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11. 发明申请

US20230072626A1 WIRE ROPE INSPECTION METHOD, WIRE ROPE INSPECTION SYSTEM, AND WIRE ROPE INSPECTION DEVICE 有权
公开(公告)号：US20230072626A1
公开(公告)日：2023-03-09
申请号：US17861647
申请日：2022-07-11
申请人： Shimadzu Corporation
发明人： Hiromichi TONAMI
IPC分类号： G01N27/83 , G01R33/02
摘要： A wire rope inspection method performs second differential processing on a positive component or a negative component of a first-order differential waveform. Then, the positive component of the second-order differential waveform and an absolute value of the negative component of the second-order differential waveform are added in a state in which portions of the second-order differential waveform indicating the abnormal portion of the wire rope are shifted to overlap with each other. Then, the abnormal portion of the wire rope is determined based on the generated composite waveform.

12. 发明申请

US20230056540A1 LIST MODE IMAGE RECONSTRUCTION METHOD AND NUCLEAR MEDICINE DIAGNOSTIC APPARATUS 有权
公开(公告)号：US20230056540A1
公开(公告)日：2023-02-23
申请号：US17910468
申请日：2020-03-16
申请人： Shimadzu Corporation
发明人： Tetsuya KOBAYASHI , Yoshihiro YAMADA
IPC分类号： G06T11/00 , G01T1/161
摘要： A list mode image reconstruction method includes a step of dividing list mode data into a plurality of subsets and a step of acquiring a subset balance coefficient based on the number of events in the plurality of subsets.

13. 发明申请

US20230054389A1 THREE-DIMENSIONAL SHAPE REGISTRATION METHOD AND THREE-DIMENSIONAL SHAPE DATA PROCESSING DEVICE 有权
公开(公告)号：US20230054389A1
公开(公告)日：2023-02-23
申请号：US17879099
申请日：2022-08-02
申请人： Shimadzu Corporation
发明人： Shuhei ONISHI , Hiroyuki FUJIMOTO
IPC分类号： G06T7/00 , G06T7/33 , G06T7/73 , G01N23/046
摘要： A three-dimensional shape registration method includes a step of acquiring three-dimensional CT data of a subject and at least three positioning members, which are acquired by performing X-ray CT imaging on the positioning members together with the subject, a step of measuring relative positions between the subject and each of the positioning members, and a step of performing registration between the subject in the CT data and the subject in three-dimensional design data of the subject based on the CT data, the design data, and information on the relative positions.

14. 发明申请

US20230053507A1 WIRE ROPE INSPECTION DEVICE 有权
公开(公告)号：US20230053507A1
公开(公告)日：2023-02-23
申请号：US17752465
申请日：2022-05-24
申请人： SHIMADZU CORPORATION
发明人： Hajime TAKEMOTO
IPC分类号： B66B7/12 , G01N27/83
摘要： This wire rope inspection device is provided with an urging unit for urging a detection unit in a direction to approach a wire rope by an elastic force to an inspection position at which the detection unit is arranged at a time of an inspection operation for inspecting the wire rope and a drive unit for moving the detection unit in a direction away from the wire rope to a normal operation position at which the detection unit is arranged at a time of a normal operation.

15. 发明授权

US11585758B2 Microspectroscopic device and microspectroscopic method 有权
公开(公告)号：US11585758B2
公开(公告)日：2023-02-21
申请号：US17284115
申请日：2019-09-27
申请人： Shimadzu Corporation
发明人： Tatsuya Ikehara
IPC分类号： G01J3/42 , G01N21/64 , G01J3/44 , G01N21/65
摘要： A microspectroscopic device includes: a wavelength-tunable first light source configured to emit pump-light in a mid-infrared wavelength range; a second light source configured to emit probe-light in a visible range; a light source controller configured to change a wavelength of the infrared light source; a first optical system configured to combine the pump-light and the probe-light to acquired combined light and concentrate the combined light on a minute part of a sample; a second optical system configured to block at least the probe-light from transmitted light or reflected light of the sample; a detector configured to detect light incident thereon from the second optical system; a first spectrum acquisition means configured to acquire a spectrum of the incident light during the probe-light emission to the sample as a Raman spectrum or a fluorescence spectrum of the sample; and a second spectrum acquisition means configured to acquire an infrared absorption spectrum of the sample, based on a change in the spectrum of the incident light with respect to a change in a wavelength by the light source controller during the probe-light and pump-light emission to the sample.

16. 发明申请

US20230033480A1 DATA PROCESSING APPARATUS AND INFERENCE METHOD 有权
公开(公告)号：US20230033480A1
公开(公告)日：2023-02-02
申请号：US17857316
申请日：2022-07-05
申请人： SHIMADZU CORPORATION
发明人： Yuriko NAKAKIMURA , Shiori NAGAI , Tomohiro KAWASE , Yusuke YOKOI , Satoshi YAMAMOTO , Kenta ADACHI
IPC分类号： G06N5/04 , G06N20/00
摘要： A data processing apparatus according to one aspect is provided with an inference unit configured to predict at least one objective variable from a plurality of explanatory variables by using a trained model, and a display data generation unit configured to generate data for displaying an inference result by the inference unit. The inference unit is configured to set a first explanatory variable selected from the plurality of explanatory variables as a variation value and set second explanatory variables other than the first explanatory variable as fixed values. The inference unit predicts, by using the trained model, the at least one objective variable when the first explanatory variable is continuously varied within a predetermined variation range. The display data generation unit generates data indicating a variation of the at least one objective variable with respect to a variation of the first explanatory variable.

17. 发明申请

US20230026092A1 EQUIPMENT RECORDING SYSTEM AND EQUIPMENT RECORDING METHOD 有权
公开(公告)号：US20230026092A1
公开(公告)日：2023-01-26
申请号：US17380803
申请日：2021-07-20
申请人： Shimadzu Corporation
发明人： Mitsuo YAMASHITA , Makoto SHINOHARA
IPC分类号： H04N7/18 , H04R1/08 , H04N5/77
摘要： An equipment recording system is provided with at least one of a microphone and a camera, and a server. The server is configured to store at least one of information on a sound of a measurement target and information on a moving image of the measurement target, which have been stored before and after the time point at which an abnormality-related signal of the equipment has occurred in a state of being associated with the abnormality-related signal of the equipment.

18. 发明申请

US20230025483A1 MATERIAL TESTING MACHINE 有权
公开(公告)号：US20230025483A1
公开(公告)日：2023-01-26
申请号：US17866544
申请日：2022-07-17
申请人： SHIMADZU CORPORATION
发明人： Shusuke NUMATA
IPC分类号： G01N3/10 , G01M5/00
摘要： In a material testing machine including a load actuator including a shaft configured to make a linear motion, and configured to apply a load to a test piece through the linear motion of the shaft, the load actuator includes a bearing configured to support the shaft, and the bearing serves as an air bearing.

19. 发明申请

US20230019010A1 ANALYSIS INFORMATION MANAGEMENT METHOD AND ANALYSIS INFORMATION MANAGEMENT SYSTEM 有权
公开(公告)号：US20230019010A1
公开(公告)日：2023-01-19
申请号：US17744642
申请日：2022-05-14
申请人： SHIMADZU CORPORATION
发明人： Shravan Kumar TIWARI
IPC分类号： G06F11/30 , G06F11/32
摘要： One mode of the analysis information management method according to the present invention is a method for managing information related to an analysis by an analyzing device, using a computer or computers, including the steps of: collecting, as comprehensive log information, work-log information related to a use of the analyzing device; calculating the number of executions of each of types of work including a manual analysis operation and a batch analysis operation, using at least a portion of the comprehensive log information collected in the step of collecting; presenting, to a user, information of the number of executions of each type of work obtained in the step of calculating; receiving, from the user, an input of one or more types of work selected from the types of work; and presenting, to the user, the work-log information concerning the one or more types of work received from the user.

20. 发明授权

US11549873B2 Tensile testing machine and control method of tensile testing machine 有权
公开(公告)号：US11549873B2
公开(公告)日：2023-01-10
申请号：US16800150
申请日：2020-02-25
申请人： SHIMADZU CORPORATION
发明人： Tohru Matsuura
IPC分类号： G01L1/00 , G01N3/10 , G01L1/10 , G01B7/16
摘要： A high-speed tensile testing machine conducts a tensile test on a test piece by applying a test force to the test piece. The high-speed tensile testing machine includes a detection unit configured to detect a test period indicating a time from when the test piece starts to deform under action of the test force to when the test piece breaks, and a determination unit configured to determine validity of a test result of the tensile test, on the basis of the test period and natural vibration of the high-speed tensile testing machine. Specifically, in the case where the test period is a predetermined multiple or more of a specific cycle indicating a cycle of the natural vibration of the high-speed tensile testing machine, the determination unit determines that the test result of the tensile test is valid.

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