专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

41. 发明授权

US11599094B2 Zone drive of transducers for extended linearity 有权
公开(公告)号：US11599094B2
公开(公告)日：2023-03-07
申请号：US17679194
申请日：2022-02-24
申请人： SIGMASENSE, LLC.
发明人： Patrick Troy Gray , Gerald Dale Morrison , Daniel Keith Van Ostrand , Richard Stuart Seger, Jr.
IPC分类号： G05B19/418 , H04L29/08 , H04L67/12
摘要： An automated system includes transducers, at least one computing device, and at least one automated apparatus. The transducer(s) is/are driven and sensed using drive-sense circuit(s). A drives and senses drive and sense a transducer via a single line, generates a digital signal representative of a sensed analog feature to which the transducer is exposed, and transmits the digital signal to the computing device. The computing device receives digital signals from at least some of drive-sense circuits and process them in accordance with the automation process to produce an automated process command. The automated apparatus executes a portion of an automated process based on the automated process command.

42. 发明授权

US11599080B2 Automation management interface 有权
公开(公告)号：US11599080B2
公开(公告)日：2023-03-07
申请号：US17361138
申请日：2021-06-28
申请人： BEET, Inc.
发明人： David Jingqiu Wang
IPC分类号： G05B23/02 , G05B19/048 , G05B19/418 , G05B19/409 , G05B19/042 , G05B11/01
摘要： A system and method for controlling automation includes a machine performing at least one operation and including a sensor for generating data in response to a performance of the operation by the machine. Data generated by the sensor is stored for retrieval by a server in data memory storage. The server includes at least one display template for displaying the data, and the server generates a data display by populating the at least one display template with the data. The data template can be populated with data in real time, to display the data display immediate to the generation of the data. The display template includes a data feature which is differentiated for displaying the data feature in a mode determined by the data populating the data display. The data display can be displayed in real time by a user device in communication with the server.

43. 发明申请

US20230068908A1 Anomaly Detection and Diagnosis in Factory Automation System using Pre-Processed Time-Delay Neural Network with Loss Function Adaptation 有权
公开(公告)号：US20230068908A1
公开(公告)日：2023-03-02
申请号：US17464901
申请日：2021-09-02
申请人： Mitsubishi Electric Research Laboratories, Inc.
发明人： Jianlin Guo , Bryan Liu , Toshiaki Koike Akino , Ye Wang , Kyeong Jin Kim , Kieran Parsons , Philip Orlik
IPC分类号： G05B23/02 , G05B19/418 , G06K9/62 , G06N3/04
摘要： A computer-implemented pre-processed time-delay autoencoder based anomaly detection method are provided for detecting anomalous states of machines arranged in a factory automation (FA) system or a manufacturing production line. The method includes acquiring source signals from the machines via an interface performing a data pre-processing process for the acquired source signals by normalizing value ranges of the acquired source signals and filtering undesired features from the acquired source signals performing a time-delayed data reform process for the pre-processed source signals based on a time-delay window to generate pre-processed time-delay data submitting pre-processed time-delay testing data to a pre-processed time-delayed autoencoder (Prep-TDAE) neural network, wherein the pre-processed time-delay testing data are collected online while the machines are operated, wherein the Prep-TDAE neural network has been pre-trained by using the pre-processed time-delay training data detecting, if an anomaly state is encountered with respect to the machines, by computing anomaly scores of the pre-processed time-delay testing data, and determining, when the anomaly state is detected, anomaly occurrence time, duration and severity with respect to the anomaly state of each of the machines.

44. 发明申请

US20230064472A1 AUTOMATED SETPOINT GENERATION FOR AN ASSET VIA CLOUD-BASED SUPERVISORY CONTROL 有权
公开(公告)号：US20230064472A1
公开(公告)日：2023-03-02
申请号：US17893932
申请日：2022-08-23
申请人： Honeywell International Inc.
发明人： PETR ENDEL , MICHAL VRANA , KAREL MARIK , RAMAN SAMUSEVICH , VACLAV SLIMACEK
IPC分类号： G05B13/02 , G05B19/418 , G05D23/19
摘要： Various embodiments described herein relate to automated setpoint generation for assets via cloud-based supervisory control. In this regard, a request to perform supervisory control with respect to an asset is received. The request comprises an asset identifier indicating an identity of the asset. In response to the request, one or more setpoints for the asset is determined based on the asset identifier. Also in response to the request, comfort constraint data indicative of one or more comfort constraints for an environment associated with the asset is determined based on the asset identifier. Furthermore, the one or more setpoints for the asset is adjusted based on the comfort constraint data.

45. 发明申请

US20230063387A1 OPERATION APPARATUS MONITORING SYSTEM AND OPERATION APPARATUS 有权
公开(公告)号：US20230063387A1
公开(公告)日：2023-03-02
申请号：US17887516
申请日：2022-08-15
申请人： NORITZ CORPORATION
发明人： Kazuhiro NISHIMURA , Kenichi NAKAYAMA , Toshihiko HAMAGAMI , Daisuke HIROTA , Hiroyuki KATSURAGAWA , Naoki TSUDA , Yoshifumi ATOBE , Michihiro KANBAYASHI
IPC分类号： G05B19/418 , G06F11/30
摘要： An operation apparatus monitoring system includes an operation apparatus as a monitoring target. The operation apparatus includes a control part capable of executing control of acquiring multiple pieces of apparatus information associated with an operation status and periodically transmitting acquired data of the multiple pieces of apparatus information to a monitoring apparatus. In the control part, multiple groups are set, and data of the multiple pieces of apparatus information are grouped to belong to at least one of the multiple groups and are stored. Transmission of data of the multiple pieces of apparatus information to the monitoring apparatus is executed according to a sequence of data transmission to the monitoring apparatus determined for each group.

46. 发明申请

US20230063192A1 Semiconductor Analysis System 有权
公开(公告)号：US20230063192A1
公开(公告)日：2023-03-02
申请号：US17797225
申请日：2020-02-27
申请人： Hitachi High-Tech Corporation
发明人： Yudai KUBO , Tsunenori NOMAGUCHI , Hiroyuki CHIBA
IPC分类号： H01L21/67 , H01J37/28 , H01J37/244 , H01J37/26 , H01J37/20 , H01J37/305 , G05B19/418
摘要： A semiconductor analysis system includes a machining device that machines semiconductor wafer to prepare a thin film sample for observation, a transmission electron microscope device that acquires a transmission electron microscope image of the thin film sample, and a host control device that controls the machining device and the transmission electron microscope device. The host control device evaluates the thin film sample based on the transmission electron microscope image, updates machining conditions based on an evaluation result of the thin film sample, and outputs the updated machining conditions to the machining device.

47. 发明申请

US20230060254A1 GAS AMOUNT PREDICTION METHOD, FACTORY OPERATION METHOD, AND GAS AMOUNT PREDICTION DEVICE 有权
公开(公告)号：US20230060254A1
公开(公告)日：2023-03-02
申请号：US17797023
申请日：2021-02-02
申请人： JFE STEEL CORPORATION
发明人： Katsuya SUZUKI , Shuji KUYAMA , Aoto MIYAZAKI
IPC分类号： F22B37/38 , G05B19/418
摘要： A gas amount prediction method predicts an amount of gas generated in a factory, and includes a generation amount calculation step of calculating a generation amount of actually usable gas by using a learning model that has learned a relationship between a generation amount of the gas and a use amount of the gas in past operation data.

48. 发明授权

US11593736B2 Method for production planning 有权
公开(公告)号：US11593736B2
公开(公告)日：2023-02-28
申请号：US16636447
申请日：2018-08-03
申请人： SIEMENS AKTIENGESELLSCHAFT
发明人： Steffen Lamparter , Matthias Loskyll
IPC分类号： G06Q10/06 , G06Q50/04 , G05B19/418 , G06Q10/0631 , G06Q10/0633
摘要： The invention relates to a production planning method using a plurality of manufacturing devices (INTMA) according to which tasks (TD) of a work plan (BOP) are compared (MA) with manufacturing capabilities (SD) of the manufacturing devices (INTMA) and, depending on the one or more results (MAQ) of said comparison (MA), at least one or more manufacturing devices (INTMA) are commissioned to match their manufacturing capabilities (SD) with the task(s) (TD).

49. 发明申请

US20230059686A1 METHODS OF HEALTH DEGRADATION ESTIMATION AND FAULT ISOLATION FOR SYSTEM HEALTH MONITORING 有权
公开(公告)号：US20230059686A1
公开(公告)日：2023-02-23
申请号：US17407047
申请日：2021-08-19
申请人： Garrett Transportation I Inc.
发明人： Tomas Poloni , Paul Dickinson , Jaroslav Pekar
IPC分类号： G05B23/02 , G05B19/418 , F02D41/00
摘要： Methods and systems for fault identification and mitigation in an engine system. A state observer obtains current state information from the engine system, and a feature calculator uses data obtained from the state observer to calculate one or more feature indicators, which are monitored by a health estimator for the occurrence of a change using one or more change probability models. When the health estimator identifies a change, a fault isolator determines a component of the engine system that is subject to fault or health deterioration.

50. 发明申请

US20230056329A1 CONTROL APPARATUS, CONTROL METHOD, AND PROGRAM 有权
公开(公告)号：US20230056329A1
公开(公告)日：2023-02-23
申请号：US17797257
申请日：2021-02-04
申请人： DAICEL CORPORATION
发明人： Masahiro HAITSUKA , Hidetoshi KOZONO , Fumihiro MIYOSHI
IPC分类号： G05B19/418
摘要： To accurately obtain operating conditions of a production facility that satisfies desired criteria. A control apparatus includes a process data acquisition unit that reads process data from a storage device that stores the process data obtained from a production facility, and a control unit that obtains an optimum solution for a predetermined adjustment target of the process data and controls the production facility on the basis of the optimum solution. The optimum solution satisfies constraint conditions and optimizes an objective function. The constraint conditions are defined by using at least some of the process data. The objective function is defined by using at least some of the process data. A learned model having learned features of the process data obtained from the production facility is further stored in a storage device on the basis of causality information that defines a combination of first process data and second process data. The first process data is used as an explanatory variable. The second process data is used as a response variable. The constraint conditions include a condition that the second process data or a value corresponding to the second process data is a value calculated by using the first process data and the learned model, and an upper limit or a lower limit for at least some of the process data.

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式