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1. 发明授权

US11635530B2 X-ray sensing device 有权
公开(公告)号：US11635530B2
公开(公告)日：2023-04-25
申请号：US17512639
申请日：2021-10-27
申请人： Au Optronics Corporation
发明人： Chia-Hsiu Tsai , Chia-Ming Chang , Ruei-Pei Chen
IPC分类号： G01T1/20 , C03C4/08 , H01L27/146
摘要： An X-ray sensing device includes a photosensitive element, lead-containing glass, and an X-ray conversion structure. The photosensitive element is configured to sense light having a first wavelength. The lead-containing glass overlaps the photosensitive element. The X-ray conversion structure is disposed on the lead-containing glass. The lead-containing glass is located between the photosensitive element and the X-ray conversion structure. The X-ray conversion structure is configured to at least partially convert X-rays into light having the first wavelength.

2. 发明申请

US20230121993A1 RADIATION DETECTOR 有权
公开(公告)号：US20230121993A1
公开(公告)日：2023-04-20
申请号：US18066528
申请日：2022-12-15
申请人： CANON ELECTRON TUBES & DEVICES CO., LTD.
发明人： Ryo MIBUKA , Hiroshi ONIHASHI
IPC分类号： G01T1/20 , G01T1/208
摘要： A radiation detector according to an embodiment includes an array substrate including multiple detecting parts detecting radiation directly or in collaboration with a scintillator, an analog circuit reading an image data signal from the multiple detecting parts, a digital circuit configuring a radiation image based on a signal from the analog circuit, and an inductor connected between a ground of the analog circuit and a ground of the digital circuit.

3. 发明授权

US11630221B2 Radiation detector, radiographic imaging device, and manufacturing method 有权
公开(公告)号：US11630221B2
公开(公告)日：2023-04-18
申请号：US17025621
申请日：2020-09-18
申请人： FUJIFILM Corporation
发明人： Munetaka Kato , Shinichi Ushikura , Yoshihiro Okada , Keiichi Akamatsu , Haruyasu Nakatsugawa
IPC分类号： G01T1/20 , H01L27/146 , G01T7/00 , A61B6/00 , G01T1/202
摘要： A radiation detector including: a substrate formed with a plural pixels in pixel region of a flexible base member, the plural pixels accumulates charges generated in response to light converted from radiation; a conversion layer provided at a surface to which the pixel region is provided on the base member, the conversion layer converts the radiation into light; and a reinforcement substrate provided at a surface of the conversion layer that faces a surface of the substrate side, the reinforcement substrate contains a material having a yield point and has a higher rigidity than the base member.

4. 发明授权

US11624844B2 Radiation detector and radiographic imaging apparatus 有权
公开(公告)号：US11624844B2
公开(公告)日：2023-04-11
申请号：US17556920
申请日：2021-12-20
申请人： FUJIFILM CORPORATION
发明人： Shinichi Ushikura , Munetaka Kato , Tatsunori Tanimoto
IPC分类号： G01T1/20 , H04N25/70
摘要： In a sensor substrate, a plurality of pixels are formed in a pixel region of a first surface of a flexible base material, and a terminal portion for electrically connecting a cable is provided in the terminal region of the first surface. A conversion layer is provided outside the terminal region of the base material and converts radiation into light. A reinforcing member is provided on a second surface of the base material to reinforce the strength of the base material. A stress neutral plane adjusting member is provided inside the terminal region and in at least a part, corresponding to the inside of the terminal region, of a cable electrically connected to the terminal portion.

5. 发明授权

US11617551B2 X-ray detector unit having at least one analysis unit and an adjustable voltage supply and method for operating an X-ray detector unit 有权
公开(公告)号：US11617551B2
公开(公告)日：2023-04-04
申请号：US17552420
申请日：2021-12-16
申请人： Siemens Healthcare GmbH
发明人： Alfons Eismann , Stefan Lechner , Thomas Hilderscheid , Stefan Hartmann , Peter Kaemmerer , Waseem Haider , Michael Grafberger
IPC分类号： A61B6/00 , A61B6/03 , G01T1/20 , G01T1/208 , G01T1/24
摘要： An X-ray detector unit is disclosed. In an embodiment, the X-ray detector unit includes: at least one analysis unit to process electrical signals delivered from a coupled converter unit and operatable by an operating voltage; an adjustable voltage supply, coupled to the at least one analysis unit, to provide an adjustable supply voltage; an identification unit, assigned to the at least one analysis unit, to provide identification information about the at least one analysis unit in a readable manner; and a communication unit, coupled to the adjustable voltage supply, to read the identification information provided from the identification unit, and based upon the identification information provided, to adjust the adjustable voltage supply to equate the provided supply voltage to the operating voltage of the at least one analysis unit.

6. 发明授权

US11614550B2 X-ray detector with focused scintillator structure for uniform imaging 有权
公开(公告)号：US11614550B2
公开(公告)日：2023-03-28
申请号：US17046105
申请日：2019-04-04
申请人： KONINKLIJKE PHILIPS N.V.
发明人： Heidrun Steinhauser , Onno Jan Wimmers
IPC分类号： G01T1/20 , G01N23/04 , G01T1/202
摘要： Dual layer detector (XD) for X-ray imaging, comprising at least two light sensitive surfaces (LSS1,LSS2). The dual layer detector further comprises a first scintillator layer (SL, SL1) including at least one scintillator element (SE) capable of converting X-radiation into light, the element having two faces, an ingress face (S1) for admitting X-radiation into the element (SE) and an egress face (S2) distal from the ingress face (S1), wherein the two faces (S1,S2) are arranged shifted relative to each other, so that a longitudinal axis (LAX) of the scintillator element (SE) is inclined relative to a normal (n) of the layer. The scintillator element (SE) has a sidewall (w,w1) extending between the two faces (S1,S2), the scintillator layer (SL) further comprising a second such scintillator element (SE′) having a sidewall (w′,w1′), the second scintillator element (SE′) neighboring the first scintillator element (SE), wherein the sidewall (w,w1) of the first scintillator element (SE) and the sidewall (w′,w1′) of the second scintillator element (SE) are neighbored and are inclined relative to each other. The dual layer detector (XD) further comprises a second such scintillator layer (SL2). One of the light sensitive surfaces (LSS1,LSS2) is arranged in between the two scintillator layers (SL1, SL2).

7. 发明申请

US20230086700A1 PHOTODETECTION DEVICE 有权
公开(公告)号：US20230086700A1
公开(公告)日：2023-03-23
申请号：US17802930
申请日：2021-02-01
申请人： KYOCERA Corporation
发明人： Noboru NOGUCHI , Yasuhiro YANAGIHARA , Nobuyuki SHIMA
IPC分类号： G01T1/20 , H01L27/146 , H01L31/0392
摘要： A photodetection device includes a substrate and a plurality of pixel units. The plurality of pixel units includes a pixel unit including a first photodetector in an active area, and a pixel unit including a second photodetector in an inactive area. The first photodetector includes a first lower electrode layer, a first lower extrinsic semiconductor layer, a first intrinsic semiconductor layer, a first upper extrinsic semiconductor layer, and a first upper electrode layer. The second photodetector includes a second lower electrode layer, a second lower extrinsic semiconductor layer, a second intrinsic semiconductor layer, a second upper extrinsic semiconductor layer, and a second upper electrode layer. The second lower electrode layer is covered with the second lower extrinsic semiconductor layer and the second intrinsic semiconductor layer.

8. 发明申请

US20230080926A1 PHOTOELECTRIC CONVERSION PANEL AND X-RAY PANEL 有权
公开(公告)号：US20230080926A1
公开(公告)日：2023-03-16
申请号：US17939435
申请日：2022-09-07
申请人： Sharp Display Technology Corporation
发明人： Fumiki NAKANO
IPC分类号： H01L27/146 , G01T1/20
摘要： A photoelectric conversion panel includes multiple thin-film transistors (TFTs), multiple photodiodes respectively connected the TFTs, a bias line, and a light shielding layer that is formed in a position overlapping at least one of the photodiodes in a plan view. One of the TFTs connected to a photodiode includes an electrically conductive region that connects a drain electrode of the TFT to a source electrode of the TFT.

9. 发明授权

US11598889B2 Scintillator panel and radiation detector 有权
公开(公告)号：US11598889B2
公开(公告)日：2023-03-07
申请号：US17387214
申请日：2021-07-28
申请人： HAMAMATSU PHOTONICS K.K.
发明人： Haruki Yamaji , Kazuhiro Shirakawa , Keisuke Goto , Hidenori Jonishi , Masashi Hatanaka , Jun Sakurai
IPC分类号： G01T1/202 , G01T1/20 , G21K4/00
摘要： A scintillator panel 10 includes a substrate 11 having a substrate main surface 11a, a substrate rear surface 11b, and a substrate side surface 11c; and a scintillator layer 12 having a scintillator rear surface 12b formed of a plurality of columnar crystals, a scintillator main surface 12a, and a scintillator side surface 12c. The substrate side surface 11c and the scintillator side surface 12c are substantially flush with each other. In the substrate 11, an angle A1 between the substrate rear surface 11b and the substrate side surface 11c is smaller than 90 degrees.

10. 发明申请

US20230061406A1 RADIATION IMAGING APPARATUS AND RADIATION IMAGING SYSTEM 有权
公开(公告)号：US20230061406A1
公开(公告)日：2023-03-02
申请号：US17820518
申请日：2022-08-17
申请人： CANON KABUSHIKI KAISHA
发明人： Misaki Kuriyama , Satoru Sawada , Takanori Taya
IPC分类号： A61B6/00 , G01N23/203 , G01N23/04 , G01T1/20
摘要： A radiation imaging apparatus includes an attenuation member on the back surface side opposite the radiation incident surface of a radiation detection unit. The attenuation member is configured to reduce unexpected appearance of a part disposed on the back surface side of the radiation imaging apparatus, the unexpected appearance of which occurs due to backscattered radiation reflected by the structured part on the back surface side of the radiation imaging apparatus. The attenuation member includes a material having a radiation transmittance higher than that of the part and covers the end portion of the outline of the part that overlaps the radiation detection unit in orthogonal projection onto the surface opposite the incident surface of the radiation detection unit, and the area of the attenuation member is smaller than that of the radiation detection unit.

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