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    • 92. 发明申请
    • Millimeter-wave signal transmission device
    • 毫米波信号传输装置
    • US20050017818A1
    • 2005-01-27
    • US10628635
    • 2003-07-25
    • Noyan KinaymanAllan DouglasJohn Cushman
    • Noyan KinaymanAllan DouglasJohn Cushman
    • H01P1/02H01P5/107H01P5/02
    • H01P5/107
    • A transition for transmitting a mm-wave signal from one plane to another, the transition comprising: (a) first and second transmission lines on parallel planes; (b) a third transmission line orthogonal to the first and second transmission lines, wherein either the first and second transmission lines are suitable for transmitting a TEM mode signal and the third transmission line is suitable for transmitting a waveguide mode signal, or the third transmission line is suitable for transmitting a TEM mode signal and the first and second transmission lines are suitable for transmitting a waveguide mode signal; and (c) first and second transducers, the first transducer coupled between the first and third transmission lines, the second transducer coupled between the second and third transmission lines, each of the transducers suitable for converting a TEM mode signal to a waveguide mode signal.
    • 用于将mm波信号从一个平面发送到另一个平面的转变,所述转变包括:(a)平行平面上的第一和第二传输线; (b)与第一和第二传输线正交的第三传输线,其中第一传输线和第二传输线都适合于发射TEM模式信号,并且第三传输线适合于传输波导模式信号,或第三传输线 线路适用于发送TEM模式信号,并且第一和第二传输线路适于发送波导模式信号; 和(c)第一和第二换能器,耦合在第一和第三传输线之间的第一换能器,耦合在第二和第三传输线之间的第二换能器,每个换能器适合于将TEM模式信号转换为波导模式信号。
    • 95. 发明授权
    • Waveguide-microstrip transmission line transition structure having an
integral slot and antenna coupling arrangement
    • 波导 - 微带传输线过渡结构具有整体槽和天线耦合装置
    • US5793263A
    • 1998-08-11
    • US649322
    • 1996-05-17
    • David M. Pozar
    • David M. Pozar
    • H01P5/107
    • H01P5/107
    • A waveguide-microstrip transmission line transition structure is provided having a microstrip transmission line structure adapted for coupling to an open end of a waveguide. The microstrip transmission line structure includes a microstrip transmission line having a ground plane conductor and an antenna electrically coupled to the microstrip transmission line through an aperture in the ground plane conductor. The ground plane conductor is adapted for mounting in a plane intersecting a longitudinal axis of the waveguide. The antenna provides impedance matching between the microstrip transmission line and the waveguide. With such an arrangement, a relatively simpler manufacturable structure is provided because it is adapted for mounting to a standard waveguide flange and does not require specially machined waveguide pieces. The arrangement also provides modularity, in that the waveguide can be easily connected to and disconnected from the microstrip transmission line structure. Still further, the transition section does not require any special openings in the waveguide, thus eliminating spurious radiation and providing hermiticity. The structure is particularly well-suited for connecting planar antennas to waveguide feeds.
    • 提供了一种波导 - 微带传输线过渡结构,其具有适于耦合到波导的开口端的微带传输线结构。 微带传输线结构包括具有接地平面导体的微带传输线和通过接地平面导体中的孔电耦合到微带传输线的天线。 接地平面导体适于安装在与波导的纵向轴线相交的平面中。 天线提供微带传输线和波导之间的阻抗匹配。 通过这样的布置,提供了相对简单的制造结构,因为它适于安装到标准波导凸缘上,并且不需要特别加工的波导片。 该布置还提供了模块化,因为波导可以容易地连接到微带传输线结构并从微带传输线结构断开。 此外,过渡部分不需要波导中的任何特殊的开口,从而消除杂散辐射并提供隐性。 该结构特别适用于将平面天线连接到波导馈线。
    • 98. 发明授权
    • High frequency wafer probe including open end waveguide
    • 高频晶圆探头,包括开口波导
    • US5408188A
    • 1995-04-18
    • US995695
    • 1992-12-23
    • Takayuki Katoh
    • Takayuki Katoh
    • G01R31/28G01R1/067H01P5/04H01P5/107G01R1/04
    • H01P5/107G01R1/06772
    • A high frequency wafer probe for measuring characteristics of a device operating in a high frequency range includes a waveguide serving as a grounding conductor of the probe, an end of which is open, having a tip and extending from an upper wall of the waveguide in the vicinity of the open end which gradually increases in extent as it approaches the open end and the tip; a signal contact part disposed on a tip of the ridge for contacting a signal input terminal of a device under test; and a plurality of grounding contact parts disposed on the same plane as the signal contact part opposite to each other with the signal contact part between two of the signal contact parts for contacting a plurality of grounding terminals of a device under test. In this structure, the contact parts of the probe can be accurately positioned on the terminals of an IC chip under test, and the contact conditions are easily visually confirmed. In addition, a high frequency wafer probe with low loss and low reflection is achieved.
    • 用于测量在高频范围内工作的器件的特性的高频晶片探针包括用作探针的接地导体的波导,其端部是开放的,具有尖端并且在波导的上壁中延伸 接近开口端和尖端的开口端的附近逐渐增加; 信号接触部,其设置在所述脊的尖端上,用于接触被测器件的信号输入端; 以及多个接地部分,其设置在与信号接触部分相对的同一平面上,其中两个信号接触部分之间的信号接触部分用于接触待测器件的多个接地端子。 在这种结构中,可以将探头的接触部分精确地定位在被测试的IC芯片的端子上,并且容易地在目视上确认接触条件。 此外,实现了低损耗和低反射的高频晶片探针。