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1. 发明授权

US11543368B2 X-ray based evaluation of a status of a structure of a substrate 有权
公开(公告)号：US11543368B2
公开(公告)日：2023-01-03
申请号：US17153765
申请日：2021-01-20
申请人： APPLIED MATERIALS ISRAEL LTD.
发明人： Dror Shemesh
IPC分类号： G01N23/2252 , G01N23/2206
摘要： A method for x-ray based evaluation of a status of a structure of a substrate, the method may include acquiring an electron image of a region of the substrate, the region comprises the structure; acquiring an x-ray image of the structure; and evaluating the status of the structure, wherein the evaluating is based at least on a number of x-ray photons that were emitted from the structure.

2. 发明申请

US20220381712A1 X-RAY EXAMINATION DEVICE 有权
公开(公告)号：US20220381712A1
公开(公告)日：2022-12-01
申请号：US17804048
申请日：2022-05-25
申请人： Anton Paar GmbH
发明人： Josef Gautsch , Helmut Gartler
IPC分类号： G01N23/2206 , G01N23/20016
摘要： A device for examining a sample by means of X-radiation is provided, the device comprising: a radiation generation system for generating primary radiation; a first goniometer arm on which the radiation generation system is mounted and which is pivotable about a goniometer axis; a detection system configured to detect secondary radiation emanating from the sample; a second goniometer arm on which the detection system is mounted and which is pivotable about the goniometer axis; an evacuable sample chamber within which the sample is arrangeable in a sample region encompassing a portion of the goniometer axis, the sample chamber being delimited by a sample chamber wall which has a transmission region which is transmissive to the primary radiation and is vacuum-tight, in order to allow the primary radiation to penetrate into the sample chamber and to impinge on the sample region at different angles of incidence; wherein the sample chamber has a first opening in a detection beam path, at which the sample chamber and the detection system are connectable in a vacuum-tight manner so that the detection beam path is evacuable.

3. 发明授权

US11378526B2 Faulted condition determination device and faulted condition determination method 有权
公开(公告)号：US11378526B2
公开(公告)日：2022-07-05
申请号：US16269936
申请日：2019-02-07
申请人： MITSUBISHI HEAVY INDUSTRIES, LTD. , National Institute for Materials Science
发明人： Nobuhiko Saito , Nobuyoshi Komai , Yuichi Hirakawa , Hiroaki Fukushima , Kota Sawada , Kazuhiro Kimura , Kaoru Sekido
IPC分类号： B23K31/12 , G01N23/04 , B23K103/04 , G01N23/2206 , G01N23/2251 , G01N23/2273 , G01N23/20
摘要： A faulted condition determination method is designed to detect a chromium content and a nickel content in a predetermined boundary region proximate to a boundary between a high-strength ferrite steel and a weld material in a welded joint in which the high-strength ferrite steel and another steel are welded together using the weld material containing nickel and to thereby determine the faulted condition of the predetermined boundary region based on the chromium content and the nickel content. Accordingly, it is possible to appropriately determine the faulted condition of welding of a replacement part in which a high-strength ferrite steel and another steel are welded together using a nickel-based weld material.

4. 发明授权

US11366073B2 Density analysis of geological sample 有权
公开(公告)号：US11366073B2
公开(公告)日：2022-06-21
申请号：US17264236
申请日：2019-07-18
申请人： OREXPLORE AB
发明人： Alexander Hansson , Mikael Bergqvist
IPC分类号： G01N23/00 , G01N23/223 , G01N9/36 , G01N23/2206
摘要： An apparatus (100) for analysing a sample (101) comprising a drill core sample or drill cuttings is provided. The apparatus comprises an X-ray geological structure data unit configured to scan the sample to obtain a data set indicating a volume of the sample, a fluorescence detector (109) configured to measure fluorescent radiation emanating from the sample (101) when irradiated by the X-ray beam, and a weighing unit (105) configured to weigh the sample. The apparatus further comprises a processing unit (104) configured to calculate a density of the sample (101) based on the data set obtained by the X-ray geological structure data unit, the fluorescent radiation measured by the fluorescence detectors, and the weight provided by the weighing unit.

5. 发明申请

US20210263006A1 CONTROLLED MANUFACTURE AND NANO-LEVEL EVALUATION OF KEROGEN-RICH RESERVOIR ROCK 有权
公开(公告)号：US20210263006A1
公开(公告)日：2021-08-26
申请号：US17180416
申请日：2021-02-19
申请人： Saudi Arabian Oil Company
发明人： Katherine Leigh Hull , Younane N. Abousleiman
IPC分类号： G01N33/24 , G01N23/04 , G01N23/2251 , G01N23/2206 , G01N3/02 , G01N3/08
摘要： Controlled manufacture and nano-level evaluation of kerogen-rich reservoir rock can be implemented as a method. A clay mineral found in kerogen-rich shale is selected. An organic component found in kerogen-rich shale is selected. Multiple concentrations of the clay mineral are selected. Multiple concentrations of the organic component are selected. Multiple kerogen-rich shale samples are fabricated. Each sample includes a first concentration of the multiple concentrations of the clay mineral and a second concentration of the multiple concentrations of the organic component. A microscale beam is formed of each fabricated sample. A maximum dimension of the microscale beam is at most 100 μm. A mechanical experiment is performed on the microscale beam of each fabricated sample. The mechanical experiment includes a tension test or a compression test. The mechanical experiment on the microscale beam of each fabricated sample is imaged using a scanning electron microscope or a transmission electron microscope. A material parameter of the microscale beam of each fabricated sample is determined based on results of the mechanical experiment and images obtained responsive to the imaging. Effects of the clay mineral on the kerogen-rich shale are determined based on the material parameter of the microscale beam of each fabricated sample.

6. 发明授权

US11047812B2 Macrotexture map visualizing texture heterogeneity in polycrystalline parts 有权
公开(公告)号：US11047812B2
公开(公告)日：2021-06-29
申请号：US16530997
申请日：2019-08-02
申请人： Advanced Manufacturing LLC
发明人： Dongsheng Li
IPC分类号： G01N23/20 , G06T11/00 , G01N23/203 , G06K9/62 , G01N23/2206 , G06T11/20
摘要： This invention provides a method, system, and computer program to visualize texture (crystal orientation distribution) heterogeneity in polycrystalline aggregate part in large length scale. This is a critical representation step for microstructure characterization, useful in effective behavior simulation, risk analysis and hotspot identification. In contrast to orientation image map where each color component represents a crystal orientation, each color in this macrotexture map represents a set of texture. Different color represent different texture and similar texture shall have similar color. This method will provide a critical tool in evaluating texture heterogeneity of components, leading to a first-hand understanding of property heterogeneity and anisotropy. For an experienced user, these maps serve the same purpose in identifying high risk locations in the investigated component as medical imaging maps do for diagnosis purpose. This method will also serve as a starting point in mesoscale simulation with meshing sensitivity based on the texture heterogeneity. It will provide a bridge between texture characterization and behavior simulation of component with texture heterogeneity. This method will also offer a linkage between crystal plasticity simulation in small length scale and finite element/difference simulation in large length scale.

7. 发明申请

US20210090855A1 CHARGED PARTICLE BEAM IRRADIATION APPARATUS AND CONTROL METHOD 有权
公开(公告)号：US20210090855A1
公开(公告)日：2021-03-25
申请号：US17027312
申请日：2020-09-21
申请人： HITACHI HIGH-TECH SCIENCE CORPORATION
发明人： Takuma ASO , Xin MAN , Makoto SATO , Tatsuya ASAHATA
IPC分类号： H01J37/26 , H01J37/28 , H01J37/244 , G01N23/2251 , G01N23/2258 , G01N23/2206
摘要： The charged particle beam irradiation apparatus includes: a focused ion beam column; an electron beam column; an electron detector; an image forming unit configured to form an observation image based on a signal output from the electron detector; and a control unit configured to repeatedly perform exposure control in which the focused ion beam column is controlled to expose a cross section of a multilayered sample toward a stacking direction with the focused ion beam, the control unit being configured to perform, every time exposure of an observation target layer at a cross section of the multilayered sample is detected in a process of repeatedly performing the exposure control, observation control in which the electron beam column is controlled to radiate the electron beam, and the image forming unit is controlled to form an observation image of the cross section of the multilayered sample.

8. 发明授权

US10914694B2 X-ray spectrometer 有权
公开(公告)号：US10914694B2
公开(公告)日：2021-02-09
申请号：US15865992
申请日：2018-01-09
申请人： Government of the United States of America, as represented by the Secretary of Commerce
发明人： Joel Ullom , Galen O'Neil , Luis Miaja Avila , Kevin Silverman , Daniel Swetz , Ralph Jimenez , William Bertrand Doriese , Gene Hilton , Carl Reintsema , Daniel Schmidt , Bradley K. Alpert , Jens Uhlig , Young Joe , Wilfred K. Fullagar , Villy Sundstrom , Ilari Maasilta , Joseph Fowler
IPC分类号： G01T1/36 , G01N23/223 , H05G2/00 , G01N23/207 , G01N23/2206
摘要： An x-ray spectrometer includes: an x-ray plasma source that produces first x-rays; an x-ray optic in optical communication with the x-ray plasma source and that: receives the first x-rays from the x-ray plasma source; focuses the first x-rays to produce second x-rays; and communicates the second x-rays to a sample that produces product x-rays in response to receipt of the second x-rays and second light; and a microcalorimeter array detector in optical communication with the sample and that receives the product x-rays from the sample.

9. 发明申请

US20210033548A1 METHOD OF EXAMINING A SAMPLE USING A CHARGED PARTICLE MICROSCOPE 有权
公开(公告)号：US20210033548A1
公开(公告)日：2021-02-04
申请号：US16941253
申请日：2020-07-28
申请人： FEI Company
发明人： Tomás Tuma , Jan Klusácek , Jiri Petrek
IPC分类号： G01N23/2206 , G01N23/2252 , G01N23/203
摘要： The invention relates to a method of examining a sample using a charged particle microscope, comprising the steps of providing a charged particle beam, as well as a sample; scanning said charged particle beam over said sample; and detecting, using a first detector, emissions of a first type from the sample in response to the beam scanned over the sample. Spectral information of detected emissions of the first type is used for assigning a plurality of mutually different phases to said sample. In a further step, a corresponding plurality of different color hues—with reference to an HSV color space—are associated to said plurality of mutually different phases. Using a second detector, emissions of a second type from the sample in response to the beam scanned over the sample are detected. Finally an image representation of said sample is provided.

10. 发明申请

US20180106736A1 X-RAY FLUORESCENCE SPECTROMETER 审中-公开
公开(公告)号：US20180106736A1
公开(公告)日：2018-04-19
申请号：US15544896
申请日：2016-08-26
申请人： Rigaku Corporation
发明人： Shinya HARA , Takashi MATSUO , Yasujiro YAMADA , Hisashi HONMA , Yoshiyuki KATAOKA
IPC分类号： G01N23/223 , G01N23/06 , G01N23/2206
CPC分类号： G01N23/223 , G01N23/207 , G01N23/2076 , G01N23/2209 , G01N2223/076
摘要： A scanning-type X-ray fluorescence spectrometer according to the present invention includes a quantitative analysis condition setting unit (13) configured to determine whether or not to add, as an analytical element, a new detected element other than preset sample constituting elements, from an absorption-enhancement effect degree of fluorescent X-rays on an analytical value of an analytical element and an overlapping effect degree by an interfering line on an analytical line of the analytical element, on the basis of qualitative analysis results and semi-quantitative analysis results of standard samples (14).

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