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    • 3. 发明申请
    • IMPROVEMENTS IN AND RELATING TO ION ANALYSIS
    • WO2023025400A1
    • 2023-03-02
    • PCT/EP2021/073793
    • 2021-08-27
    • SHIMADZU CORPORATIONSHIMADZU RESEARCH LABORATORY (EUROPE) LTD.
    • DING, LiRUSINOV, Aleksandr
    • H01J49/02H01J49/00
    • A method of processing data determined from an image-charge/current signal representative of ions of a given charge state (Q) undergoing oscillatory motion of a respective oscillation frequency (f) within an ion analyser apparatus. A data set comprises a measured signal frequency (f0) common to a plurality of a measured image-charge/current signals and a plurality of estimated ion charge values corresponding to respective amplitudes of each one of the plurality of measured image-charge/current signals. An integer charge value ([Qi]) is generated corresponding to a said estimated ion charge value rounded to the nearest integer value. Using the integer charge value ([Qi]) a plurality of different candidate image-charge/current signal frequency values (fiCand) are calculating according to said selected measured signal frequency (f0) and according to a corresponding one of one or more different candidate charge states of ion (e.g., protonation) and/or of ion isotope or isotopologue. The calculated plurality of different candidate image-charge/current signal frequency values (fiCand) are compared to a plurality of different signal frequencies (f) of the measured image-charge/current signals and a score value is calculated representing a degree of similarity therebetween according to the comparison. The charge state (Q) of the ion undergoing oscillatory motion of said selected measured signal frequency (f0), is then determined to be equal to the integer charge value ([Q̂l]) if the score value matches or exceeds a threshold score value.
    • 6. 发明申请
    • ION GUIDING DEVICE AND RELATED METHOD
    • WO2019003456A1
    • 2019-01-03
    • PCT/JP2017/026695
    • 2017-07-24
    • SHIMADZU CORPORATION
    • CHENG, YupengZHANG, XiaoqiangSUN, Wenjian
    • H01J49/06
    • The present invention provides an ion guiding device and an ion guiding method. The ion guiding device comprises a first electrode assembly, the first electrode assembly comprising two parallel electrode units arranged along a spatial axis; a second electrode assembly, the second electrode assembly comprising at least two non-parallel electrode units arranged in a plane between the parallel electrode units along the spatial axis, wherein a space enclosed by the first electrode assembly and second electrode assembly forms an ion transmission channel along the spatial axis; and, a power supply device, which is configured to apply RF voltages with different polarities to the first electrode assembly and the second electrode assembly to generate a RF electric field in the directions perpendicular to the spatial axis to confine ions, and separately apply DC voltages to the first electrode assembly and the second electrode assembly to generate a certain DC voltage difference, so as to generate a DC electric field along the spatial axis to control the movement of ions. The ion guiding device and the ion guiding method of the present invention realize a curved ion guiding structure, and provide an electric field in both the axial direction and the radial direction.
    • 9. 发明申请
    • ION MOBILITY SPECTROMETRY APPARATUS AND METHOD
    • 离子迁移谱分析仪和方法
    • WO2017122484A1
    • 2017-07-20
    • PCT/JP2016/087123
    • 2016-12-13
    • SHIMADZU CORPORATION
    • ZHANG, XiaoqiangSUN, Wenjian
    • G01N27/62H01J49/00
    • H01J49/063G01N27/622
    • An ion mobility spectrometry apparatus and method are provided, wherein the ion mobility spectrometry apparatus comprises: an ion source for providing ions; an ion guiding device comprising: at least three ends internally communicated: a first guiding end, a second guiding end, and a third guiding end, wherein ions can enter or exit from the ion guiding device from any ends thereof, the first guiding end is used for entrance of ions provided by the ion source, and the third guiding end is communicated with a downstream device; at least one drift cell in correspondence to the second guiding end, for transmitting ions and/or performing ion mobility analysis, each drift cell comprising a first end and a second end which are internally communicated, wherein the second end of drift cell is communicated with said second guiding end; an ion storage device communicated with said first end of drift cell, for storing ions or ejecting ions. By selecting different ion paths, ion mobility spectrometry analysis may be performed, or direct ion transmission may be performed.
    • 提供了一种离子迁移率光谱测量设备和方法,其中该离子迁移率光谱测量设备包括:用于提供离子的离子源; 一种离子导向装置,包括:内部连通的至少三个端部:第一导向端,第二导向端和第三导向端,其中离子可以从离子导向装置的任何端部进入或离开离子导向装置,第一导向端是 用于进入离子源提供的离子,第三引导端与下游装置连通; 至少一个对应于第二引导端的漂移单元,用于传输离子和/或执行离子迁移率分析,每个漂移单元包括内部连通的第一端和第二端,其中漂移单元的第二端与 所述第二引导端; 与漂移单元的所述第一端连通的离子存储装置,用于存储离子或喷射离子。 通过选择不同的离子路径,可以执行离子迁移谱分析,或者可以执行直接离子传输。
    • 10. 发明申请
    • MASS ANALYSER
    • 质量分析仪
    • WO2015173616A1
    • 2015-11-19
    • PCT/IB2015/000609
    • 2015-04-29
    • SHIMADZU CORPORATION
    • DING, LiRUSINOV, Aleksandr
    • H01J49/40H01J49/28H01J49/06
    • H01J49/401H01J49/065H01J49/067H01J49/068H01J49/282H01J49/406
    • A mass analyser comprises a pair of electrode arrays. Each array has a set of focusing electrodes which are supplied, in use, with voltage to create an electrostatic field in a space between the electrode arrays causing ions to undergo periodic, oscillatory motion in the space, ions passing between electrodes of the sets of focusing electrodes and being repeatedly focused at a centre plane, mid- way between the electrode arrays. At least one electrode of each set of focusing electrodes has an electrode surface closer to the centre plane than the electrode surfaces of other electrodes of the same set. The analyser may be an ion trap mass analyser or a multi-turn ToF mass analyser.
    • 质量分析器包括一对电极阵列。 每个阵列具有一组聚焦电极,其在使用中被提供电压以在电极阵列之间的空间中产生静电场,导致离子在空间中经历周期性的振荡运动,离子通过聚焦组的电极之间 电极并且在电极阵列之间的中间反复聚焦在中心平面处。 每组聚焦电极的至少一个电极具有比相同组的其它电极的电极表面更靠近中心平面的电极表面。 分析仪可以是离子阱质谱仪或多圈ToF质谱仪。