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    • 6. 发明申请
    • PHOTON NUMBER RESOLVING DETECTOR
    • WO2012063027A3
    • 2013-01-03
    • PCT/GB2011001595
    • 2011-11-11
    • TOSHIBA KKTOSHIBA RES EUROP LTDTHOMAS OLIVER EDWARDYUAN ZHILIANGSHIELDS ANDREW JAMES
    • THOMAS OLIVER EDWARDYUAN ZHILIANGSHIELDS ANDREW JAMES
    • H01L31/107H01L27/144H01L31/02
    • H01L31/107G01J1/46H01L27/1446H01L31/02027
    • A photon detection system for photon counting comprising an avalanche photo-diode, said avalanche photodiode comprising a p- n junction formed from a first semiconductor layer (103) having a first conductivity type and a second semiconductor layer (107) hav¬ ing a second conductivity type, wherein the first conductivity type is one selected from n-type or p-type and the second conductivity type is different to the first conductivity type and is selected from n- type or p-type, wherein the first semiconductor layer (103) is a doped layer which is doped with dopants of a first conductivity type and where there is a variation in the concentration of dopants of the first conductivity type such that the first layer comprises islands (105) of high field zones surrounded by low field zones, the high and low field zones distributed along the plane of the p-n junction, wherein the dopant concentration is higher in the high field zones than the low field zones, said system further comprising a biasing unit, said biasing unit being configured to apply a voltage which is static in time and a time varying voltage for operating the avalanche photo-diode in gated mode.
    • 一种用于光子计数的光子检测系统,包括雪崩光电二极管,所述雪崩光电二极管包括由具有第一导电类型的第一半导体层(103)和具有第二导电类型的第二半导体层(107)形成的p-n结, 导电类型,其中所述第一导电类型是从n型或p型选择的一种,并且所述第二导电类型不同于所述第一导电类型,并且选自n型或p型,其中所述第一半导体层(103 )是掺杂有第一导电类型的掺杂剂并且其中第一导电类型的掺杂剂的浓度变化的掺杂层,使得第一层包括由低场区域包围的高场区域的岛(105) ,所述高低场区域沿着所述pn结的平面分布,其中所述高场区域中的所述掺杂剂浓度高于所述低场区域,所述系统还包括: 偏置单元,所述偏置单元被配置为施加在时间上是静态的电压和用于在门控模式下操作雪崩光电二极管的时变电压。
    • 10. 发明申请
    • PHOTON DETECTOR
    • 光电探测器
    • WO2012063027A2
    • 2012-05-18
    • PCT/GB2011/001595
    • 2011-11-11
    • KABUSHIKI KAISHA TOSHIBATOSHIBA RESEARCH EUROPE LIMITEDTHOMAS, Oliver, EdwardYUAN, ZhiliangSHIELDS, Andrew, James
    • THOMAS, Oliver, EdwardYUAN, ZhiliangSHIELDS, Andrew, James
    • H01L31/107G01J1/46H01L27/1446H01L31/02027
    • A photon detection system comprising an avalanche photo-diode, said avalanche photodiode comprising a p-n junction formed from a first semiconductor layer having a first conductivity type and a second semiconductor layer having a second conductivity type, wherein the first conductivity type is one selected from n-type or p-type and the second conductivity type is different to the first conductivity type and is selected from n- type or p-type, wherein the first semiconductor layer is a doped layer which is doped with dopants of a first conductivity type and where there is a variation in the concentration of dopants of the first conductivity type such that the first layer comprises islands of high field zones surrounded by low field zones, the high and low field zones distributed laterally in the plane of the p-n junction, wherein the dopant concentration is higher in the high field zones than the low field zones, said system further comprising a biasing unit, said biasing unit being configured to apply a voltage which is static in time and a time varying voltage.
    • 一种包括雪崩光电二极管的光子检测系统,所述雪崩光电二极管包括由具有第一导电类型的第一半导体层和具有第二导电类型的第二半导体层形成的pn结,其中所述第一导电类型是从n 型或p型,第二导电类型与第一导电类型不同,并且选自n型或p型,其中第一半导体层是掺杂有第一导电类型的掺杂剂的掺杂层, 其中第一导电类型的掺杂剂的浓度存在变化,使得第一层包括被低场区包围的高场区的岛,高场和低场区横向分布在pn结的平面中,其中, 高场区域中的掺杂剂浓度高于低场区域,所述系统还包括偏压单元,所述偏压单元为配合孔 应用时间和时间变化的电压施加电压。