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1. 发明授权

US11457521B2 Influencing a focal spot 有权
公开(公告)号：US11457521B2
公开(公告)日：2022-09-27
申请号：US17330600
申请日：2021-05-26
申请人： Siemens Healthcare GmbH
发明人： Anja Fritzler
IPC分类号： H05G1/52 , H05G1/56 , H05G1/30
摘要： A method is for spatially influencing a focal spot of an X-ray source that generates X-ray radiation, to an associated X-ray source, to an associated system and to an associated computer program product. The method according to at least one embodiment includes: producing a focal spot on an anode by way of an electron emitter including a plurality of emitter segments, individually controllable to emit electrons; determining at least one actual value of a spatial extent and/or of a position of the produced focal spot; comparing the at least one actual value with a specified reference value of the focal spot; and controlling the emitter segments based upon the comparison of the at least one actual value and the reference value such that the at least one actual value converges toward the reference value, thereby spatially influencing the focal spot of the X-ray source that generates X-ray radiation.

2. 发明授权

US11450502B2 X-ray imaging apparatus and consumption level estimation method for X-ray source 有权
公开(公告)号：US11450502B2
公开(公告)日：2022-09-20
申请号：US17139122
申请日：2020-12-31
申请人： Shimadzu Corporation
发明人： Bunta Matsuhana , Goro Kambe
IPC分类号： H01J35/14 , H01J35/04 , A61B6/00 , H05G1/52 , H01J35/06
摘要： An X-ray imaging apparatus and a consumption level estimation method for an X-ray source, which estimate the consumption level of an X-ray source without measuring grid voltage. An X-ray control part includes: a tube current value setting part setting a tube current value supplied to an X-ray source; a tube current value measurement part measuring a cathode current value as the tube current value by a cathode current detector; a time measurement part measuring the time when the tube current value is set by the tube current value setting part and the time when the tube current value measured by the tube current value measurement part reaches the set value; and a consumption level estimation part estimating the consumption level of a cathode in the X-ray source based one the time until the tube current value reaches the set value after the tube current value has been set.

3. 发明授权

US11443913B2 X-ray radiator 有权
公开(公告)号：US11443913B2
公开(公告)日：2022-09-13
申请号：US17330978
申请日：2021-05-26
申请人： Siemens Healthcare GmbH
发明人： Anja Fritzler
IPC分类号： H01J35/06 , H01J35/14 , H01J35/10 , H05G1/52
摘要： An X-ray radiator and an X-ray assembly are disclosed. The X-ray radiator according to an embodiment has an evacuated X-ray tube housing, mounted to be rotatable about a rotation axis, the X-ray tube housing including an anode and an electron source. The anode is arranged within the X-ray tube housing non-rotatably relative to the X-ray tube housing and is configured to generate X-ray radiation via electrons impacting upon a focal spot of the anode, the electron source being mounted substantially stationary within the X-ray tube housing relative to the rotation axis. The electron source has a main emitter and at least one subsidiary emitter for emitting electrons. The electron emission of the main emitter and/or of the at least one subsidiary emitter is controllable such that a spatial movement of the focal spot due to a movement of the electron source is reduced.

4. 发明授权

US11257651B2 Determining width and height of electron spot 有权
公开(公告)号：US11257651B2
公开(公告)日：2022-02-22
申请号：US16973497
申请日：2019-06-24
申请人： Excillum AB
发明人： Per Takman , Ulf Lundström , Björn Hansson
IPC分类号： H01J35/14 , H01J35/08 , H05G1/52 , H05G1/26
摘要： A method in an X-ray source configured to emit, from an interaction region, X-ray radiation generated by an interaction between an electron beam and a target, the method including the steps of: providing the target; providing the electron beam; deflecting the electron beam along a first direction relative the target; detecting electrons indicative of the interaction between the electron beam and the target; determining a first extension of the electron beam on the target, along the first direction, based on the detected electrons and the deflection of the electron beam; detecting X-ray radiation generated by the interaction between the electron beam and the target; and determining a second extension of the electron beam on the target, along a second direction, based on the detected X-ray radiation.

5. 发明授权

US11201030B2 Distributed X-ray light source and control method therefor, and CT equipment 有权
公开(公告)号：US11201030B2
公开(公告)日：2021-12-14
申请号：US16627515
申请日：2018-05-29
申请人： Nuctech Company Limited , TSINGHUA UNIVERSITY
发明人： Chengjun Tan , Wenhui Huang , Chuanxiang Tang , Qingxiu Jin , Dongsheng Zhang , Qun Luo , Donghai Liu , Luming Zhang , Peidong Wu
IPC分类号： H01J35/14 , G01N23/046 , A61B6/03 , H01J35/04 , A61B6/00 , H05G1/52 , H05G1/32
摘要： A distributed X-ray light source comprises: a plurality of arranged cathode assemblies used for emitting electron beams; an anode target used for receiving the electron beams emitted by the cathode assemblies; and compensation electrodes and focusing electrodes provided in sequence between the plurality of the cathode assemblies and the anode target, the compensation electrode being used for adjusting electric field strength at two ends of a grid structure in each cathode assembly, and the focusing electrode being used for focusing the electron beams emitted by the cathode assemblies, wherein the focusing electrode corresponding to at least one cathode assembly in the plurality of the cathode assemblies comprises a first electrode and a second electrode which are separately provided, and an electron beam channel is formed between the first electrode and the second electrode.

6. 发明授权

US11109473B2 X-ray source and x-ray imaging apparatus 有权
公开(公告)号：US11109473B2
公开(公告)日：2021-08-31
申请号：US16969725
申请日：2019-02-19
申请人： KONINKLIJKE PHILIPS N.V.
发明人： Roger Steadman Booker , Gereon Vogtmeier
IPC分类号： H05G1/52 , H01J35/14 , H01J35/06 , H05G1/56
摘要： An X-ray source (10) for emitting an X-ray beam (101) is proposed. The X-ray source (10) comprises an anode (12) and an emitter arrangement (14) comprising a cathode (16) for emitting an electron beam (15) towards the anode (12) and an electron optics (18) for focusing the electron beam (15) at a focal spot (20) on the anode (12). The X-ray source (10) further comprises a controller (22) configured to determine a switching action of the emitter arrangement (14) and to actuate the emitter arrangement (14) to perform the switching action, the switching action being associated with a change of at least one of a position of the focal spot (20) on the anode (12), a size of the focal spot (20), and a shape of the focal spot (20). The controller (22) is further configured to predict before the switching action is performed, based on the determined switching action, the size and the shape of the focal spot (20) expected after the switching action. Further, the controller (22) is configured to actuate the electron optics (18) to compensate for a change of the size and the shape of the focal spot (20) induced by the switching action.

7. 发明申请

US20210195724A1 METHOD FOR CONTROLLING AN X-RAY SOURCE 有权
公开(公告)号：US20210195724A1
公开(公告)日：2021-06-24
申请号：US17057192
申请日：2019-06-07
申请人： Excillum AB
发明人： Per TAKMAN , Ulf LUNDSTRÖM
IPC分类号： H05G1/52 , H05G1/26 , H01J35/14
摘要： A method for controlling an X-ray source configured to emit, from an X-ray spot on a target, X-ray radiation generated by an interaction between an electron beam and the target, wherein the X-ray spot is determined by the field of view of an X-ray optical system of the X-ray source. The method includes providing the target, providing the electron beam forming an electron spot on the target and interacting with the target to generate X-ray radiation, and adjusting a width and total power of the electron beam such that a maximum of the power density profile in the electron spot is below a predetermined limit, and such that a total power delivered to the target in the X-ray spot is increased.

8. 发明申请

US20210195723A1 BEAM ALIGNMENT SYSTEMS AND METHOD 有权
公开(公告)号：US20210195723A1
公开(公告)日：2021-06-24
申请号：US16722887
申请日：2019-12-20
申请人： Schlumberger Technology Corporation
发明人： Jani Reijonen , Vincent Ernst
IPC分类号： H05G1/52 , G01V5/12 , H01J35/14
摘要： The present disclosure relates to a downhole tool that includes a first photon flux detector disposed at a first radial position about a longitudinal axis of the downhole tool that measures a first signal indicative of an x-ray flux of the x-ray photons. The downhole tool also includes a second photon flux detector disposed at a second radial position about the longitudinal axis of the downhole tool that measures a second signal indicative of the x-ray flux of the x-ray photons. Further, the downhole tool includes a controller communicatively coupled to the first photon flux detector and the second photon flux detector that determines a condition associated with the electron beam based at least in part on a relative x-ray flux from the first photon flux detector and the second photon flux detector.

9. 发明授权

US10971323B1 Semiconductor X-ray target 有权
公开(公告)号：US10971323B1
公开(公告)日：2021-04-06
申请号：US16468374
申请日：2017-12-15
申请人： Excillum AB
发明人： Björn Hansson , Andrii Sofiienko , Ulf Lundström
IPC分类号： H01J35/08 , H01J35/10 , H01J35/12 , H01J35/14 , H01J35/30 , H05G1/52 , H05G1/70
摘要： A solid X-ray target for generating X-ray radiation is disclosed. The X-ray target includes at least one material selected from a list including trivalent elements; and at least one material selected from a list including pentavalent elements, wherein a first one of the materials is capable of generating the X-ray radiation upon interaction with an electron beam, and a second one of the materials forms a compound with the first one of the materials. An X-ray source including such an X-ray target and an electron source is also disclosed.

10. 发明申请

US20210007210A1 X-RAY SOURCE AND X-RAY IMAGING APPARATUS 有权
公开(公告)号：US20210007210A1
公开(公告)日：2021-01-07
申请号：US16969725
申请日：2019-02-19
申请人： KONINKLIJKE PHILIPS N.V.
发明人： ROGER STEADMAN BOOKER , GEREON VOGTMEIER
IPC分类号： H05G1/52 , H05G1/56 , H01J35/14 , H01J35/06
摘要： An X-ray source (10) for emitting an X-ray beam (101) is proposed. The X- ray source (10) comprises an anode (12) and an emitter arrangement (14) comprising a cathode (16) for emitting an electron beam (15) towards the anode (12) and an electron optics (18) for focusing the electron beam (15) at a focal spot (20) on the anode (12). The X-ray source (10) further comprises a controller (22) configured to determine a switching action of the emitter arrangement (14) and to actuate the emitter arrangement (14) to perform the switching action, the switching action being associated with a change of at least one of a position of the focal spot (20) on the anode (12), a size of the focal spot (20), and a shape of the focal spot (20). The controller (22) is further configured to predict before the switching action is performed, based on the determined switching action, the size and the shape of the focal spot (20) expected after the switching action. Further, the controller (22) is configured to actuate the electron optics (18) to compensate for a change of the size and the shape of the focal spot (20) induced by the switching action

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