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    • 2. 发明授权
    • Swept frequency measurement system
    • 扫频测量系统
    • US3904959A
    • 1975-09-09
    • US49482174
    • 1974-08-05
    • PACIFIC MEASUREMENTS INC
    • BRITTON JR RALPH H
    • G01R27/30G01R27/00
    • G01R27/30
    • A calibration curve for a test circuit alone is first memorized by the system and is then automatically subtracted from subsequent response measurements of a test device placed in the test circuit to give just the response characteristics caused by the test device. In one preferred embodiment, the scale factor of a sensitivity control is also memorized along with the calibration data and is used to control an attenuation circuit between the calibration memory and the circuit which subtracts the stored calibration signal from the test device measurement signal to thereby allow the display sensitivity to be changed after the calibration signal has been recorded without introduction of measurement error.
    • 单独的测试电路的校准曲线首先由系统存储,然后从放置在测试电路中的测试设备的后续响应测量值中自动减去,以仅给出由测试设备引起的响应特性。 在一个优选实施例中,灵敏度控制的比例因子也与校准数据一起存储,并且用于控制校准存储器和电路之间的衰减电路,其从测试装置测量信号中减去存储的校准信号,从而允许 在记录校准信号之后,显示灵敏度将被改变,而不会引入测量误差。
    • 4. 发明授权
    • Circuit network measurement device and calibration method
    • 电路网络测量装置及校准方法
    • US5661404A
    • 1997-08-26
    • US503092
    • 1995-07-17
    • Koichi YanagawaAtsushi IshiharaHiroyuki IwaiTatsuo Furukawa
    • Koichi YanagawaAtsushi IshiharaHiroyuki IwaiTatsuo Furukawa
    • G01R27/28G01R27/30G01R35/00
    • G01R35/005G01R27/30
    • A system and a method are presented which reduce the number of times of connection and disconnection of calibration standards in a circuit network measurement device provided with many measurement ports. The circuit network measurement device generally includes a network analyzer and a test set. A calibration port is provided and typically placed in the test set. The calibration port consists of a connector and three standards (open, short, and load impedances) connected to the connector internally by means of a selection switch. The measurement port of the circuit network measurement device is calibrated by using the three external impedance standards. The calibrator is calibrated by connecting the measurement port calibrated at the former step. Other measurement ports are then connected to the calibrator to be calibrated. Because the three impedances of the internal calibrator are automatically selected by a switch of the calibrator, by means of logical control, the number of times the standards are connected and disconnected is reduced.
    • 本发明提供一种系统和方法,其减少了具有许多测量端口的电路网络测量装置中校准标准的连接和断开次数。 电路网络测量装置通常包括网络分析器和测试装置。 提供校准端口,通常放置在测试仪中。 校准端口由连接器和通过选择开关内部连接到连接器的三个标准(开路,短路和负载阻抗)组成。 电路网络测量设备的测量端口使用三个外部阻抗标准进行校准。 校准器通过连接在前一步骤校准的测量端口进行校准。 然后将其他测量端口连接到校准器进行校准。 由于内部校准器的三个阻抗由校准器的开关自动选择,通过逻辑控制,标准品的连接和断开次数减少了。
    • 6. 发明授权
    • Vector network analyzer with integral processor
    • 带集成处理器的矢量网络分析仪
    • US4816767A
    • 1989-03-28
    • US907124
    • 1986-09-11
    • Wayne C. CannonJohn T. Barr, IV
    • Wayne C. CannonJohn T. Barr, IV
    • G01R23/16G01R27/28G01R27/30G01R35/00G01R27/04
    • G01R27/30G01R23/16G01R27/28G01R35/00
    • An RF network analyzer is disclosed which is suitable for both laboratory and automated production measurements. An important feature of the invention is the ability of the user to completely specify the method of calibration to be used. In particular the user can select any three arbitrary RF standards having known electromagnetic response characteristics and can attach them in any arbitrary order to perform the calibration of the instrument. This calibration is carried out by measuring the RF scattering parameters S.sub.11, S.sub.21, S.sub.12, and S.sub.22, storing the data in a memory, and then calculating vector error correction coefficients that are characteristic of systematic errors introduced by the RF network analyzer into measured scattering parameters.
    • 公开了一种适用于实验室和自动化生产测量的RF网络分析仪。 本发明的一个重要特征是用户能够完全指定要使用的校准方法。 特别地,用户可以选择具有已知电磁响应特性的任何三个任意RF标准,并且可以以任何任意顺序附加它们来执行仪器的校准。 该校准通过测量将数据存储在存储器中的RF散射参数S11,S21,S12和S22进行测量,然后计算由RF网络分析仪引入的系统误差特征的矢量纠错系数到测量的散射参数 。