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1. 发明授权

US11204378B2 Background suppression for MM-wave spectroscopy 有权
公开(公告)号：US11204378B2
公开(公告)日：2021-12-21
申请号：US16730914
申请日：2019-12-30
申请人： TEXAS INSTRUMENTS INCORPORATED
发明人： Argyrios Dellis , Juan Herbsommer , Adam Joseph Fruehling
IPC分类号： G01R23/17 , G01V8/00 , G01N21/61
摘要： A system includes first and second gas cells, each comprising a respective sealed interior waveguide. The first gas cell contains a dipolar gas and the second gas cell does not contain a dipolar gas. The system includes first and second transmit antennas coupled to the first and second gas cells, respectively, to provide first and second electromagnetic waves to the interior of the first and second gas cells, respectively; first receive antenna coupled to the first gas cell to generate a first signal indicative of an amount of energy in the first electromagnetic wave after travel through the first gas cell; second receive antenna coupled to the second gas cell to generate a second signal indicative of an amount of energy in the second electromagnetic wave after travel through the second gas cell; processor configured to calculate a background-free signal based on a difference between the first and second signals.

2. 发明授权

US11143700B2 Analysis of electro-optic waveforms 有权
公开(公告)号：US11143700B2
公开(公告)日：2021-10-12
申请号：US16582758
申请日：2019-09-25
申请人： Advanced Micro Devices, Inc.
发明人： Venkat Krishnan Ravikumar , Nathan Linarto , Wen Tsann Lua , Abel Tan Yew Hong , Shei Lay Phoa , Gopinath Ranganathan , Jiann Minn Chin
IPC分类号： G01R31/28 , G01R31/265 , G01R31/311 , G01R31/01 , G01R23/17 , G01R29/08
摘要： An optic probe is used to measure signals from a device under test. The optic probe is positioned at a target probe location within a cell of the device under test, the cell including a target net to be measured and a plurality of non-target nets. A test pattern is applied to the cell with the optic probe a laser probe (LP) waveform is obtained in response. A target net waveform is extracted from the LP waveform by: (i) simulating a combinational logic analysis (CLA) cross-talk waveform to model cross-talk from selected non-target nets by simulating an optical response of the cell to the test pattern with the target net masked; (ii) estimating a cross-talk weight; and (iii) determining a target net waveform by weighting the CLA cross-talk waveform according to the cross-talk weight and subtracting the weighted CLA cross-talk waveform from the LP waveform.

3. 发明申请

US20210096174A1 ELECTRO-OPTIC WAVEFORM ANALYSIS PROCESS 有权
公开(公告)号：US20210096174A1
公开(公告)日：2021-04-01
申请号：US16585963
申请日：2019-09-27
申请人： Advanced Micro Devices, Inc.
发明人： Venkat Krishnan Ravikumar , Jiann Min Chin , Joel Yang Kwang Wei , Pei Kin Leong
IPC分类号： G01R31/28 , G01R23/17 , G01R29/08
摘要： A reconfigurable optic probe is used to measure signals from a device under test. The reconfigurable optic probe is positioned at a target probe location within a cell of the device under test. The cell including a target net to be measured and non-target nets. A test pattern is applied to the cell and a laser probe (LP) waveform is obtained in response. A target net waveform is extracted from the LP waveform by: i) configuring the reconfigurable optic probe to produce a ring-shaped beam having a relatively low-intensity region central to the ring-shaped beam; (ii) re-applying the test pattern to the cell at the target probe location with the relatively low-intensity region applied to the target net and obtaining a cross-talk LP waveform in response; (iii) normalizing the cross-talk LP waveform; and (iv) determining a target net waveform by subtracting the normalized cross-talk LP waveform from the LP waveform.

4. 发明申请

US20210048463A1 DEVICE AND METHOD FOR FREQUENCY ANALYSIS OF A SIGNAL 有权
公开(公告)号：US20210048463A1
公开(公告)日：2021-02-18
申请号：US16969334
申请日：2019-02-14
申请人： THALES
发明人： Thierry DEBUISSCHERT , Ludovic MAYER
IPC分类号： G01R23/163 , G01R23/17
摘要： The invention relates to a device for the frequency analysis of a signal, comprising a diamond crystal having NV centers defining sub-regions, an excitation unit for optically or electrically exciting each sub-region, an injection unit for injecting a signal so that the sub-region is in the presence of the signal, a magnetic field generator designed so as to generate a magnetic field on each sub-region, the magnetic field having a spatial variation of amplitude in a first direction, and a detector for detecting the resonance frequency of each sub-region of the region, the detector comprising an electrical contact for detecting the charges created in a sub-region, and a reading circuit.

5. 发明授权

US10921356B2 Optical RF spectrum analyser 有权
公开(公告)号：US10921356B2
公开(公告)日：2021-02-16
申请号：US16327002
申请日：2017-08-22
申请人： The University of Sydney
发明人： Shijie Song , Xiaoke Yi
IPC分类号： G01R23/17
摘要： This disclosure relates to optical RF spectrum analysers and methods for analysing an input RF signal. An optical modulator modulates an input RF signal onto a carrier frequency and an optical spectral weight with a spectral weight function modifies the modulated optical signal. The spectral weight defines a frequency relationship between the spectral weight function and the carrier frequency. A frequency control module modifies the frequency relationship between the spectral weight function and the carrier frequency over time. An optical sensor senses the modified optical signal over time and to generates an RF signal over time. A signal recovery module calculates the RF spectrum based on the RF signal over time. Shifting the spectral weight against the carrier frequency over time results in a high spectral resolution even if the spectral weight is relatively broad band. The result is an increased spectral resolution at a reduced price/complexity and increased robustness.

6. 发明授权

US10279376B2 Measurement result display device and measurement result display method 有权
公开(公告)号：US10279376B2
公开(公告)日：2019-05-07
申请号：US15884834
申请日：2018-01-31
申请人： ANRITSU CORPORATION
发明人： Ryota Takasu , Yasuhiro Miyake , Soichiro Kai
IPC分类号： G01N21/31 , B07C5/342 , G01N21/25 , G01D3/06 , G01R23/17 , G01D3/024 , G01D1/18 , G01D7/00 , G01D7/02 , G01J3/02 , G01J3/28
摘要： Provided are a measurement result display device and a measurement result display method which are capable of making a list of how much difference is present between an allowable value and a measurement value of each measurement item measured by a measuring instrument, in a visually discriminable state. An allowable upper limit value indicator 21 and an allowable lower limit value indicator 22 are disposed at display positions which are set in advance in a measurement result image 20 as positions indicating an allowable upper limit value and an allowable lower limit value, and a measurement value indicator 23 is disposed at a display position calculated from display positions of the allowable upper limit value indicator 21 and allowable lower limit value indicator 22 and a measurement value measured by the measurement unit 10.

7. 发明授权

US09568545B2 Systems and methods for precision optical imaging of electrical currents and temperature in integrated circuits 有权
标题翻译：集成电路中电流和温度精密光学成像的系统和方法
公开(公告)号：US09568545B2
公开(公告)日：2017-02-14
申请号：US14566059
申请日：2014-12-10
申请人： THE TRUSTEES OF COLUMBIA UNIVERSITY IN THE CITY OF NEW YORK
发明人： Dirk R. Englund , Matthew E. Trusheim
IPC分类号： G01R31/00 , G01R31/28 , G01K11/00 , G01R31/311 , G01N21/64 , G01R19/00 , G01R15/24 , G01R23/17
CPC分类号： G01R31/2851 , G01K11/00 , G01N21/64 , G01N2201/06113 , G01R15/24 , G01R19/0092 , G01R23/17 , G01R31/2884 , G01R31/311
摘要： Systems and methods for precision optical imaging of electrical currents and temperature in integrated circuits are disclosed herein. In one aspect of the disclosed subject matter, a method for detecting a characteristic of an integrated circuit can include depositing at least one diamond structure, having at least one color center therein, onto a side of the integrated circuit.
摘要翻译：本文公开了用于集成电路中的电流和温度的精密光学成像的系统和方法。在所公开的主题的一个方面，用于检测集成电路的特性的方法可以包括将至少一个具有至少一个颜色中心的金刚石结构沉积到集成电路的一侧上。

8. 发明申请

US20150130474A1 APPARATUS FOR FREQUENCY ANALYZING A MEASUREMENT TARGET AND METHOD OF FREQUENCY ANALYZING A MEASUREMENT TARGET 有权
标题翻译：用于频率分析测量目标的装置和频率分析测量目标的方法
公开(公告)号：US20150130474A1
公开(公告)日：2015-05-14
申请号：US14535709
申请日：2014-11-07
申请人： HAMAMATSU PHOTONICS K.K.
发明人： Tomonori NAKAMURA , Akihiro OTAKA , Mitsunori NISHIZAWA
IPC分类号： G01R23/17 , G01R31/311 , G01N21/95
CPC分类号： G01R23/17 , G01N21/9501 , G01N2201/06113 , G01N2201/08 , G01R31/311
摘要： A semiconductor device testing apparatus 1A includes a tester unit 16 that generates an operational pulse signal, an optical sensor 10 that outputs a detection signal as a response to the operational pulse signal, a pulse generator 17 that generates a reference signal containing a plurality of harmonics for the operational pulse signal in synchronization with the operational pulse signal, a spectrum analyzer 13 that receives the detection signal and acquires a phase and amplitude of the detection signal at a detection frequency, a spectrum analyzer 14 that receives the reference signal and acquires a phase of the reference signal at a detection frequency, and an analysis control unit 18 that acquires a time waveform of the detection signal based on the phase and the amplitude of the detection signal acquired by the spectrum analyzer 13 and the phase of the reference signal. acquired by the spectrum analyzer 14.
摘要翻译：半导体器件测试装置1A包括产生操作脉冲信号的测试器单元16，作为对操作脉冲信号的响应输出检测信号的光学传感器10，产生包含多个谐波的参考信号的脉冲发生器17 用于与操作脉冲信号同步的操作脉冲信号;频谱分析器13，其接收检测信号，并以检测频率获取检测信号的相位和幅度;频谱分析器14，其接收参考信号并获取相位以及分析控制单元18，其基于由频谱分析器13获取的检测信号的相位和振幅以及参考信号的相位来获取检测信号的时间波形。由频谱分析仪14采集。

9. 发明授权

US07751657B2 Inclinometer system 有权
标题翻译：倾角仪系统
公开(公告)号：US07751657B2
公开(公告)日：2010-07-06
申请号：US12489578
申请日：2009-06-23
申请人： Geum Suk Lee
发明人： Geum Suk Lee
IPC分类号： G02B6/00 , G01B11/26 , G01R23/17 , G01P15/13 , G01H9/00
CPC分类号： G01C9/02 , G01D5/35303 , G02B6/022
摘要： Disclosed is an inclinometer system capable of detecting the inclination of the ground using a fiber bragg grating sensor to precisely measure the deformation of the ground. The inclinometer system includes at least one measuring unit, and the measuring unit includes a body provided therein with a receiving part, a frame inserted into the body, a weight member inserted in to the frame and having one end hinged to the frame, the weight member rotating in cooperation to inclination of the body, an optical fiber 5 passing through both the body and the frame such that one end of the optical fiber is fixed to the weight member, a fixing member installed into the frame to fix an opposite end of the optical fiber, and a fiber bragg grating (FBG) sensor attached to the optical fiber.
摘要翻译：公开了一种倾斜计系统，其能够使用光纤布拉格光栅传感器来检测地面的倾斜度，以精确地测量地面的变形。所述测斜器系统包括至少一个测量单元，并且所述测量单元包括设置在其中的主体，所述主体具有接收部分，插入到所述主体中的框架，插入到所述框架中并具有铰接到所述框架的一端的配重构件，一个与身体倾斜协调旋转的构件，一个光纤5穿过主体和框架，使得光纤的一端固定在配重构件上，一个固定构件安装在框架中，光纤，以及连接到光纤的光纤布拉格光栅（FBG）传感器。

10. 发明授权

US5041778A Electrooptic measurement systems for frequency analysis of very wide range signals 失效
标题翻译：用于非常宽范围信号频率分析的电光测量系统
公开(公告)号：US5041778A
公开(公告)日：1991-08-20
申请号：US380445
申请日：1989-07-17
申请人： Slimane Loualiche , Francois Salin
发明人： Slimane Loualiche , Francois Salin
IPC分类号： G01R23/17 , G02F2/00
CPC分类号： G02F2/00 , G01R23/17
摘要： A spectrum analyzer for a variable amplitude and frequency electric signal includes an optical modulator responsive to the signal that derives a first optical wave having intensity and frequency components corresponding to the signal amplitude and frequency components. An optical analyzer responds to the first optical wave to derive a second optical wave having intensity variations at frequency components corresponding to the amplitude of the electric signal at the frequencies in the spectrum of the signal. The optical analyzer includes a tunable optical cavity responsive to the first optical wave to derive the second optical wave.
摘要翻译：用于可变幅度和频率电信号的频谱分析仪包括响应于该信号的光学调制器，该信号导出具有对应于信号幅度和频率分量的强度和频率分量的第一光波。光学分析仪对第一光波进行响应以导出在信号的频谱中的频率处的与电信号的振幅相对应的频率分量处具有强度变化的第二光波。光学分析仪包括响应于第一光波的可调谐光学腔来导出第二光波。

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