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    • 23. 发明申请
    • COMMAND DECODER OF SEMICONDUCTOR MEMORY DEVICE
    • 半导体存储器件的命令解码器
    • US20060104148A1
    • 2006-05-18
    • US10908549
    • 2005-05-16
    • Sun Suk Yang
    • Sun Suk Yang
    • G11C8/00
    • G11C7/109G11C7/1072G11C7/1078G11C7/1093G11C8/18
    • A command decoder is provided for controlling internal circuits of a semiconductor chip to operate in synchronism with a first internal clock signal having a pulse width, which is twice as wide as that of an external clock signal, and a second internal clock signal having an opposite phase to the first internal clock signal. An internal operation controller controls internal circuits of a semiconductor chip to operate in synchronism with a first internal clock signal having a pulse width, which is N times as wide as that of an external clock signal, if the command signal is received at a first rising edge of the external clock signal, and controls the internal circuits of the semiconductor chip to operate in synchronism with a second internal clock signal having an opposite phase to the first internal clock signal, if the command signal is received at a second rising edge of the external clock signal.
    • 提供了一种命令解码器,用于控制半导体芯片的内部电路与具有与外部时钟信号的两倍宽的脉冲宽度的第一内部时钟信号同步操作,以及具有相反的第二内部时钟信号 相到第一个内部时钟信号。 内部操作控制器控制半导体芯片的内部电路与第一内部时钟信号同步操作,该第一内部时钟信号的脉冲宽度是外部时钟信号的N倍,如果在第一次上升时接收到命令信号 并且如果在第二内部时钟信号的第二上升沿接收到指令信号,则控制半导体芯片的内部电路与与第一内部时钟信号具有相反相位的第二内部时钟信号同步地操作 外部时钟信号。
    • 24. 发明授权
    • Control circuit for delay locked loop
    • 延迟锁定环路的控制电路
    • US07026859B2
    • 2006-04-11
    • US10878450
    • 2004-06-28
    • Sun Suk YangByoung Jin Choi
    • Sun Suk YangByoung Jin Choi
    • H03K17/687
    • H03L7/0812H03L7/095
    • Provided is directed to a delay locked loop control circuit capable of reducing a test time and preventing a yield from being reduced, by preventing a failure due to a charge sharing and a failure in a specific frequency and voltage due to a noise of a feedback clock, by means of including: a level setting unit for setting an initial level of a locked state signal, which is decided whether or not phases of a reference clock and a feedback clock are aligned; a signal generation unit for generating a third control signal according to a first control signal comparing phases of the reference clock and the feedback clock, and a second control signal checking out phases of the reference clock and the feedback clock in every predetermined time; a level maintaining unit for maintaining a level of the locked state signal according to the locked state signal and a fourth control signal comparing a signal delaying the feedback clock for a predetermined time with the reference clock; a detection unit for varying a level of the locked state signal by detecting whether or not phases of a reference clock and a feedback clock are aligned according to the first to third control signals; and a control unit for controlling a variation of the locked state signal by means of the detection unit according to the fourth control signal.
    • 提供了一种延迟锁定环控制电路,其能够通过防止由于反馈时钟的噪声导致的电荷共享和特定频率和电压中的故障而导致的故障,从而减少测试时间并且防止产量降低 通过包括:电平设定单元,用于设定锁定状态信号的初始电平,判定参考时钟和反馈时钟的相位是否对齐; 信号生成单元,用于根据比较参考时钟和反馈时钟的相位的第一控制信号和在每个预定时间内检出参考时钟和反馈时钟的相位的第二控制信号来产生第三控制信号; 电平维持单元,用于根据锁定状态信号保持锁定状态信号的电平;以及第四控制信号,将延迟预定时间的反馈时钟的信号与参考时钟进行比较; 检测单元,用于通过检测参考时钟和反馈时钟的相位是否根据第一至第三控制信号对准来改变锁定状态信号的电平; 以及控制单元,用于根据第四控制信号通过检测单元来控制锁定状态信号的变化。
    • 25. 发明授权
    • Semiconductor memory device
    • 半导体存储器件
    • US08902682B2
    • 2014-12-02
    • US13615371
    • 2012-09-13
    • Sun Suk Yang
    • Sun Suk Yang
    • G11C7/00
    • G11C7/22G11C29/06
    • A semiconductor memory device includes an internal signal generation block configured to generate a control signal which is enabled from a generation time of an internal active signal enabled if it is determined that a combination of external commands in synchronization with a rising edge of an external clock inputted from an outside is a preset combination, to a disable time an internal idle signal; and an internal command signal generation block configured to generate an internal write signal if it is determined that a combination of counting signals counted during an enable period of the control signal is a first combination and generate an internal precharge signal if it is determined that the combination of the counting signals is a second combination.
    • 半导体存储器件包括内部信号产生模块,其被配置为:如果确定与输入的外部时钟的上升沿同步的外部命令的组合,则产生可从内部有效信号的生成时间使能的控制信号 从外部是预设组合,禁用时间内部空闲信号; 以及内部命令信号生成块,其被配置为如果确定在所述控制信号的使能周期期间计数的计数信号的组合是第一组合并且如果确定所述组合则生成内部预充电信号,则生成内部写入信号 的计数信号是第二组合。
    • 26. 发明授权
    • Semiconductor memory device using bus inversion scheme
    • 半导体存储器件采用总线反演方案
    • US07974145B2
    • 2011-07-05
    • US12764022
    • 2010-04-20
    • Sun-Suk Yang
    • Sun-Suk Yang
    • G11C8/00
    • G11C8/06
    • A semiconductor memory device is capable of transferring address signals at high speed and improving the operation reliability even though an input rate of an address signal increases, and thus a degradation of an operation speed caused by applying a bus inversion scheme can be prevented and power consumption can be reduced. The semiconductor memory device includes a bus inversion decoding block configured to determine whether a plurality of address signals are inverted or not by decoding an indication control signal, and an address buffer block configured to receive two address signals per one cycle of an external clock, align the received address signals for parallel processing, and transfer the address signals or inverted address signals according to an output of the bus inversion decoding block.
    • 半导体存储器件能够高速地传送地址信号,并且即使地址信号的输入速率增加也能提高操作可靠性,因此可以防止由施加总线反相方案引起的操作速度的劣化和功耗 可以减少 半导体存储器件包括:总线反相译码块,被配置为通过解码指示控制信号来确定多个地址信号是否反相;以及地址缓冲器块,被配置为每外部时钟的每个周期接收两个地址信号,对齐 用于并行处理的接收地址信号,并根据总线反相解码块的输出传送地址信号或反相地址信号。
    • 27. 发明授权
    • Semiconductor memory device using bus inversion scheme
    • 半导体存储器件采用总线反演方案
    • US07733737B2
    • 2010-06-08
    • US12150670
    • 2008-04-30
    • Sun-Suk Yang
    • Sun-Suk Yang
    • G11C8/00
    • G11C8/06
    • A semiconductor memory device is capable of transferring address signals at high speed and improving the operation reliability even though an input rate of an address signal increases, and thus a degradation of an operation speed caused by applying a bus inversion scheme can be prevented and power consumption can be reduced. The semiconductor memory device includes a bus inversion decoding block configured to determine whether a plurality of address signals are inverted or not by decoding an indication control signal, and an address buffer block configured to receive two address signals per one cycle of an external clock, align the received address signals for parallel processing, and transfer the address signals or inverted address signals according to an output of the bus inversion decoding block.
    • 半导体存储器件能够高速地传送地址信号,并且即使地址信号的输入速率增加也能提高操作可靠性,因此可以防止由施加总线反相方案引起的操作速度的劣化和功耗 可以减少 半导体存储器件包括:总线反相译码块,被配置为通过解码指示控制信号来确定多个地址信号是否反相;以及地址缓冲器块,被配置为每外部时钟的每个周期接收两个地址信号,对齐 用于并行处理的接收地址信号,并根据总线反相解码块的输出传送地址信号或反相地址信号。