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    • 1. 发明授权
    • RESONANT GAUGE WITH MICROBEAM DRIVEN IN CONSTANT ELECTRIC FIELD
    • 均与微机械BAR恒定电场供电振动转换器
    • EP0717835B1
    • 2000-04-26
    • EP93921396.3
    • 1993-09-07
    • HONEYWELL INC.
    • ZOOK, James, D.BURNS, David, W.
    • G01L9/00G01L1/18
    • G01P15/097G01B7/16G01L1/183G01L9/0019Y10S73/01
    • A resonant strain gauge includes a silicon substrate, a polysilicon flexure beam attached at both ends to the substrate, and a polysilicon rigid cover cooperating with the substrate to enclose the flexure beam within a sealed vacuum chamber. An upper bias electrode is formed on the cover, and a lower bias electrode is formed on the substrate directly beneath and spaced apart from the flexure beam. A drive electrode is formed in or on the beam, centrered between the upper and lower bias electrodes transversely with respect to the direction of beam elongation. The upper and lower electrodes are biased at constant voltage levels, of equal magnitude and opposite polarity. The drive electrode, ordinarily biased at ground, is selectively charged by applying an oscillating drive voltage, to cause mechanical oscillation of the beam. A piezoresistor element, formed on the beam, senses beam oscillation and provides a position indicating input to the oscillator circuit that drives the beam. The beam tends to oscillate at its natural resonant frequency. The piezoresistor thus provides the natural resonant frequency to the oscillating circuit, adjusting the frequency of the beam drive signal toward coincidence with the natural resonant frequency. A shield electrode can be formed on the flexure beam between the piezoresistor and the drive electrode, to insure against parasitic capacitance. In alternative embodiments, the drive signal is applied to one of the bias electrodes to oscillate the beam, and beam oscillation is sensed capacitively.
    • 10. 发明公开
    • Accelerometer
    • Beschleunigungsmesser。
    • EP0490419A1
    • 1992-06-17
    • EP91203028.5
    • 1991-11-20
    • DELCO ELECTRONICS CORPORATION
    • Staller, Steven EdwardDe Roo, David William
    • G01P15/08
    • G01P15/0802G01P2015/084Y10S73/01
    • An accelerometer is provided which has a silicon substrate (14) bonded to a silicon capping plate (30) and a silicon back plate (32), wherein the bonds (26,28) between the three silicon wafers are characterized by a relatively low residual stress level over a wide temperature range. The bonds (26,28) are formed by means of an appropriate adhesive at a relatively low temperature without degradation to the accelerometer. The bonds (26,28) between the silicon wafers also provide stress relief during use and packaging of the accelerometer. The damping distance for the proof mass of the microaccelerometer can be accurately controlled and stop means (42,44) are provided for preventing excessive deflection of the proof mass (12) in a direction perpendicular to the plane of the accelerometer.
    • 提供了一种加速度计,其具有结合到硅封盖板(30)和硅背板(32)的硅衬底(14),其中三个硅晶片之间的结合(26,28)的特征在于相对较低的残余 应力水平在较宽的温度范围内。 键(26,28)通过适当的粘合剂在相对较低的温度下形成,而不会降解加速度计。 硅片之间的结合(26,28)在加速度计的使用和封装过程中也提供了应力消除。 可以精确地控制微加速度计的检测质量的阻尼距离,并设置停止装置(42,44),以防止在与加速度计的平面垂直的方向上过度偏转检验质量块(12)。