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    • 32. 发明授权
    • Programming inhibit for non-volatile memory
    • 对非易失性存储器进行编程禁止
    • US07170793B2
    • 2007-01-30
    • US10823421
    • 2004-04-13
    • Daniel C. Guterman
    • Daniel C. Guterman
    • G11C11/34G11C16/04
    • G11C16/12
    • A non-volatile memory system is programmed so as to reduce or avoid program disturb. In accordance with one embodiment, the storage elements of a NAND string are partitioned into at least two regions. A first boosting voltage is applied to the first region of the string while a second larger boosting voltage is applied to the second region. The first region includes the addressed row or selected word line for programming. The boosting voltages are applied to the NAND strings of a block while the NAND strings are being inhibited from programming. In this manner, the second boosting voltage can be made larger without inducing program disturb on the memory cells receiving the larger boosting voltage. The boosted voltage potentials of the NAND string channels are trapped within the first region by lowering the boosting voltage on one or more bounding rows. The second boosting voltage is then lowered and data is applied to the bit lines of the NAND strings to select the appropriate strings for programming. The trapped voltage potential discharges or remains in the boosted state for programming depending on whether a string is selected for programming or is to remain inhibited from programming.
    • 编程非易失性存储器系统以减少或避免编程干扰。 根据一个实施例,NAND串的存储元件被划分成至少两个区域。 第一升压电压被施加到串的第一区域,而第二较大升压电压施加到第二区域。 第一个区域包括用于编程的寻址行或所选字线。 当NAND串被禁止编程时,升压电压被施加到块的NAND串。 以这种方式,可以使第二升压电压更大,而不会对接收到较大升压电压的存储单元造成编程干扰。 通过降低一个或多个边界行上的升压电压,NAND串通道的升压电压被捕获在第一区域内。 然后降低第二升压电压,并将数据施加到NAND串的位线,以选择适当的编程串。 被捕获的电压电位放电或保持在升压状态以进行编程,这取决于是否选择一个串来进行编程,或者被禁止编程。
    • 34. 发明授权
    • EEPROM with split gate source side infection with sidewall spacers
    • 具有裂缝栅源的EEPROM与侧壁间隔件的感染
    • US07071060B1
    • 2006-07-04
    • US09386170
    • 1999-08-31
    • Daniel C. GutermanGheorghe SamachisaYupin Kawing FongEliyahou Harari
    • Daniel C. GutermanGheorghe SamachisaYupin Kawing FongEliyahou Harari
    • H01L21/336
    • H01L27/11521G11C16/0425G11C16/0458G11C16/0491H01L27/115H01L29/7881
    • Novel memory cells utilize source-side injection, allowing very small programming currents. If desired, to-be-programmed cells are programmed simultaneously while not requiring an unacceptably large programming current for any given programming operation. In one embodiment, memory arrays are organized in sectors with each sector being formed of a single column or a group of columns having their control gates connected in common. In one embodiment, a high speed shift register is used in place of a row decoder to serially shift in data for the word lines, with all data for each word line of a sector being contained in the shift register on completion of its serial loading. In one embodiment, speed is improved by utilizing a parallel loaded buffer register which receives parallel data from the high speed shift register and holds that data during the write operation, allowing the shift register to receive serial loaded data during the write operation for use in a subsequent write operation. In one embodiment, a verification is performed in parallel on all to-be-programmed cells in a column and the bit line current monitored. If all of the to-be-programmed cells have been properly programmed, the bit line current will be substantially zero. If bit line current is detected, another write operation is performed on all cells of the sector, and another verify operation is performed. This write/verify procedure is repeated until verification is successful, as detected or substantially zero, bit line current.
    • 新型存储单元利用源侧注入,允许非常小的编程电流。 如果需要,对于任何给定的编程操作,被编程的单元被同时编程,而不需要不可接受的大的编程电流。 在一个实施例中,存储器阵列被组织在扇区中,其中每个扇区由单个列或一组具有共同连接的控制门的列组成。 在一个实施例中,代替行解码器来使用高速移位寄存器来对字线的数据进行串行移位,在其串行加载完成时扇区的每个字线的所有数据都包含在移位寄存器中。 在一个实施例中,通过利用并行加载的缓冲寄存器来提高速度,所述缓冲寄存器从高速移位寄存器接收并行数据,并且在写入操作期间保持该数据,从而允许移位寄存器在写操作期间接收串行加载的数据,以用于 后续写操作。 在一个实施例中,在列中的所有要编程的单元并行地执行验证,并监视位线电流。 如果所有待编程的单元都已被正确编程,则位线电流将基本为零。 如果检测到位线电流,则对扇区的所有单元执行另一写操作,并且执行另一验证操作。 重复此写/验证过程,直到验证成功,如检测到或基本为零,位线电流。
    • 37. 发明授权
    • Steering gate and bit line segmentation in non-volatile memories
    • 非易失性存储器中的转向门和位线分割
    • US06532172B2
    • 2003-03-11
    • US09871333
    • 2001-05-31
    • Eliyahou HarariGeorge SamachisaDaniel C. GutermanJack H. Yuan
    • Eliyahou HarariGeorge SamachisaDaniel C. GutermanJack H. Yuan
    • G11C1604
    • G11C7/18G11C7/12G11C16/0433G11C16/0458G11C16/0491
    • Steering and bit lines (of a flash EEPROM system, for example) are segmented along columns of a memory cell array. In one embodiment, the steering and bit lines of one of their segments are connected at a time to respective global steering and bit lines. The number of rows of memory cells included in individual steering gate segments is a multiple of the number of rows included in individual bit line segments in order to have fewer steering gate segments. This saves considerable circuit area by reducing the number of segment selecting transistors necessary for the steering gates, since these transistors must be larger than those used to select bit line segments in order to handle higher voltages. In another embodiment, local steering gate line segments are combined in order to reduce their number, and the reduced number of each segment is then connected directly with an address decoder, without the necessity of a multiplicity of large switching transistors outside of the decoder to select the segment.
    • 转向和位线(例如,闪存EEPROM系统)沿着存储单元阵列的列进行分段。 在一个实施例中,其一个段的转向和位线一次连接到相应的全局转向和位线。 包括在各个转向门段中的存储单元的行数是单个位线段中包括的行数的倍数,以便具有较少的转向门段。 这通过减少转向门所需的段选择晶体管的数量来节省相当大的电路面积,因为这些晶体管必须大于用于选择位线段以用于处理较高电压的晶体管。 在另一个实施例中,组合本地导向门线段以便减少它们的数量,然后每个段的减少的数量直接与地址解码器相连,而不需要在解码器之外的多个大的开关晶体管来选择 该段。
    • 38. 发明授权
    • Dual floating gate EEPROM cell array with steering gates shared adjacent cells
    • 具有转向门的双浮栅EEPROM单元阵列共享相邻单元
    • US06266278B1
    • 2001-07-24
    • US09634694
    • 2000-08-08
    • Eliyahou HarariDaniel C. GutermanGeorge SamachisaJack H. Yuan
    • Eliyahou HarariDaniel C. GutermanGeorge SamachisaJack H. Yuan
    • G11C1604
    • G11C16/0475G11C11/5621G11C11/5628G11C11/5635G11C11/5642G11C16/0458G11C2211/5612H01L27/115
    • An EEPROM system having an array of memory cells that individually include two floating gates, bit line source and drain diffusions extending along columns, steering gates also extending along columns and select gates forming word lines along rows of floating gates. The dual gate cell increases the density of data that can be stored. Rather than providing a separate steering gate for each column of floating gates, an individual steering gate is shared by two adjacent columns of floating gates that have a diffusion between them. The steering gate is thus shared by two floating gates of different but adjacent memory cells. In one array embodiment, the floating gates are formed on the surface of the substrate, where the added width of the steering gates makes them easier to form, removes them as a limitation upon scaling the array smaller, require fewer electrical contacts along their length because of increased conductance, are easier to contact, and reduces the number of conductive traces that are needed to connect with them. In arrays that erase the floating gates to the select gates, rather than to the substrate, the wider steering gates advantageously uncouple the diffusions they cover from the select gates. This use of a single steering gate for two floating gates also allows the floating gates, in another embodiment, to be formed on side walls of trenches in the substrate with the common steering gate between them, to further increase the density of data that can be stored. Multiple bits of data can also be stored on each floating gate.
    • 具有存储单元阵列的EEPROM系统,其独立地包括两个浮动栅极,沿列延伸的位线源极和漏极扩散,还沿着列延伸的转向栅极以及沿着浮动栅极行沿着形成字线的选择栅极。 双门单元增加了可以存储的数据的密度。 不是为每列浮动栅栏提供单独的转向门,而是由两个相邻的悬浮门之间共享一个单独的转向门,这两个浮动门在它们之间具有扩散。 因此,转向门由不同但相邻的存储单元的两个浮动门共享。 在一个阵列实施例中,浮动栅极形成在基板的表面上,其中增加的转向门的宽度使得它们更容易形成,作为对阵列的缩小的限制,将它们移除,因为它们的尺寸较小,因此需要更少的沿着它们的长度的电触点,因为 增加电导,更容易接触,并减少与它们连接所需的导电迹线的数量。 在将浮动栅极擦除到选择栅极而不是衬底的阵列中,较宽的转向栅极有利地使其从选择栅极覆盖的扩散分离。 单个转向门用于两个浮动栅极的这种使用也允许浮动栅极在另一个实施例中形成在衬底中的沟槽的侧壁上,其间具有公共转向栅极,以进一步增加数据的密度 存储。 多个数据位也可以存储在每个浮动门上。
    • 39. 发明授权
    • Eeprom with split gate source side injection
    • Eeprom采用分闸门源注入
    • US5847996A
    • 1998-12-08
    • US639128
    • 1996-04-26
    • Daniel C. GutermanGheorghe SamachisaYupin Kawing FongEliyahou Harari
    • Daniel C. GutermanGheorghe SamachisaYupin Kawing FongEliyahou Harari
    • G11C17/00G11C11/56G11C16/02G11C16/04H01L21/8247H01L27/115H01L29/423H01L29/788H01L29/792
    • G11C11/5621G11C11/5628G11C11/5635G11C11/5642H01L27/115H01L29/42324H01L29/42328H01L29/7885G11C2211/5634
    • Novel memory cells utilize source-side injection, allowing very small programming currents. If desired, to-be-programmed cells are programmed simultaneously while not requiring an unacceptably large programming current for any given programming operation. In one embodiment, memory arrays are organized in sectors with each sector being formed of a single column or a group of columns having their control gates connected in common. In one embodiment, a high speed shift register is used in place of a row decoder to serially shift in data for the word lines, with all data for each word line of a sector being contained in the shift register on completion of its serial loading. In one embodiment, speed is improved by utilizing a parallel loaded buffer register which receives parallel data from the high speed shift register and holds that data during the write operation, allowing the shift register to receive serial loaded data during the write operation for use in a subsequent write operation. In one embodiment, a verification is performed in parallel on all to-be-programmed cells in a column and the bit line current monitored. If all of the to-be-programmed cells have been properly programmed, the bit line current will be substantially zero. If bit line current is detected, another write operation is performed on all cells of the sector, and another verify operation is performed. This write/verify procedure is repeated until verification is successful, as detected or substantially zero, bit line current.
    • 新型存储单元利用源侧注入,允许非常小的编程电流。 如果需要,对于任何给定的编程操作,被编程的单元被同时编程,而不需要不可接受的大的编程电流。 在一个实施例中,存储器阵列被组织在扇区中,其中每个扇区由单个列或一组具有共同连接的控制门的列组成。 在一个实施例中,代替行解码器来使用高速移位寄存器来对字线的数据进行串行移位,在其串行加载完成时扇区的每个字线的所有数据都包含在移位寄存器中。 在一个实施例中,通过利用并行加载的缓冲寄存器来提高速度,所述缓冲寄存器从高速移位寄存器接收并行数据,并且在写入操作期间保持该数据,从而允许移位寄存器在写操作期间接收串行加载的数据,以用于 后续写操作。 在一个实施例中,在列中的所有要编程的单元并行地执行验证,并监视位线电流。 如果所有待编程的单元都已被正确编程,则位线电流将基本为零。 如果检测到位线电流,则对扇区的所有单元执行另一写操作,并且执行另一验证操作。 重复此写/验证过程,直到验证成功,如检测到或基本为零,位线电流。