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    • 85. 发明申请
    • Delay-locked loop and a method of testing a delay-locked loop
    • 延迟锁定环路和测试延迟锁定环路的方法
    • US20050280407A1
    • 2005-12-22
    • US10869582
    • 2004-06-16
    • Alvin LokeMichael Joseph GilsdorfPeter MeierJeffrey R. Rearick
    • Alvin LokeMichael Joseph GilsdorfPeter MeierJeffrey R. Rearick
    • G01R23/175H03L7/06H03L7/07H03L7/081
    • H03L7/07H03L7/0812
    • A delay-locked loop (DLL) of an integrated circuit (IC) with testing circuitry and a method for testing a DLL. During test mode, a phase comparator of the DLL receives a test clock in place of the reference clock and determines the phase difference between the test clock and the clock fed back to the DLL from a clock buffer tree. A variable delay element of the DLL then shifts the reference clock in time by an amount that depends on that phase difference. The variable delay element can be exercised by varying the phase of the test clock with respect to the reference clock by a known phase offset to cause the variable delay element to produce a range of delays. Whether the variable delay element is functioning properly can be determined by checking whether the phase of the test clock is aligned with the phase of the feedback clock.
    • 具有测试电路的集成电路(IC)的延迟锁定环(DLL)和用于测试DLL的方法。 在测试模式期间,DLL的相位比较器代替参考时钟接收测试时钟,并从时钟缓冲器树中确定测试时钟与反馈到DLL的时钟之间的相位差。 然后,DLL的可变延迟元件将参考时钟在时间上移动取决于该相位差的量。 可以通过将测试时钟相对于参考时钟的相位改变已知的相位偏移来使可变延迟元件产生延迟范围来实现可变延迟元件。 可以通过检查测试时钟的相位是否与反馈时钟的相位对准来确定可变延迟元件是否正常工作。
    • 88. 发明授权
    • Method and apparatus for adjusting the timing of signals over fine and coarse ranges
    • 用于在精细和粗略范围内调整信号定时的方法和装置
    • US06959016B1
    • 2005-10-25
    • US09633552
    • 2000-08-07
    • Brent KeethTroy A. Manning
    • Brent KeethTroy A. Manning
    • G06F1/10G11C7/22H03K5/13H03L7/07H03L7/081H04J3/06
    • G06F1/10G11C7/22G11C2207/2281G11C2207/229H03K5/131H03L7/07H03L7/0812
    • A variable delay circuit is formed by a fine delay circuit and a coarse delay circuit. The fine delay circuit adjusts the delay of a delayed clock signal in relatively small phase increments with respect to an input clock signal. The coarse delay circuit adjusts the timing of a digital signal in relatively large phase increments. The delayed clock signal is used to clock a register to which the digital signal is applied to control the timing a the digital signal clocked through the register responsive to adjusting the timing of the fine delay circuit and the coarse delay circuit. The timing relationship is initially adjusted by altering the delay of the fine delay circuit. Whenever the maximum or minimum delay of the fine delay circuit is reached, the coarse delay circuit is adjusted. The variable delay circuit may be used in a memory device to control the timing at which read data is applied to the data bus of the memory device. The fine delay circuit includes a multi—tapped delay line coupled to a multiplexer that selects one of the taps for use in generating the delayed clock. When the first or last tap is selected, the timing of the coarse delay circuit is adjusted. The coarse delay circuit includes a counter that generates the digital signal upon counting from an initial count to the terminal count. The coarse delay circuit is adjusted by adjusting the initial count of the counter.
    • 可变延迟电路由精细延迟电路和粗略延迟电路构成。 精细延迟电路相对于输入时钟信号以相对小的相位增量调整延迟时钟信号的延迟。 粗延迟电路以相对大的相位增量来调整数字信号的定时。 延迟时钟信号用于对应用数字信号的寄存器进行时钟,以响应于调整精细延迟电路和粗略延迟电路的定时来控制通过寄存器定时的数字信号的定时。 最初通过改变精细延迟电路的延迟来调整定时关系。 每当达到精细延迟电路的最大或最小延迟时,调整粗略延迟电路。 可变延迟电路可以用于存储器件中以控制将读取数据应用于存储器件的数据总线的定时。 精细延迟电路包括耦合到多路复用器的多抽头延迟线,其选择一个抽头用于产生延迟的时钟。 当选择第一或最后一个抽头时,调整粗延迟电路的定时。 粗延迟电路包括从初始计数到终端计数的计数时产生数字信号的计数器。 通过调整计数器的初始计数来调整粗略延迟电路。