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    • 3. 发明授权
    • Apparatus for analysing surface properties with indirect illumination
    • 用间接照明分析表面性质的装置
    • US07741629B2
    • 2010-06-22
    • US11859673
    • 2007-09-21
    • Peter SchwarzUwe Sperling
    • Peter SchwarzUwe Sperling
    • G01N21/86G01N21/00G01N21/47
    • G01N21/55G01N21/4738G01N21/474G01N2021/4754
    • An apparatus (1) for analysing surface properties, comprising a first radiation device (4) which emits radiation directly onto a surface (9) to be analyzed, a first illumination device (6, 7) for indirectly illuminating the surface (9) to be analyzed, a first radiation detector device (8) which receives at least part of the radiation thrown back from the surface (9) to be analyzed and outputs at least one signal which is characteristic of this part of the radiation. According to the invention, a radiation scattering device (10, 11) is provided which is at least partially illuminated by the first illumination device (6, 7) and which transmits scattered radiation onto the surface (9) to be analyzed.
    • 一种用于分析表面特性的装置(1),包括:第一辐射装置(4),其将辐射直接发射到待分析的表面(9)上;第一照明装置(6,7),用于将表面(9)间接照射到 分析第一辐射检测器装置(8),其接收从待分析的表面(9)向后抛射的至少一部分辐射,并且输出至少一个是该辐射部分特征的信号。 根据本发明,提供了辐射散射装置(10,11),其至少部分地被第一照明装置(6,7)照射,并且将散射的辐射传播到待分析的表面(9)上。
    • 10. 发明公开
    • BELEUCHTUNGSEINRICHTUNG
    • EP3140634A1
    • 2017-03-15
    • EP15726546.3
    • 2015-05-08
    • Image Engineering GmbH & Co. KG
    • WÜLLER, Dietmar
    • G01N21/47G02B5/02F21V7/00G01J1/02G01J1/08G01J3/10G01J1/04
    • G01J3/10G01J1/08G01J2001/0481G01N21/4738G01N2021/4754G01N2201/0634G02B19/0019G02B19/0066
    • The invention relates to a lighting device by means of which a surface can be particularly uniformly illuminated, in particular for scientific or quality control purposes. In particular, the invention relates to a lighting device for homogeneously illuminating an object, which device comprises a homogenisation device (10) and is suitable for connection to a light source, said homogenisation device (10) having an inlet opening (12), an inlet chamber (16) arranged behind the inlet opening (12), an intermediate chamber (18), an outlet chamber (20), and an outlet opening (22) arranged behind the outlet chamber (20), wherein the inlet chamber (16), the intermediate chamber (18) and the outlet chamber (20) each have an outer surface (26) and an inner surface (24), wherein the inlet chamber (16) extends along a first main axis (H1) and the outlet chamber (20) extends along a second main axis (H2), and a light source arranged in the region of the inlet opening (12) can send light through the inlet chamber (16), the intermediate chamber (18), the outlet chamber (20) and the outlet opening (22) onto an object to be illuminated, characterised in that a beam of light cannot travel in a straight line from a point of the inlet opening (12) to a point of the outlet opening (22), and that at least the respective inner surfaces (24) of the inlet chamber (16), the intermediate chamber (18) and the outlet chamber (20) are diffusely reflective in at least one respective first region, such that a beam of light reflected on one of these inner surfaces (24), said beam illuminating a first reference surface (R1) with a first irradiance when incident, when emergent illuminates a second reference surface (R2) of the same size with a second irradiance that is lower than the first irradiance by at least a factor of 3, when both reference surfaces (R1, R2) are positioned at a distance of 10 mm from the reflection point (P).
    • 照明装置技术领域本发明涉及一种照明装置,借助于该照明装置可以特别均匀地照明表面,特别是用于科学或质量控制目的。 具体而言,本发明涉及一种用于均匀地照亮物体的照明装置,该装置包括均化装置(10)并且适于连接到光源,所述均化装置(10)具有入口开口(12), (20)后方设置的进口室(16),中间室(18),出口室(20)和出口开口(22),其中进口室 ),中间室(18)和出口室(20)各自具有外表面(26)和内表面(24),其中入口室(16)沿着第一主轴线(H1)延伸并且出口 (20)沿着第二主轴线(H2)延伸,并且布置在入口开口(12)的区域中的光源可以通过入口室(16),中间室(18),出口室 (20)和所述出口开口(22)到一个待照明的物体上,其特征在于:一束光 t不能从入口开口(12)的点到出口开口(22)的点直线行进,至少入口室(16)的相应内表面(24),中间室 (18)和所述出口腔室(20)在至少一个相应的第一区域中漫反射,使得在这些内表面(24)中的一个上反射的光束,所述光束以第一参考表面 当两个参考表面(R1,R2)被定位在第一辐照度时,当入射时,第一辐照度在出射时以比第一辐照度低第二辐照度的方式照射具有相同尺寸的第二参考表面(R2)至少3倍, 距离反射点(P)10毫米的距离。