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1. 发明授权

US07830484B2 TFT array substrate for inspection and method for inspection using the same 有权
标题翻译：用于检查的TFT阵列基板及使用其的检查方法
公开(公告)号：US07830484B2
公开(公告)日：2010-11-09
申请号：US11449783
申请日：2006-06-09
申请人： Soung Yeoul Eom , Dong Woo Kang , Bong Chul Kim , Ki Soub Yang
发明人： Soung Yeoul Eom , Dong Woo Kang , Bong Chul Kim , Ki Soub Yang
IPC分类号： G02F1/1343 , G02R31/00
CPC分类号： G02F1/136259 , G02F2203/69
摘要： A TFT substrate for inspection for shorts, includes a substrate defined by a display area and a non-display area outside the display area; a plurality of first and second lines formed in the display area on the substrate; pad lines formed to be extended from one side of each of the first lines to the non-display area; a plurality of signal inspection bars formed in the non-display area to cross the pad lines at one side of the pad lines; a shorting inspection bar spaced apart from the outermost signal inspection bar at a predetermined interval and substantially parallel with the signal inspection bar and connected to the pad lines; and a plurality of transparent electrode patterns partially overlapped with the pad lines and connected to one of the signal inspection bars.
摘要翻译：用于检查短路的TFT基板包括由显示区域和显示区域外部的非显示区域限定的基板; 形成在所述基板上的所述显示区域中的多个第一和第二线; 衬垫线形成为从每个第一行的一侧延伸到非显示区域; 形成在所述非显示区域中的多个信号检查条，以跨越所述焊盘线的一侧的所述焊盘线; 一个与最外面的信号检查条隔开预定间隔并基本上与信号检查条平行并连接到焊盘线的短路检查条; 以及多个透明电极图案，其与所述焊盘线部分地重叠并且连接到所述信号检查条之一。

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