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    • 2. 发明授权
    • First and second differential interconnects having interleaved stub traces
    • 第一和第二差分互连具有交错短截线
    • US09386690B2
    • 2016-07-05
    • US14228002
    • 2014-03-27
    • Intel Corporation
    • Ruihua DingMin WangMo Liu
    • H05K1/02H01P3/04H04B3/32H05K3/10H01P3/02H01P1/203
    • H05K1/0245H01P1/203H01P3/026H01P3/04H01P3/08H01P11/003H04B3/32H05K1/0216H05K1/0228H05K3/10H05K2201/09236H05K2201/09781Y10T29/49155
    • This disclosure relates generally to an electronic assembly and method having a first electrical connection point and a second electrical connection point and a differential interconnect coupling the first electrical connection point to the second electrical connection point, the differential interconnect including first and second transmission traces including a interior edges and a exterior edges opposite the interior edges, the second interior edge facing the first interior edge, and stub traces, each stub trace coupled to one of the first and second transmission traces and projecting from one of the first interior edge, the first exterior edge, the second interior edge, and the second exterior edge. A substantially equal number of stub traces project from the first exterior edge and the second exterior edge. At least twice as many stub traces project from the first and second exterior edges as project from the first and second interior edges.
    • 本公开总体上涉及一种具有第一电连接点和第二电连接点的电子组件和方法,以及将第一电连接点耦合到第二电连接点的差分互连,差动互连包括第一和第二传输迹线,包括 内部边缘和与内部边缘相对的外部边缘,面向第一内部边缘的第二内部边缘和短截线迹线,每个短截线迹线耦合到第一和第二传输轨迹中的一个并从第一内部边缘中的一个突出,第一内部边缘 外部边缘,第二内部边缘和第二外部边缘。 从第一外边缘和第二外边缘突出的基本相等数量的短截线迹。 从第一和第二内部边缘起,从第一和第二外部边缘突出的短截线迹线的至少两倍。