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    • 3. 发明申请
    • ANTI-FUSE CIRCUIT AND INTEGRATED CIRCUIT INCLUDING THE SAME
    • 防冻电路和集成电路,包括它们
    • US20130051111A1
    • 2013-02-28
    • US13300212
    • 2011-11-18
    • Keon YOO
    • Keon YOO
    • G11C17/04
    • G11C17/18
    • An anti-fuse circuit and an integrated circuit (IC) including the same are disclosed, which are applied to a technology for use in all kinds of semiconductor devices or system ICs, each of which includes an anti-fuse circuit using the breakdown phenomenon of a gate oxide, so as to prevent the occurrence of an anti-breakdown phenomenon. The anti-fuse circuit includes an anti-fuse, a breakdown of which occurs by a program voltage, configured to be electrically short-circuited, a read controller configured to be controlled by a read voltage received through the anti-fuse so as to output a short-circuiting status of the anti-fuse, and a switching unit configured to form a path that prevents a current flowing through the anti-fuse from being applied to the read controller during a program operation and prevents a current from flowing in the anti-fuse during a read operation.
    • 公开了一种抗熔丝电路及其集成电路(IC),其应用于各种半导体器件或系统IC中使用的技术,其中每个包括使用击穿现象的反熔丝电路 栅极氧化物,以防止发生抗分解现象。 反熔丝电路包括反熔丝,其被构造为电短路的编程电压发生击穿,配置为由通过反熔丝接收的读取电压控制的读取控制器,以便输出 反熔丝的短路状态,以及开关单元,其被配置为形成在程序操作期间防止流过反熔丝的电流被施加到读取控制器的路径,并防止电流在反向熔断中流动 - 在读操作期间进行。
    • 4. 发明申请
    • One-time programmable read only memory
    • 一次性可编程只读存储器
    • US20100061137A1
    • 2010-03-11
    • US12205867
    • 2008-09-06
    • Juhan Kim
    • Juhan Kim
    • G11C17/04G11C7/00
    • G11C7/18G11C7/06G11C17/16G11C17/18G11C2207/002
    • For realizing high speed one time programmable memory, bit line is multi-divided for reducing capacitance, so that the bit line is quickly charged when reading and multi-stage sense amps are used for connecting divided bit line, wherein the multi-stage sense amps are composed of a first dynamic circuit serving as a local sense amp for reading the memory cell, a second dynamic circuit serving as a segment sense amp for reading the local sense amp, and a tri-state inverter serving as an amplify circuit of a global sense amp for reading the segment sense amp. When reading data, a voltage difference in the bit line is converted to a time difference for differentiating high data (programmed) and low data (unprogrammed) by the multi-stage sense amps. And buffered data path is connected to the global sense amp for realizing fast data transfer. Additionally, alternative circuits and memory cell structures are described.
    • 为了实现高速一次可编程存储器,位线被多重分割以减小电容,使得当读取时位线快速充电,并且多级感测放大器用于连接分开的位线,其中多级感测放大器 由作为用于读取存储单元的本地读出放大器的第一动态电路,用作读取本地读出放大器的段读出放大器的第二动态电路和用作全局的放大电路的三态反相器 用于读取段感测放大器的感测放大器。 当读取数据时,通过多级感测放大器将位线中的电压差转换为用于区分高数据(编程)和低数据(未编程)的时间差。 并且缓冲数据路径连接到全局感测放大器,以实现快速的数据传输。 另外,描述了替代电路和存储单元结构。
    • 6. 发明授权
    • Differentially coupled memory arrays
    • 不同的联接存储器阵列
    • US3827032A
    • 1974-07-30
    • US26400072
    • 1972-06-19
    • INTEGRATED MEMORIES INC
    • ABBOTT WCHEN T
    • G11C17/04G11C11/24G11C17/00
    • G11C17/04
    • A read-only memory plane has a plurality of storage elements arranged in a matrix of columns and rows. Drive means are associated with the columns of elements for energizing the elements and a plurality of sense lines are associated with the row of elements for determining the information content of the storage elements. A second matrix of storage elements is within the memory plane in tandem with the first matrix of elements. A second set of drive means and sense lines are provided for the read-out of the second array of storage elements. The information read-out is manifest in the presence or absence of signals induced in the sense lines when the storage elements are energized. Pairs of sense lines one in each pair from the first array and the other from the second array, are coupled to respective differential amplifiers for amplifying the induced signals and for rejecting any stray signals including background noise which would be common to the two arrays.
    • 只读存储器平面具有排列成列和行的矩阵的多个存储元件。 驱动装置与用于激励元件的元件列相关联,并且多个感测线与用于确定存储元件的信息内容的元件行相关联。 存储元件的第二矩阵在与存储器平面内的第一矩阵的元件之间。 第二组驱动装置和感测线被提供用于读出第二存储元件阵列。 当存储元件被通电时,在存在或不存在感测线中感应的信号的情况下,显示信息读出。 耦合到相应的差分放大器,用于放大感应信号和拒绝任何杂散信号,包括两个阵列共有的背景噪声。