公告)日：2021-02-25
申请号：US16977317
申请日：2019-03-15
申请人： Konica Minolta, Inc.
发明人： Takumi ISHIWATA , Kishio TAMURA
IPC分类号： G01N21/57 , G01N21/47
摘要： The objective of the present invention is to provide a device for calculating a gloss value using a gloss value calculating method having an enhanced correlation with an impression of gloss sensed visually by a person. The present invention for achieving this objective relates to a gloss value calculating device. The gloss value calculating device comprises: a peak calculating unit which uses distribution information of brightness or reflection intensity with respect to a light reception angle obtained by measuring reflected light resulting from the reflection of measuring light radiated at an object, to obtain the peak height and spread of the brightness or the reflection intensity in the distribution information; and a gloss value calculating unit which calculates a gloss value represented by a ratio of the peak height to the peak spread.

6. 发明授权

US10697887B2 Optical characteristic measuring apparatus 有权
公开(公告)号：US10697887B2
公开(公告)日：2020-06-30
申请号：US15209072
申请日：2016-07-13
申请人： CANON KABUSHIKI KAISHA
发明人： Yusuke Kasai , Hiroshi Kawanago , Takashi Seki
IPC分类号： G01N21/27 , G01N21/57 , G01N21/84 , G01N21/47 , G01N21/55
摘要： A measuring apparatus that measures an optical characteristic of a surface in accordance with a standard selected from a plurality of standards is provided. The apparatus includes an illumination device configured to illuminate the surface with light from a light source, an imaging device configured to image the light source with reflected light from the surface illuminated by the illumination device, and a processor configured to process image data having number of pixels obtained by reducing number of pixels of the imaging device by a reduction rate to obtain the optical characteristic of the surface. The processor is configured to determine the reduction rate based on the selected standard.

7. 发明授权

US10593031B2 Texture evaluation apparatus, texture evaluation method, and computer-readable recording medium 有权
公开(公告)号：US10593031B2
公开(公告)日：2020-03-17
申请号：US15459178
申请日：2017-03-15
申请人： Ricoh Company, Ltd.
发明人： Shuhei Watanabe , Takuroh Sone , Hideyuki Kihara , Takashi Soma , Akihiro Iwamatsu , Naoki Nakamura , Takayuki Gotoh
IPC分类号： G06T7/00 , G01B11/30 , G01N21/57 , H04N7/18 , H04N9/31
摘要： A texture evaluation apparatus includes a projector, an imager, and an evaluator. The projector is configured to project a two-dimensional pattern having an edge element onto an object. The imager is configured to capture an image of a surface of the object. The evaluator is configured to calculate an amount of shape change of a virtual image of the two-dimensional pattern in the image, and evaluate texture of the object based on the amount of shape change and sensory evaluation information obtained in advance.

8. 发明申请

US20200018650A1 EVALUATOR, MEASUREMENT APPARATUS, EVALUATING METHOD, AND NON-TRANSITORY RECORDING MEDIUM 审中-公开
公开(公告)号：US20200018650A1
公开(公告)日：2020-01-16
申请号：US16502290
申请日：2019-07-03
申请人： Takuroh Sone , Takafumi Hiroi , Takashi Soma , Shuhei Watanabe , Hideyuki Kihara
发明人： Takuroh Sone , Takafumi Hiroi , Takashi Soma , Shuhei Watanabe , Hideyuki Kihara
IPC分类号： G01J3/50 , G01N21/57 , G01J3/02 , G01J3/42 , G06T7/00 , G06T7/11 , G06T7/136
摘要： An evaluating method includes obtaining, by an imaging device, a two-dimensional reflected light amount distribution of a surface of a target; classifying, by one or more processors, the surface into a plurality of areas on the basis of chromaticity information of the two-dimensional reflected light amount distribution; and evaluating, by one or more processors, appearance characteristics of the target on the basis of respective sets of chromaticity information of the areas.

9. 发明申请

US20190331530A1 COLOR MEASURING APPARATUS 审中-公开
公开(公告)号：US20190331530A1
公开(公告)日：2019-10-31
申请号：US16506447
申请日：2019-07-09
申请人： X-RITE SWITZERLAND GMBH
发明人： Beat Frick
IPC分类号： G01J3/50 , G01J3/52 , G01J3/10 , G01N21/57 , G01J3/02
摘要： A color measuring apparatus includes a measurement assembly which includes at least one illumination assembly for applying substantially parallel illumination light to a measurement spot of a measurement object and a pick-up assembly for capturing the measurement light radiated back from the measurement spot in an observation direction and for converting the same into corresponding electrical signals. The illumination assembly includes at least two illumination subassemblies which illuminate the measurement spot from different illumination sub-directions near a first preset nominal illumination direction, each with preferably parallel illumination light. By the illumination from different illumination sub-directions slightly deviating from the nominal illumination direction, angular errors of the illumination assembly can be compensated for in a simple manner.

10. 发明申请

US20190285540A1 Reflection Characteristic Measuring Device 审中-公开
公开(公告)号：US20190285540A1
公开(公告)日：2019-09-19
申请号：US16301966
申请日：2017-05-24
申请人： KONICA MINOLTA, INC.
发明人： Toshio KAWANO , Takashi KAWASAKI
IPC分类号： G01N21/25 , G01N21/57 , G01N21/27
摘要： The reflection characteristic measuring device according to the present invention is a device that includes a diffuse reflecting surface and measures a plurality of mutually different types of reflection characteristics by using a plurality of optical systems having mutually different geometries, which corrects the reflection characteristics to be measured by an error generated when light emitted from an object of measurement is reflected from the diffuse reflecting surface and illuminates the object of measurement. The reflection characteristic measuring device according to the present invention is therefore capable of reducing errors resulting from recursive diffused illumination.

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