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    • 20. 发明授权
    • Test system, electronic device and loopback testing method
    • US11456827B2
    • 2022-09-27
    • US17060404
    • 2020-10-01
    • Rohde & Schwarz GmbH & Co. KG
    • Prabhakaran Ekambaram
    • H04W24/00H04L1/24G01R31/317
    • A test system for performing loopback tests is described. The test system includes a processing circuitry and loopback circuitry. The processing circuitry (e.g., module) includes a signal source, an artificial intelligence module, an output port, and an input port, wherein the output port is connected to the input port by the loopback circuitry. The signal source is configured to generate an output signal. The processing module is configured to output the output signal via the output port. The loopback circuitry is configured to at least one of transmit the output signal to the input port directly and transmit the output signal to the input port via at least one further electronic component, thereby obtaining at least one input signal. The input port is configured to receive the at least one input signal. The input port further is configured to forward the at least one input signal to the artificial intelligence module. The artificial intelligence module is configured to automatically perform a loopback test of at least one of the signal source and the further electronic component based on the at least one input signal. Further, an electronic device and a loopback testing method is described.