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    • 9. 发明授权
    • Process gas delivery for semiconductor process chambers
    • 半导体处理室的工艺气体输送
    • US08382897B2
    • 2013-02-26
    • US13456189
    • 2012-04-25
    • Kedarnath SangamAnh N. Nguyen
    • Kedarnath SangamAnh N. Nguyen
    • C30B25/14
    • H01L21/3141C23C16/405C23C16/45544C23C16/45582H01L21/31645Y10T117/10Y10T137/87249
    • Methods for gas delivery to a process chamber are provided herein. In some embodiments, a method may include flowing a process gas through one or more gas conduits, each gas conduit having an inlet and an outlet for facilitating the flow of gas through the gas conduits and into a gas inlet funnel having a second volume, wherein each gas conduit has a first volume less than the second volume, and wherein each gas conduit has a cross-section that increases from a first cross-section proximate the inlet to a second cross-section proximate the outlet but excluding any intersection points between the gas inlet funnel and the gas conduit, and wherein the second cross-section is non-circular; and delivering the process gas to the substrate via the gas inlet funnel.
    • 本文提供了将气体输送到处理室的方法。 在一些实施例中,方法可以包括使工艺气体流过一个或多个气体导管,每个气体管道具有入口和出口,用于促进气体流过气体导管并进入具有第二体积的气体入口漏斗,其中 每个气体管道具有小于第二容积的第一容积,并且其中每个气体导管具有从靠近入口的第一横截面增加到靠近出口的第二横截面的横截面,但不包括 气体入口漏斗和气体导管,并且其中第二横截面是非圆形的; 以及经由进气漏斗将工艺气体输送到衬底。