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    • 78. 发明授权
    • Cross point memory array exhibiting a characteristic hysteresis
    • 具有特征滞后的交叉点存储器阵列
    • US06992922B2
    • 2006-01-31
    • US11047952
    • 2005-01-31
    • Darrell Rinerson
    • Darrell Rinerson
    • G11C11/00
    • G11C13/0007G11C11/5685G11C2213/31G11C2213/77
    • Providing a cross point memory array with memory plugs exhibiting a characteristic hysteresis. The memory plugs exhibit a hysteresis that, in the low resistive state, the first write threshold voltage is the point above which any voltages applied across the memory plug have substantially no effect on the resistive state and below which a voltage pulse will alter the resistance of the memory plug. Similarly, in the high resistive state, the second write threshold voltage is the point below which any voltages applied across the memory plug have substantially no effect on the resistive state and above which a voltage pulse will alter the resistance of the memory plug. The read voltages applied to the memory plug are typically above the first write threshold voltage and lower than the second write threshold voltage.
    • 提供具有表现出特征滞后的存储插件的交叉点存储器阵列。 存储插头表现出滞后现象,在低电阻状态下,第一写入阈值电压是高于其上施加在存储器插头上的任何电压对电阻状态基本上没有影响的点,低于该电压脉冲将改变电阻 内存插头。 类似地,在高电阻状态下,第二写入阈值电压是低于施加在存储器插头上的任何电压对电阻状态基本上没有影响的点,并且高于该电压脉冲将改变存储器插头的电阻。 施加到存储器插头的读取电压通常高于第一写入阈值电压并低于第二写入阈值电压。