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    • 27. 发明申请
    • METHOD AND APPARATUS FOR TESTING RF MODULES
    • 用于测试射频模块的方法和装置
    • US20050206570A1
    • 2005-09-22
    • US10805930
    • 2004-03-22
    • Seppo RousuKari Moilanen
    • Seppo RousuKari Moilanen
    • G01R29/10H01Q1/24
    • H01Q1/243H04B17/15H04B17/17H04B17/19H04B17/29
    • A device that has an antenna and an internal RF circuit is connected by an electrical conductor that has a first portion coupled to the RF circuit and an opposed, flexibly resilient second portion. The second portion defines a contact point and a testing point. The contact point is normally electrically coupled to the antenna by a bias in the second portion. When a biasing force such as a RF testing probe exerts force on the testing point through an aperture of a device housing, the normal bias of the second portion is overcome and contact is temporarily interrupted between the antenna and the contact point. The RF probe is placed in electrical contact with the RF circuit by contact with the testing point, which may be directly when a cover over the aperture is removable, or via a conductive pathway imposed through a flexible membrane that is fixed to the housing as a cover over the aperture.
    • 具有天线和内部RF电路的装置通过电导体连接,电导体具有耦合到RF电路的第一部分和相对的柔性弹性第二部分。 第二部分定义了一个接触点和一个测试点。 接触点通常在第二部分中通过偏置电耦合到天线。 当诸如RF测试探针的偏置力通过装置壳体的孔对测试点施加力时,克服第二部分的正常偏压并且天线和接触点之间的接触暂时中断。 RF探针通过与测试点的接触放置在与RF电路电接触中,该测试点可以直接当孔上的盖可移除时,或者通过通过固定到壳体的柔性膜施加的导电路径作为 覆盖光圈。