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    • 1. 发明授权
    • Method and apparatus for aligning patterns on a substrate
    • 用于对准衬底上的图案的方法和装置
    • US07279046B2
    • 2007-10-09
    • US10366717
    • 2003-02-14
    • Raymond K. EbyMichael NelsonIgor Touzov
    • Raymond K. EbyMichael NelsonIgor Touzov
    • B05C11/10
    • G01Q40/00Y10S977/854
    • A system and method for aligning prior patterning positions formed by a first SPM tip with a second SPM tip in combination with an SPM system includes identifying first location information that includes a location of the first SPM tip and a sample reference location on an SPM sample and storing the first location information in a storage area. After replacing the first SPM tip with the second SPM tip, second location information, which includes a location of the second SPM tip and the sample reference location on the SPM sample, is identified. Displacement is calculated between the location of the second SPM tip and the first SPM tip based on the first and second location information, and either the second SPM tip or a stage supporting the SPM sample is translated to align the second SPM tip with the location of the first SPM tip in accordance with the calculated displacement.
    • 用于将由第一SPM尖端形成的先前图案形成位置与第二SPM尖端对准的系统和方法与SPM系统组合包括识别包括第一SPM尖端的位置和SPM样本上的样本参考位置的第一位置信息,以及 将第一位置信息存储在存储区域中。 在用第二SPM尖端替换第一SPM尖端之后,识别包括第二SPM尖端的位置和SPM样本上的样本参考位置的第二位置信息。 基于第一和第二位置信息在第二SPM尖端的位置和第一SPM尖端之间计算位移,并且平移第二SPM尖端或支撑SPM样本的平台以使第二SPM尖端与 第一个SPM尖端按照计算出的位移。
    • 2. 发明授权
    • Method and apparatus for aligning patterns on a substrate
    • 用于对准衬底上的图案的方法和装置
    • US08043652B2
    • 2011-10-25
    • US11852978
    • 2007-09-10
    • Raymond K. EbyMichael NelsonIgor Touzov
    • Raymond K. EbyMichael NelsonIgor Touzov
    • C23C16/52B05D5/00
    • G01Q40/00Y10S977/854
    • A system and method for aligning prior patterning positions formed by a first SPM tip with a second SPM tip in combination with an SPM system includes identifying first location information that includes a location of the first SPM tip and a sample reference location on an SPM sample and storing the first location information in a storage area. After replacing the first SPM tip with the second SPM tip, second location information, which includes a location of the second SPM tip and the sample reference location on the SPM sample, is identified. Displacement is calculated between the location of the second SPM tip and the first SPM tip based on the first and second location information, and either the second SPM tip or a stage supporting the SPM sample is translated to align the second SPM tip with the location of the first SPM tip in accordance with the calculated displacement.
    • 用于将由第一SPM尖端形成的先前图案形成位置与第二SPM尖端对准的系统和方法与SPM系统组合包括识别包括第一SPM尖端的位置和SPM样本上的样本参考位置的第一位置信息,以及 将第一位置信息存储在存储区域中。 在用第二SPM尖端替换第一SPM尖端之后,识别包括第二SPM尖端的位置和SPM样本上的样本参考位置的第二位置信息。 基于第一和第二位置信息在第二SPM尖端的位置和第一SPM尖端之间计算位移,并且平移第二SPM尖端或支撑SPM样本的平台以使第二SPM尖端与 第一个SPM尖端按照计算出的位移。
    • 3. 发明申请
    • METHOD AND APPARATUS FOR ALIGNING PATTERNS ON A SUBSTRATE
    • 用于在基板上对准图案的方法和装置
    • US20080147346A1
    • 2008-06-19
    • US11852978
    • 2007-09-10
    • Raymond K. EbyMichael NelsonIgor Touzov
    • Raymond K. EbyMichael NelsonIgor Touzov
    • G01B21/16
    • G01Q40/00Y10S977/854
    • A system and method for aligning prior patterning positions formed by a first SPM tip with a second SPM tip in combination with an SPM system includes identifying first location information that includes a location of the first SPM tip and a sample reference location on an SPM sample and storing the first location information in a storage area. After replacing the first SPM tip with the second SPM tip, second location information, which includes a location of the second SPM tip and the sample reference location on the SPM sample, is identified. Displacement is calculated between the location of the second SPM tip and the first SPM tip based on the first and second location information, and either the second SPM tip or a stage supporting the SPM sample is translated to align the second SPM tip with the location of the first SPM tip in accordance with the calculated displacement.
    • 用于将由第一SPM尖端形成的先前图案形成位置与第二SPM尖端对准的系统和方法与SPM系统组合包括识别包括第一SPM尖端的位置和SPM样本上的样本参考位置的第一位置信息,以及 将第一位置信息存储在存储区域中。 在用第二SPM尖端替换第一SPM尖端之后,识别包括第二SPM尖端的位置和SPM样本上的样本参考位置的第二位置信息。 基于第一和第二位置信息在第二SPM尖端的位置和第一SPM尖端之间计算位移,并且平移第二SPM尖端或支撑SPM样本的平台以使第二SPM尖端与 第一个SPM尖端按照计算出的位移。