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    • 36. 发明授权
    • Optical cavity furnace for semiconductor wafer processing
    • 光腔炉用于半导体晶圆加工
    • US08796160B2
    • 2014-08-05
    • US12919433
    • 2009-03-12
    • Bhushan L. Sopori
    • Bhushan L. Sopori
    • H01L21/26F27D11/12
    • H01L21/324H01L21/67115H05B3/0047
    • An optical cavity furnace 10 having multiple optical energy sources 12 associated with an optical cavity 18 of the furnace. The multiple optical energy sources 12 may be lamps or other devices suitable for producing an appropriate level of optical energy. The optical cavity furnace 10 may also include one or more reflectors 14 and one or more walls 16 associated with the optical energy sources 12 such that the reflectors 14 and walls 16 define the optical cavity 18. The walls 16 may have any desired configuration or shape to enhance operation of the furnace as an optical cavity 18. The optical energy sources 12 may be positioned at any location with respect to the reflectors 14 and walls defining the optical cavity. The optical cavity furnace 10 may further include a semiconductor wafer transport system 22 for transporting one or more semiconductor wafers 20 through the optical cavity.
    • 具有与炉的光腔18相关联的多个光能源12的光腔炉10。 多个光能源12可以是适于产生适当水平的光能的灯或其他装置。 光腔炉10还可以包括一个或多个反射器14和与光能源12相关联的一个或多个壁16,使得反射器14和壁16限定光腔18.壁16可以具有任何期望的构造或形状 以增强作为光腔18的炉的操作。光能源12可以相对于反射器14和限定光腔的壁定位在任何位置。 光腔炉10还可以包括半导体晶片传输系统22,用于将一个或多个半导体晶片20传送通过光腔。
    • 39. 发明授权
    • Laser processing method
    • 激光加工方法
    • US08703582B2
    • 2014-04-22
    • US13160062
    • 2011-06-14
    • Yoshinori Abe
    • Yoshinori Abe
    • H01L21/00H01L21/26H01L21/42H01L21/66
    • H01L33/0095B23K26/40B23K26/53B23K2101/40B23K2103/172B23K2103/50H01L21/268
    • An element-group formation substrate (20) having plural semiconductor light emitting elements (21) formed on a substrate front surface (11a) is sequentially irradiated with a laser beam (64) having a first output from a substrate back surface (11b) side in the y direction, and the laser beam (64) is sequentially collected to a part having a first depth D1 from the substrate back surface (11b), thereby forming a first modified region L1. The substrate (20) having the first modified region L1 formed therein is sequentially irradiated with the laser beam (64) having a third output (
    • 具有形成在基板前表面(11a)上的多个半导体发光元件(21)的元件组形成基板(20)从基板背面(11b)侧依次照射具有第一输出的激光束(64) 沿着y方向,从基板背面(11b)依次将激光束(64)收集到具有第一深度D1的部分,从而形成第一改质区域L1。 在其中形成有第一改质区域L1的基板(20)在y方向上从基板背面11b侧起第三输出(<第一输出)的激光束(64)依次照射, 64)从比第一深度D1浅的衬底背面(11b)顺序收集到具有第三深度D3的部分,从而形成第三改质区域L3。