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    • 63. 发明授权
    • Inspection system with material identification
    • 检验系统具有物料鉴定
    • US07519152B2
    • 2009-04-14
    • US11453546
    • 2006-06-14
    • Richard C. SmithRobert W. MaddenJames M. Connelly
    • Richard C. SmithRobert W. MaddenJames M. Connelly
    • G21K5/10G21K1/04G01K1/00
    • G01V5/0025G01N23/20G01V5/0016G21K1/02
    • An angular analysis system that can be controlled to receive radiation at a defined angle from a defined focus region. The angular analysis system is used for level 2 inspection in an explosive detection system. Level 2 inspection is provided by a three-dimensional inspection system that identifies suspicious regions of items under inspection. The angular analysis system is focused to gather radiation scattered at defined angles from the suspicious regions. Focusing may be achieved in multiple dimensions by movement of source and detector assemblies in a plane parallel to a plane holding the item under inspection. Focusing is achieved by independent motion of the source and detector assemblies. This focusing arrangement provides a compact device, providing simple, low cost and accurate operation.
    • 角度分析系统,其可以被控制以从限定的聚焦区域以规定的角度接收辐射。 角度分析系统用于爆炸物检测系统的二级检查。 二级检查由三维检查系统提供,用于识别被检查物品的可疑区域。 角度分析系统集中在收集从可疑区域以规定角度散射的辐射。 聚焦可以通过源和检测器组件在平行于保持被检查物品的平面的平面中移动而在多个维度上实现。 聚焦通过源和检测器组件的独立运动来实现。 该聚焦装置提供了紧凑的装置,提供简单,低成本和准确的操作。