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    • 41. 发明授权
    • Increased NAND flash memory read throughput
    • 增加NAND闪存读取吞吐量
    • US08174892B2
    • 2012-05-08
    • US13042071
    • 2011-03-07
    • Dzung H. NguyenFrankie F. Roohparvar
    • Dzung H. NguyenFrankie F. Roohparvar
    • G11C16/06
    • G11C16/0483G11C16/26
    • A method of reading sequential pages of flash memory from alternating memory blocks comprises loading data from a first page into a first primary data cache and a second page into a second primary data cache simultaneously, the first and second pages loaded from different blocks of flash memory. Data from the first primary data cache is stored in a first secondary data cache, and data from the second primary data cache is stored in a second secondary data cache. Data is sequentially provided from the first and second secondary data caches by a multiplexer coupled to the first and second data caches.
    • 从交替的存储器块读取闪存的顺序页面的方法包括将数据从第一页面加载到第一主数据高速缓存和第二页面中同时加载到第二主数据高速缓存中,从不同的闪存块加载的第一页和第二页 。 来自第一主数据高速缓存的数据被存储在第一辅助数据高速缓存中,并且来自第二主数据高速缓存的数据被存储在第二次数据高速缓存中。 通过耦合到第一和第二数据高速缓存的多路复用器从第一和第二辅助数据高速缓存顺序地提供数据。
    • 43. 发明授权
    • Methods of forming integrated circuit devices
    • 形成集成电路器件的方法
    • US08164132B2
    • 2012-04-24
    • US13073490
    • 2011-03-28
    • H. Montgomery Manning
    • H. Montgomery Manning
    • H01L27/108
    • H01L28/91H01L27/0207H01L27/10817H01L27/10852
    • The invention includes methods of forming semiconductor constructions and methods of forming pluralities of capacitor devices. An exemplary method of the invention includes forming conductive material within openings in an insulative material to form capacitor electrode structures. A lattice is formed in physical contact with at least some of the electrode structures, a protective cap is formed over the lattice, and subsequently some of the insulative material is removed to expose outer surfaces of the electrode structures. The lattice can alleviate toppling or other loss of structural integrity of the electrode structures, and the protective cap can protect covered portions of the insulative material from the etch. After the outer sidewalls of the electrode structures are exposed, the protective cap is removed. The electrode structures are then incorporated into capacitor constructions.
    • 本发明包括形成半导体结构的方法和形成多个电容器器件的方法。 本发明的示例性方法包括在绝缘材料的开口内形成导电材料以形成电容器电极结构。 形成与至少一些电极结构物理接触的晶格,在晶格上形成保护帽,随后去除一些绝缘材料以暴露电极结构的外表面。 晶格可以减轻电极结构的结构完整性的倾倒或其它损失,并且保护帽可以保护绝缘材料的被覆盖部分免受蚀刻。 在电极结构的外侧壁露出之后,去除保护盖。 然后将电极结构并入电容器结构。
    • 46. 发明授权
    • Memory hub and access method having internal prefetch buffers
    • 具有内部预取缓冲区的内存集线器和访问方法
    • US08127081B2
    • 2012-02-28
    • US12185615
    • 2008-08-04
    • Terry R. LeeJoseph Jeddeloh
    • Terry R. LeeJoseph Jeddeloh
    • G06F12/08
    • G06F12/0862G06F2212/6022G06F2212/6024G06F2212/6026
    • A memory module includes a memory hub coupled to several memory devices. The memory hub includes history logic that predicts on the basis of read memory requests which addresses in the memory devices from which date are likely to be subsequently read. The history logic applies prefetch suggestions corresponding to the predicted addresses to a memory sequencer, which uses the prefetch suggestions to generate prefetch requests that are coupled to the memory devices. Data read from the memory devices responsive to the prefetch suggestions are stored in a prefetch buffer. Tag logic stores prefetch addresses corresponding to addresses from which data have been prefetched. The tag logic compares the memory request addresses to the prefetch addresses to determine if the requested read data are stored in the prefetch buffer. If so, the requested data are read from the prefetch buffer. Otherwise, the requested data are read from the memory devices.
    • 存储器模块包括耦合到多个存储器件的存储器集线器。 存储器集线器包括历史逻辑,该历史逻辑基于读取存储器请求来预测存储器设备中哪个地址可能随后被读取的日期。 历史逻辑将对应于预测地址的预取建议应用于存储器定序器,其使用预取建议来生成耦合到存储器设备的预取请求。 响应于预取建议从存储器件读取的数据被存储在预取缓冲器中。 标签逻辑存储与预取数据的地址对应的预取地址。 标签逻辑将存储器请求地址与预取地址进行比较,以确定所请求的读取数据是否存储在预取缓冲器中。 如果是,则从预取缓冲器读取所请求的数据。 否则,从存储器件读取所请求的数据。
    • 49. 发明授权
    • Distributed write data drivers for burst access memories
    • 用于突发存取存储器的分布式写入数据驱动程序
    • US08107304B2
    • 2012-01-31
    • US12642414
    • 2009-12-18
    • Todd A. MerrittTroy A. Manning
    • Todd A. MerrittTroy A. Manning
    • G11C7/00
    • G11C7/109G06F12/0638G06F2212/2022G11C7/1018G11C7/1021G11C7/1024G11C7/1039G11C7/1045G11C7/1078G11C7/1096G11C11/407
    • An address strobe latches a first address. A burst cycle increments the address internally with additional address strobes. A new memory address is only required at the beginning of each burst access. Read/Write commands are issued once per burst access eliminating toggling Read/Write control line at cycle frequency. Control line transition terminates access and initializes another burst access. Write cycle times are maximized thereby allowing increases in burst mode operating frequencies. Logic near sense amplifiers control write-data drivers thereby providing maximum write times without crossing current during I/O line equilibration. By gating global write-enable signals with global equilibrate signals locally at sense amps, local write-cycle control signals are provided and valid for essentially the entire cycle time minus an I/O line equilibration period in burst access memory. For nonburst mode, write begins following end of equilibration cycle to provide maximum write time without interfering with subsequent access-cycle address setup time.
    • 地址选通锁存第一个地址。 突发周期会在内部增加地址选通信号。 只有在每次突发访问开始时才需要新的内存地址。 读/写命令每次突发存取发出一次,消除了循环频率下的切换读/写控制线。 控制线转换终止访问并初始化另一个突发访问。 写周期时间最大化,从而允许突发模式工作频率的增加。 读出放大器附近的逻辑控制写入数据驱动器,从而在I / O线平衡期间提供最大的写入时间,而无需交叉电流。 通过在感测放大器上本地使用全局平衡信号选通全局写使能信号,提供本地写周期控制信号,并且基本上在整个周期时间内减去突发存取存储器中的I / O线平衡周期。 对于非突发模式,写入开始于平衡周期结束后提供最大写入时间,而不会影响随后的访问周期地址建立时间。