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1. 发明申请

US20230134106A1 TEMPERATURE SENSOR 有权
公开(公告)号：US20230134106A1
公开(公告)日：2023-05-04
申请号：US18049029
申请日：2022-10-24
申请人： NXP B.V.
发明人： Alexander Sebastian Delke , Anne Johan Annema , Jos Verlinden , Bram Nauta
IPC分类号： G01K1/022
摘要： A temperature sensor and method of temperature sensing is described. A first reference current is provided to a dual-slope ADC during a first slope time duration of a dual-slope ADC conversion cycle. A second reference current is provided to the dual-slope ADC during a second slope time duration of the dual-slope ADC conversion cycle. A digital codeword corresponding to a ratio of the first and second reference currents is then output by the dual-slope ADC. The first and second reference current ratio is related to the temperature.

2. 发明授权

US11596266B2 Wireless temperature-measurement system 有权
公开(公告)号：US11596266B2
公开(公告)日：2023-03-07
申请号：US16271436
申请日：2019-02-08
申请人： Matrix Product Development, Inc.
发明人： Ronald J. Pulvermacher , David J. Pulvermacher , Donald E.Z. Weier , Kerry Woodbury
IPC分类号： G01K1/08 , A47J37/07 , G01K1/14 , G01K1/022 , G01K1/024 , H02J7/34
摘要： A wireless temperature-measurement system comprising (a) one or more temperature probes each including one or more energy-storage capacitors which supply the electrical energy for operation of the probe(s) and (b) a probe-charging station having circuitry configured to supply electric charge to the energy-storage capacitors prior to the temperature probes being positioned to measure temperature.

3. 发明授权

US11486767B2 Semiconductor storage device, method of controlling semiconductor storage device, and memory system 有权
公开(公告)号：US11486767B2
公开(公告)日：2022-11-01
申请号：US17189140
申请日：2021-03-01
申请人： KIOXIA CORPORATION
发明人： Keisuke Terada , Eietsu Takahashi
IPC分类号： G11C11/34 , G01K1/022 , G11C16/34 , G11C16/26 , G11C16/16
摘要： A semiconductor storage device includes a memory cell and a control circuit configured to, upon receipt of a command, acquire a first temperature measured by a temperature sensor, and perform an operation corresponding to the command using a parameter corrected based on temperature. When the first temperature is within a predetermined range with respect to a second temperature measured before the command is received, the parameter is corrected using the second temperature. When the first temperature is outside the predetermined range, the parameter is corrected using the first temperature.

4. 发明授权

US11317262B2 System and method for smart material monitoring 有权
公开(公告)号：US11317262B2
公开(公告)日：2022-04-26
申请号：US16989519
申请日：2020-08-10
申请人： IDEACURIA INC.
发明人： Gregory A. Agostinelli , Steven Nashed Hanna , Ionut Alexandru Mirel
IPC分类号： H04W4/70 , G01N27/48 , G01N27/02 , G01N33/14 , G08C17/02 , G01N21/31 , G01K1/022 , H04L29/08 , H04L67/12
摘要： A system for monitoring the characteristics of a material by measuring electrical properties of a material uses a material monitoring device and a cloud database that relates electrical properties of a material to characteristics of that material. The aging and fermentation processes of wine and other alcohols can be monitored. The status and decomposition of foodstuffs can be monitored. The progress of chemical reactions in a vessel can be monitored. Water quality of water from a water conduit can be monitored. These characteristics can be indicated on a product monitoring device or can be communicated to an external computing device.

5. 发明申请

US20220065702A1 SEMICONDUCTOR STORAGE DEVICE, METHOD OF CONTROLLING SEMICONDUCTOR STORAGE DEVICE, AND MEMORY SYSTEM 有权
公开(公告)号：US20220065702A1
公开(公告)日：2022-03-03
申请号：US17189140
申请日：2021-03-01
申请人： KIOXIA CORPORATION
发明人： Keisuke TERADA , Eietsu TAKAHASHI
IPC分类号： G01K1/022 , G11C16/34 , G11C16/16 , G11C16/26
摘要： A semiconductor storage device includes a memory cell and a control circuit configured to, upon receipt of a command, acquire a first temperature measured by a temperature sensor, and perform an operation corresponding to the command using a parameter corrected based on temperature. When the first temperature is within a predetermined range with respect to a second temperature measured before the command is received, the parameter is corrected using the second temperature. When the first temperature is outside the predetermined range, the parameter is corrected using the first temperature.

6. 发明申请

US20210381903A1 Temperature Detecting Device 有权
公开(公告)号：US20210381903A1
公开(公告)日：2021-12-09
申请号：US17325227
申请日：2021-05-20
申请人： AViTA Corporation
发明人： Hsing Ou Yang , Hsuan-Hao SHIH , Ta-Chieh YANG
IPC分类号： G01K3/02 , G01K1/022 , G01K1/02 , G01K1/024
摘要： A thermometer includes an input unit, a control unit, a temperature sensor and an output unit. In response to an input operation is applied on the input unit, the control unit starts to perform a temperature detecting procedure, wherein the control unit instructs the temperature sensor to periodically perform a plurality of temperature detecting operations to obtain a plurality of detected temperature values corresponding to the temperature detecting operations, and only records X larger valid temperature values among the obtained temperature values. In response to determining that the performed temperature detecting procedure is completed, the control unit removes the largest one among the recorded valid temperature values and calculates an average value of the remaining one or more target temperature values as a temperature of a target object, so as to instruct the output unit display the temperature.

7. 发明授权

US10996112B2 Systems and methods for correcting lag between sensor temperature and ambient gas temperature 有权
公开(公告)号：US10996112B2
公开(公告)日：2021-05-04
申请号：US15779356
申请日：2016-11-14
申请人： Maxim Integrated Products, Inc.
发明人： Victor Levi , Michael James D'Onofrio , Raghunath Puttaiah
IPC分类号： G01K1/02 , G01K1/12 , A61L2/28 , G01K7/42 , G06F7/42 , G06F11/34 , G01K13/02 , G06F17/40 , G01K1/022
摘要： Various embodiments of the invention provide systems and methods for accurately determining temperatures in harsh environments such as, for example, in a steam autoclave chamber during a sterilization cycle. In certain embodiments, temperature data accuracy is increased by utilizing an IC-based temperature logging device that monitors and compensates for inherent thermal delays that would otherwise cause a discrepancy between temperature as measured by a temperature sensor and the actual ambient gas temperature. By properly correcting for the thermal delay, the data accuracy of the measured gas temperature is thus greatly enhanced.

8. 发明授权

US11604100B2 Temperature sensor module 有权
公开(公告)号：US11604100B2
公开(公告)日：2023-03-14
申请号：US17026425
申请日：2020-09-21
申请人： Mitsubishi Electric Corporation
发明人： Hideo Nagata
IPC分类号： G01K7/18 , G01K1/022 , G01K7/22
摘要： The temperature sensor module includes: a temperature sensor element and a signal processing circuit. The signal processing circuit includes: a series-connection resistor which is connected in series to the temperature sensor element; a temperature detection circuit which detects a temperature; a first analog-digital conversion circuit which converts an output signal from the temperature detection circuit into a digital signal; a memory which stores a series-connection resistor data piece about a relationship between a temperature and the resistance value of the series-connection resistor; a digital signal processing circuit which uses the series-connection resistor data piece, to calculate, on the basis of the digital signal indicating the temperature of the signal processing circuit, a digital command signal for keeping the resistance value of the series-connection resistor at a constant value, and outputs the digital command signal; and a digital-analog conversion circuit which outputs the digital command signal to the series-connection resistor.

9. 发明授权

US11467045B2 Calibration structure for calibrating a temperature sensor and methods therefore 有权
公开(公告)号：US11467045B2
公开(公告)日：2022-10-11
申请号：US16726424
申请日：2019-12-24
申请人： SIKA Dr. Siebert & Kühn GmbH & Co. KG
发明人： Martin Opfermann
IPC分类号： G01K15/00 , G01K1/022 , G08B5/22 , H04N7/18
摘要： A calibration setup for calibrating a temperature sensor includes a temperature calibrator, a temperature measuring unit connected to the temperature sensor, a camera unit configured to detect a measured temperature value and to transmit the measured temperature value to a storage medium in the temperature calibrator. A method of calibrating a temperature sensor using the calibration setup includes heating the temperature sensor to a first calibration temperature; detecting a first temperature value by the camera unit; transmitting the first temperature value from the camera unit to a storage medium in the temperature calibrator; heating the temperature sensor to at least a second calibration temperature; detecting a second temperature value by the camera unit; transmitting the second temperature value from the camera unit to the storage medium; and displaying the detected and stored temperature values on a calibrator indicator display in a respective association with the calibration temperatures.

10. 发明申请

US20220228925A1 TEMPERATURE EXCEPTION TRACKING IN A TEMPERATURE LOG FOR A MEMORY SYSTEM 有权
公开(公告)号：US20220228925A1
公开(公告)日：2022-07-21
申请号：US17153107
申请日：2021-01-20
申请人： Micron Technology, Inc.
发明人： David Aaron Palmer
IPC分类号： G01K1/022 , G06F16/2455 , G05B19/042 , G01K1/02
摘要： Methods, systems, and devices for temperature exception tracking in a temperature log for a memory system are described. The memory system may store the temperature log separate from data to which the temperature information corresponds. For example, a memory device may store data in a relatively higher-level cell and the corresponding temperature information in a relatively lower-level cell. To perform a write operation, the memory system may determine a current temperature at which the data is being written or was written to a partition of a memory device and may indicate in the temperature log if the current temperature is entering a temperature range that is outside a threshold temperature (e.g., a nominal temperature). To perform a read operation, the memory system may determine if the data to read was written to the memory device outside the threshold temperature to determine whether to perform temperature compensation for the read operation.

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