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51. 发明申请

US20050210665A1 Tray for storing and transporting semi-conductor and other microelectronic components 审中-公开
标题翻译：用于存储和运输半导体和其他微电子元件的托盘
公开(公告)号：US20050210665A1
公开(公告)日：2005-09-29
申请号：US10811321
申请日：2004-03-25
申请人： James Nigg , Will Harrison
发明人： James Nigg , Will Harrison
IPC分类号： G01R1/00 , H01L21/673
CPC分类号： H01L21/67336 , Y10T29/53091 , Y10T29/53174
摘要： A chip tray of the present invention includes on its underside a resilient sheet member that resiliently retains microelectronic components in the chip tray below by pressing gently but firmly down on the microelectronic components and the separators between cavities that contain the components.
摘要翻译：本发明的芯片托盘在其下侧包括弹性片材构件，该弹性片材构件通过轻轻地压紧微电子部件和包含部件的空腔之间的分隔件将微电子部件弹性地保持在芯片托盘的下方。

52. 发明申请

US20050210650A1 System and method for disassembling scrapped vehicle 审中-公开
标题翻译：拆卸报废车辆的系统和方法
公开(公告)号：US20050210650A1
公开(公告)日：2005-09-29
申请号：US11010008
申请日：2004-12-10
申请人： Won Bae Lee
发明人： Won Bae Lee
IPC分类号： B23P19/04 , B07B13/00 , B09B3/00 , B23P21/00 , B62D67/00 , G01R1/00
CPC分类号： B62D67/00 , Y02W30/56 , Y10T29/49751 , Y10T29/49755 , Y10T29/49819 , Y10T29/53043 , Y10T29/534
摘要： The present invention relates to a system and method for disassembling scrapped vehicles in which multiple process-based facilities are provided in series on one path for performing each disassembling process from a loading process of a scrapped vehicle to a final vehicle body compression process. The scrapped vehicles are moved along the path while mounted on a truck that moves the vehicles via a transfer rail. The truck that has completed a transfer is lowered into the interior of a tunnel beneath the path and transferred back to the position where the first process was performed.
摘要翻译：本发明涉及一种用于拆卸报废车辆的系统和方法，其中在一个路径上串联提供多个基于过程的设施，用于从报废车辆的加载过程到最终车身压缩过程进行每个拆卸过程。报废的车辆沿着路径移动，同时安装在通过传送轨道移动车辆的卡车上。已经完成转移的卡车下降到路径下方的隧道内部，并转移回到执行第一个过程的位置。

53. 发明申请

US20050174105A1 Testing apparatus 有权
标题翻译：测试仪器
公开(公告)号：US20050174105A1
公开(公告)日：2005-08-11
申请号：US10776030
申请日：2004-02-10
申请人： Kunihiro Matsuura , Hiroki Ando , Hironori Tanaka , Yasuhiro Urabe , Satoshi Kodera
发明人： Kunihiro Matsuura , Hiroki Ando , Hironori Tanaka , Yasuhiro Urabe , Satoshi Kodera
IPC分类号： G01R1/00 , G01R31/28 , G01R31/319 , H03F1/34 , H03F3/30
CPC分类号： H03F3/3018 , G01R31/2851 , G01R31/31924 , H03F1/342
摘要： A testing apparatus includes a first power supply unit for generating a current to be supplied to the device under test and first and second coaxial cables through which the current generated by the first power supply unit is supplied to the device under test, wherein the first power supply unit includes a current detecting unit for detecting an amount of a voltage drop when the current generated by the first power supply unit passes through a predetermined resistor and a current controlling unit for controlling the current being supplied to the device under test in response to the amount of the voltage drop detected by the current detecting unit, the first coaxial cable includes a first internal conductor for conducting the current from the first power supply unit towards the device under test and a first external conductor provided around the first internal conductor with an insulator interposed therebetween for conducting the current from the device under test towards the first power supply unit, and the second coaxial cable includes a second internal conductor for conducting the current from the device under test towards the first power supply unit and a second external conductor around the first internal conductor with an insulator interposed therebetween for conducting the current from the first power supply unit towards the device under test.
摘要翻译：测试装置包括：第一电源单元，用于产生要供给到被测器件的电流;以及第一和第二同轴电缆，由第一电源单元产生的电流通过该第一和第二同轴电缆提供给被测器件，其中第一功率供电单元包括电流检测单元，用于当由第一电源单元产生的电流通过预定电阻器时检测电压降的量;以及电流控制单元，用于响应于所述电流控制单元控制供应给被测设备的电流由电流检测单元检测的电压降的量，第一同轴电缆包括用于将来自第一电源单元的电流传导到被测器件的第一内部导体，以及设置在第一内部导体周围的第一外部导体，绝缘体插入其间以将来自被测器件的电流传导到第一电源 r供电单元，并且第二同轴电缆包括用于将来自被测器件的电流传导到第一电源单元的第二内部导体，以及围绕第一内部导体的第二外部导体，其间插入绝缘体，用于将电流从第一个供电单元朝向被测设备。

54. 发明申请

US20050168212A1 Optical testing of integrated circuits with temperature control 失效
标题翻译：具有温度控制的集成电路的光学测试
公开(公告)号：US20050168212A1
公开(公告)日：2005-08-04
申请号：US10993090
申请日：2004-11-18
申请人： Dean Hunt , Don Haga
发明人： Dean Hunt , Don Haga
IPC分类号： G01R31/28 , G01R31/311 , G01R31/316 , G01R1/00
CPC分类号： G01R31/311 , G01R31/2891
摘要： Method and apparatus for optically testing (e.g., using a laser beam) an operating integrated circuit (device under test—DUT) that actively control the operating temperature of the DUT. This is chiefly useful with flip-chip packaged ICs. The temperature of the DUT varies with its operating power consumption, and this fluctuation in temperature adversely affects the results obtained during optical probing or other optical testing. Furthermore, the DUT may be damaged if its temperature exceeds design limits. The temperature of the DUT is controlled by thermally contacting the exposed backside surface of the DUT die to a diamond film heat conductor, an associated heat sink structure, and at least one thermoelectric device. The thermoelectric device is controlled by a temperature sensor proximal to the DUT. By controlling the amount and direction of the electrical current supplied to the thermoelectric device in response to the sensed temperature, the temperature of the DUT is maintained.
摘要翻译：用于光学测试（例如，使用激光束）用于主动控制DUT的工作温度的操作集成电路（被测器件）的方法和装置。这主要用于倒装芯片封装IC。 DUT的温度随其工作功耗而变化，这种温度波动对光探测或其他光学测试中获得的结果产生不利影响。此外，如果DUT的温度超过设计限制，则DUT可能会被损坏。 DUT的温度通过将DUT的裸露背面与金刚石膜热导体，相关联的散热器结构和至少一个热电装置热接触来控制。热电装置由靠近DUT的温度传感器控制。通过控制响应于感测温度供应到热电装置的电流的量和方向，保持DUT的温度。

55. 发明申请

US20050127898A1 Stage driving apparatus and probe method 有权
标题翻译：舞台驱动装置和探头方法
公开(公告)号：US20050127898A1
公开(公告)日：2005-06-16
申请号：US11041284
申请日：2005-01-25
申请人： Haruhiko Yoshioka
发明人： Haruhiko Yoshioka
IPC分类号： G01R31/26 , G01R1/06 , G01R31/28 , G01R31/319 , H01L21/66 , H01L21/68 , H02N2/00 , G01R1/00
CPC分类号： G01R31/2887
摘要： A stage driving apparatus for a stage of this invention includes a horizontal driving mechanism which moves in a horizontal direction a stage to place a wafer thereon, and an elevating mechanism which moves the stage in a vertical direction. The elevating mechanism has a first elevating mechanism which supports the horizontal driving mechanism and vertically moves the horizontal driving mechanism, and a second elevating mechanism which supports the stage on the horizontal driving mechanism and vertically moves the stage over a short distance with a piezoelectric element.
摘要翻译：本发明的舞台驱动装置包括：水平驱动机构，其在水平方向上移动用于在其上放置晶片的台阶;以及升降机构，其在垂直方向上移动台。升降机构具有支撑水平驱动机构并使水平驱动机构垂直移动的第一升降机构，以及在水平驱动机构上支撑台架并使其与压电元件在短距离上垂直移动的第二升降机构。

56. 发明申请

US20050088169A1 Compensation for test signal degradation due to DUT fault 失效
公开(公告)号：US20050088169A1
公开(公告)日：2005-04-28
申请号：US10979059
申请日：2004-11-01
申请人： Charles Miller
发明人： Charles Miller
IPC分类号： G01R31/28 , G01R31/00 , G01R31/26 , G01R31/317 , G01R31/319 , G01R1/00
CPC分类号： G01R31/3191 , G01R31/31723 , G01R31/31908 , G01R31/31924
摘要： An electronic device tester channel transmits a single test signal to multiple terminals of electronic devices under test (DUTs) through a set of isolation resistors. The tester channel employs feedback to automatically adjust the test signal voltage to compensate for affects of faults at any of the DUT terminals to prevent the faults from substantially affecting the test signal voltage.

57. 发明申请

US20050083038A1 Apparatus and method for the testing of circuit boards, and test probe for this apparatus and this method 失效
标题翻译：用于测试电路板的装置和方法以及该装置的测试探头和该方法
公开(公告)号：US20050083038A1
公开(公告)日：2005-04-21
申请号：US10981079
申请日：2004-11-04
申请人： Uwe Rothaug , Oleh Yuschuk
发明人： Uwe Rothaug , Oleh Yuschuk
IPC分类号： G01R1/06 , G01R1/067 , G01R31/28 , G01R1/00
CPC分类号： G01R31/2808 , G01R1/06794
摘要： An apparatus and a method for the testing of circuit boards, together with a test probe for this apparatus and this method, in which the contact tips of a test finger of a finger tester are monitored during the testing process by an optical detection device and their movement, at least when approaching a part of the circuit board test points of a circuit board to be tested, is corrected on the basis of the result determined by the optical detection device in such a way that the contact tip makes reliable contact with the circuit board test point concerned. The correction data hereby obtained may be used in the calculation of calibration data.
摘要翻译：一种用于测试电路板的装置和方法，以及用于该装置和该方法的测试探针，其中在测试过程中通过光学检测装置监测手指测试仪的测试手指的接触尖端，并且它们至少当接近待测试电路板的电路板测试点的一部分时，基于由光学检测装置确定的结果以使得接触尖端与电路可靠接触的方式进行校正板测试点。此处获得的校正数据可用于计算校准数据。

58. 发明申请

US20050073329A1 Method and apparatus for enabling reliable testing of printed circuit assemblies using a standard flying prober system 有权
标题翻译：使用标准飞行探测系统实现对印刷电路组件的可靠测试的方法和设备
公开(公告)号：US20050073329A1
公开(公告)日：2005-04-07
申请号：US10953161
申请日：2004-09-29
申请人： Robert Russell
发明人： Robert Russell
IPC分类号： G01R31/28 , G01R1/00
CPC分类号： G01R31/2808
摘要： A method and apparatus allows adapting a standard flying prober system to probe test point targets on Printed Circuit Assemblies (PCAs) having irregularities in their planarity. The method and apparatus involves positioning a camera utilized by the prober system to predetermined offset positions relative to previously established test and/or other points for sets of images. Each set of images is processed by determining offsets in coordinates needed to align the images in a predetermined manner. The offsets for each measured point are translated into actual height values to be used during subsequent testing of a PCA.
摘要翻译：一种方法和装置允许使标准飞行探测器系统适应于在其平面度上具有不规则性的印刷电路组件（PCA）上探测测试点目标。该方法和装置包括将探测器系统使用的相机相对于先前建立的测试和/或用于图像集合的其它点定位到预定的偏移位置。通过确定以预定方式对准图像所需的坐标中的偏移来处理每组图像。每个测量点的偏移量被转换成在随后的PCA测试期间使用的实际高度值。

59. 发明授权

US06874227B2 Method for packaging an image sensor 失效
标题翻译：包装图像传感器的方法
公开(公告)号：US06874227B2
公开(公告)日：2005-04-05
申请号：US10454649
申请日：2003-06-03
申请人： Chung Hsien Hsin , Hsiu-Wen Tu , Jason Chuang , Irving You
发明人： Chung Hsien Hsin , Hsiu-Wen Tu , Jason Chuang , Irving You
IPC分类号： G01R1/00 , H01L27/146 , H05K3/30
CPC分类号： H01L27/14685 , H01L27/14618 , H01L2224/48091 , H01L2224/48227 , H01L2924/16195 , Y10T29/49004 , Y10T29/49117 , Y10T29/4913 , Y10T29/49131 , Y10T29/49144 , Y10T29/49169 , H01L2924/00014
摘要： A method for packaging an image sensor includes the steps of: providing a substrate having an upper surface and a lower surface; mounting a frame layer to the upper surface of the substrate to form a chamber together with the substrate; mounting a photosensitive chip to the upper surface of the substrate and within the chamber, and electrically connecting the photosensitive chip to the substrate; mounting a transparent layer to the frame layer with a B-stage adhesive applied therebetween; pre-baking the B-stage adhesive to slightly adhere the transparent layer to the frame layer; testing the image sensor to determine whether the image sensor is passed or failed; and post-baking the passed image sensor to completely cure the B-stage adhesive so that the transparent layer is firmly adhered to the frame layer.
摘要翻译：包装图像传感器的方法包括以下步骤：提供具有上表面和下表面的基底; 将框架层安装到基板的上表面以与基板一起形成室; 将光敏芯片安装到基板的上表面和室内，并将感光芯片电连接到基板上; 在其间施加B阶粘合剂将透明层安装到框架层; 预烘烤B阶粘合剂以将透明层稍微粘附到框架层; 测试图像传感器以确定图像传感器是否通过或失败; 并且对通过的图像传感器进行后烘烤以完全固化B级粘合剂，使得透明层牢固地粘附到框架层。

60. 发明申请

US20050068192A1 System for the remote acquisition of the electric energy consumptions and for the remote control of the distributed targets of users, also of domestic type 有权
标题翻译：系统用于远程采集电能消耗和远程控制用户分布式目标，也属于国内类型
公开(公告)号：US20050068192A1
公开(公告)日：2005-03-31
申请号：US10499691
申请日：2002-12-20
申请人： Sergio Rogai
发明人： Sergio Rogai
IPC分类号： G08C15/00 , G01D4/00 , G01R1/00 , G01R21/133 , G01R22/00 , G06Q50/00 , H02J13/00 , H04Q9/00 , G08C15/06 , G08B23/00
CPC分类号： G01D4/004 , G01R21/1333 , G01R22/00 , Y02B90/242 , Y02B90/246 , Y04S20/322 , Y04S20/42
摘要： A system for the remote acquisition of data and for the remote control of electricity meters comprises a central server AMM in bi-directional communication with a plurality of concentrators. To each concentrator, a set of electricity meters is connected, such that bidirectional communication between each meter and its associated concentrator is possible. The intelligence of the system is distributed between the central server, the concentrators and the electricity meters. To this end, each meter comprises at least a first processor, a first data memory and a first program memory for bi-directional communication with the associated concentrator. The first data memory serves to at least temporarily store and/or transmit the data which have already undergone a first processing by the first processor. Each of the concentrators comprises a second processor, a second program memory and a second data memory as well as means for a bi-directional communication with a central server. The second data memory serves to temporarily store and/or transmit the data processed by the second processor.
摘要翻译：用于远程采集数据和远程控制电表的系统包括与多个集中器双向通信的中央服务器AMM。对于每个集中器，连接一组电表，使得每个仪表与其相关联的浓缩器之间的双向通信是可能的。系统的智能分布在中央服务器，集中器和电表之间。为此，每个仪表至少包括第一处理器，第一数据存储器和用于与相关联的浓缩器双向通信的第一程序存储器。第一数据存储器用于至少临时存储和/或发送已经由第一处理器进行第一处理的数据。每个集中器包括第二处理器，第二程序存储器和第二数据存储器以及用于与中央服务器的双向通信的装置。第二数据存储器用于临时存储和/或发送由第二处理器处理的数据。

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