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1. 发明授权

US08467260B2 Structure and method for storing multiple repair pass data into a fusebay 有权
标题翻译：用于将多个修复传递数据存储到保险丝盒中的结构和方法
公开(公告)号：US08467260B2
公开(公告)日：2013-06-18
申请号：US13198894
申请日：2011-08-05
申请人： Kevin W. Gorman , Michael R. Ouellette , Michael A. Ziegerhofer
发明人： Kevin W. Gorman , Michael R. Ouellette , Michael A. Ziegerhofer
IPC分类号： G11C17/16
CPC分类号： G11C17/16 , G11C29/785 , G11C29/802
摘要： Fuse macros of identical number of pages are serially arranged to form the same number of fusebay pages each having a length equal to the sum of the respective fuse macro page lengths. Each fuse macro has an enable latch configured to allow activation of one fuse macro at a time. A fusebay control device connected to a repair register may store data in and retrieve data from the fusebay. Next available fuse location is determined in programming mode so that data from a next repair pass may start where the last data ended.
摘要翻译：相同页数的保险丝宏串联地形成相同数量的保险丝页，每个保险丝页的长度等于相应的熔丝宏页面长度之和。每个保险丝宏都有一个使能锁存器，配置为允许一次激活一个保险丝宏。连接到维修寄存器的保险丝控制装置可以将数据存储在保险丝盒中并从熔丝座检索数据。在编程模式下确定下一个可用的熔丝位置，以便下一个维修通过的数据可以在最后一个数据结束的地方开始。

2. 发明申请

US20090158092A1 SYSTEM AND METHOD FOR INDICATING STATUS OF AN ON-CHIP POWER SUPPLY SYSTEM 有权
标题翻译：用于表示片上电源系统的状态的系统和方法
公开(公告)号：US20090158092A1
公开(公告)日：2009-06-18
申请号：US11958680
申请日：2007-12-18
申请人： Darren L. Anand , John A. Fifield , Kevin W. Gorman
发明人： Darren L. Anand , John A. Fifield , Kevin W. Gorman
IPC分类号： G06F11/07 , G06F11/30
CPC分类号： G01R19/16552 , G11C11/401 , G11C29/02 , G11C29/021 , G11C29/44 , G11C2029/0401 , G11C2029/4402
摘要： The status of multiple on-chip power supply systems is indicated for use in modifying chip test flow and diagnosing chip failure. Digital compliance signals are received, each compliance signal associated with one of multiple on-chip power supplies. Each power supply has an associated compliance level, and each compliance signal indicates whether its associated power supply is operating at the associated compliance level. The compliance signals are converted into a power supply status signal indicating status of the compliance signals associated with the power supply. The power supply status signal is output. If a power supply is operating at its associated compliance level, the output power supply status signal indicates that the power supply is passing. If the power supply is not operating at its associated compliance level, the output power supply status signal indicates that the power supply is failing. If a power supply is failing, a memory test may be aborted, simplifying chip failure diagnosis.
摘要翻译：多片式电源系统的状态被指示用于修改芯片测试流程和诊断芯片故障。接收数字符合性信号，每个合规信号与多个片上电源之一相关联。每个电源具有相关的合规级别，并且每个合规信号指示其相关联的电源是否以相关联的合规级别运行。合规信号被转换成指示与电源相关联的符合性信号的状态的电源状态信号。输出电源状态信号。如果电源工作在相关的合规级别，则输出电源状态信号表示电源正在通过。如果电源不在其相关的合规级别运行，则输出电源状态信号表示电源出现故障。如果电源出现故障，可能会中断内存测试，从而简化了芯片故障诊断。

3. 发明申请

US20080165599A1 DESIGN STRUCTURE USED FOR REPAIRING EMBEDDED MEMORY IN AN INTEGRATED CIRCUIT 审中-公开
标题翻译：用于在集成电路中修复嵌入式存储器的设计结构
公开(公告)号：US20080165599A1
公开(公告)日：2008-07-10
申请号：US11967324
申请日：2007-12-31
申请人： Kevin W. Gorman
发明人： Kevin W. Gorman
IPC分类号： G11C29/00
CPC分类号： G11C29/44 , G11C29/16 , G11C29/4401 , G11C29/70 , G11C2029/0401 , G11C2029/1208 , G11C2029/3602
摘要： A design structure for correcting embedded memory that has been identified as being defective by a memory controller. The address of the defective memory is provided by the memory controller to Built-In Test (BIST) logic in combination with a Built-In Redundancy Analyzer (BIRA) to replace the defective memory element with a redundant element.
摘要翻译：用于校正被存储器控制器识别为有缺陷的嵌入式存储器的设计结构。有缺陷的存储器的地址由存储器控制器提供给内置测试（BIST）逻辑与内置冗余分析器（BIRA）的组合，以用冗余元件替换有缺陷的存储器元件。

4. 发明授权

US08582351B2 Methods and systems for adjusting wordline up-level voltage to improve production yield relative to SRAM-cell stability 有权
标题翻译：用于调整字线上电压的方法和系统，以提高相对于SRAM单元稳定性的产量
公开(公告)号：US08582351B2
公开(公告)日：2013-11-12
申请号：US12892191
申请日：2010-09-28
申请人： Igor Arsovski , George M. Braceras , Kevin W. Gorman , Robert M. Houle , Harold Pilo
发明人： Igor Arsovski , George M. Braceras , Kevin W. Gorman , Robert M. Houle , Harold Pilo
IPC分类号： G11C11/00
CPC分类号： G11C11/413 , G11C8/08
摘要： Methods of setting wordline up-level voltage in as-fabricated SRAM. In one example, the method includes determining the relative speed, or strength, of 1) the combination of the pass-gate and pull-down devices and 2) the pull-up devices in the bitcells of the SRAM. These relative strengths are then used to adjust the wordline up-level voltage, if needed, to decrease the likelihood of the SRAM experiencing a stability failure. Corresponding systems are provided for determining the relative strengths of the devices of interest, for determining the amount of up-level voltage adjustment needed, and for selecting and setting the up-level voltage.
摘要翻译：在制造的SRAM中设置字线上电压的方法。在一个示例中，该方法包括确定1）通过栅极和下拉器件的组合的相对速度或强度，以及2）SRAM的位单元中的上拉器件。然后，如果需要，这些相对强度可用于调整字线上电压，以降低SRAM遇到稳定性故障的可能性。提供相应的系统用于确定感兴趣的装置的相对强度，用于确定所需的上限电压调整量以及用于选择和设定上限电压。

5. 发明授权

US08484543B2 Fusebay controller structure, system, and method 有权
标题翻译： Fusebay控制器结构，系统和方法
公开(公告)号：US08484543B2
公开(公告)日：2013-07-09
申请号：US13204929
申请日：2011-08-08
申请人： Darren L. Anand , Kevin W. Gorman , Michael R. Ouellette , Michael A. Ziegerhofer
发明人： Darren L. Anand , Kevin W. Gorman , Michael R. Ouellette , Michael A. Ziegerhofer
IPC分类号： H03M13/00
CPC分类号： G06F11/1048 , G11C17/165 , G11C29/027 , G11C2029/0411
摘要： Error correction is selectively applied to data, such as repair data to be stored in a fusebay for BIST/BISR on an ASIC or other semiconductor device. Duplicate bit correction and error correction code state machines may be included, and selectors, such as multiplexers, may be used to enable one or both types of correction. Each state machine may include an indicator, such as a “sticky bit,” that may be activated when its type of correction is encountered. The indicator(s) may be used to develop quality and yield control criteria during manufacturing test of parts including embodiments of the invention.
摘要翻译：选择性地将错误校正应用于数据，例如要存储在ASIC或其他半导体器件上的BIST / BISR的保险丝盒中的修复数据。可以包括重复的位校正和纠错码状态机，并且可以使用诸如多路复用器的选择器来实现一种或两种类型的校正。每个状态机可以包括诸如“粘性位”的指示符，当其遇到类型的校正时可以被激活。指示器可用于在包括本发明的实施例的部件的制造测试期间开发质量和产量控制标准。

6. 发明申请

US20130033951A1 STRUCTURE AND METHOD FOR STORING MULTIPLE REPAIR PASS DATA INTO A FUSEBAY 有权
标题翻译：将多个修复数据存入保险丝的结构和方法
公开(公告)号：US20130033951A1
公开(公告)日：2013-02-07
申请号：US13198894
申请日：2011-08-05
申请人： Kevin W. Gorman , Michael R. Ouellette , Michael A. Ziegerhofer
发明人： Kevin W. Gorman , Michael R. Ouellette , Michael A. Ziegerhofer
IPC分类号： G11C17/16
CPC分类号： G11C17/16 , G11C29/785 , G11C29/802
摘要： Fuse macros of identical number of pages are serially arranged to form the same number of fusebay pages each having a length equal to the sum of the respective fuse macro page lengths. Each fuse macro has an enable latch configured to allow activation of one fuse macro at a time. A fusebay control device connected to a repair register may store data in and retrieve data from the fusebay. Next available fuse location is determined in programming mode so that data from a next repair pass may start where the last data ended.
摘要翻译：相同页数的保险丝宏串联地形成相同数量的保险丝页，每个保险丝页的长度等于相应的熔丝宏页面长度之和。每个保险丝宏都有一个使能锁存器，配置为允许一次激活一个保险丝宏。连接到维修寄存器的保险丝控制装置可以将数据存储在保险丝盒中并从熔丝座检索数据。在编程模式下确定下一个可用的熔丝位置，以便下一个维修通过的数据可以在最后一个数据结束的地方开始。

7. 发明授权

US08239715B2 Method and apparatus for a robust embedded interface 有权
标题翻译：强大的嵌入式接口的方法和装置
公开(公告)号：US08239715B2
公开(公告)日：2012-08-07
申请号：US12144686
申请日：2008-06-24
申请人： Steven M. Eustis , Kevin W. Gorman , David E. Lackey , Michael R. Ouellette
发明人： Steven M. Eustis , Kevin W. Gorman , David E. Lackey , Michael R. Ouellette
IPC分类号： G01R31/28
CPC分类号： G01R31/318552 , G11C7/02 , G11C7/04 , G11C7/1072 , G11C29/023 , G11C29/028 , G11C29/1201 , G11C29/12015 , G11C29/48 , G11C2029/5602 , G11C2207/104
摘要： A method is provided for operating an interface between a first unit and a second unit supplying its data. The method includes switching control between LSSD_B and LSSD_C clocks and system clock (CLK) to provide a test mode of operation and a functional mode of operation to optimize setup and hold times depending on conditions under which the unit is operating. In the test mode, data is launched by the LSSD_C clock. In the functional mode, the data is launched by the system clock (CLK) to RAM. A method is also provided to determine which memory inputs should use a circuit that provides adequate setup and hold margins.
摘要翻译：提供一种用于操作第一单元和提供其数据的第二单元之间的接口的方法。该方法包括在LSSD_B和LSSD_C时钟之间的切换控制和系统时钟（CLK），以提供测试操作模式和功能操作模式，以根据单元运行的条件来优化建立和保持时间。在测试模式下，数据由LSSD_C时钟启动。在功能模式下，数据由系统时钟（CLK）发送到RAM。还提供了一种方法来确定哪些存储器输入应该使用提供足够的建立和保持余量的电路。

8. 发明授权

US08028195B2 Structure for indicating status of an on-chip power supply system 有权
标题翻译：用于指示片上电源系统状态的结构
公开(公告)号：US08028195B2
公开(公告)日：2011-09-27
申请号：US12114070
申请日：2008-05-02
申请人： Darren Anand , John A. Fifield , Kevin W. Gorman
发明人： Darren Anand , John A. Fifield , Kevin W. Gorman
IPC分类号： G06F11/00
CPC分类号： G01R31/31721 , G06F17/505 , G06F2217/78
摘要： A design structure embodied in a machine readable medium used in a design process includes a system for indicating status of an on-chip power supply system with multiple power supplies, having a power system status register for receiving digital compliance signals, each compliance signal associated with one of the multiple power supplies, and having an associated compliance level, wherein each digital compliance signal indicates whether its associated power supply is operating at the associated compliance level, and wherein the power system status register generates a power supply status signal based on the digital compliance signals indicating status of the digital compliance signals; and an output for outputting the power supply status signal, wherein if a power supply is operating at its associated compliance level, the power supply status signal indicates that the power supply is passing, otherwise the power supply status signal indicates that the power supply is failing.
摘要翻译：体现在设计过程中使用的机器可读介质中的设计结构包括用于指示具有多个电源的片上电源系统的状态的系统，具有用于接收数字符合性信号的电力系统状态寄存器，与多个电源中的一个并且具有相关联的合规级别，其中每个数字符合信号指示其相关联的电源是否在相关联的合规级别操作，并且其中电力系统状态寄存器基于数字信号产生电源状态信号指示数字符合信号状态的符合性信号; 以及用于输出电源状态信号的输出，其中如果电源正在其相关联的顺应性水平下操作，则电源状态信号指示电源正在通过，否则电源状态信号指示电源发生故障。

9. 发明申请

US20110029827A1 METHOD, APPARATUS, AND DESIGN STRUCTURE FOR BUILT-IN SELF-TEST 审中-公开
标题翻译：用于建筑自检的方法，设备和设计结构
公开(公告)号：US20110029827A1
公开(公告)日：2011-02-03
申请号：US12511739
申请日：2009-07-29
申请人： VALERIE H CHICKANOSKY , Kevin W. Gorman , Michael R. Ouellette , Michael A. Ziegerhofer
发明人： VALERIE H CHICKANOSKY , Kevin W. Gorman , Michael R. Ouellette , Michael A. Ziegerhofer
IPC分类号： G11C29/04 , G06F11/22
CPC分类号： G11C29/14
摘要： In one embodiment, the invention is a method, apparatus, and design structure for built-in self-test for embedded memory in integrated circuit chips. One embodiment of a method for built-in self-test of an embedded memory includes setting up a plurality of test patterns at a speed of a test clock, where the speed of the test clock is slow enough for a tester to directly communicate with a chip in which the memory is embedded, and where the setting up includes loading a plurality of signal states used to communicate the test patterns to one or more components of a built-in self-test system, applying the test patterns to the embedded memory as a microburst at-speed, capturing output data from the embedded memory at-speed, the output data corresponding to only one of test patterns, and comparing the output data to expected data at the speed of the test clock.
摘要翻译：在一个实施例中，本发明是用于集成电路芯片中的嵌入式存储器的内置自检的方法，装置和设计结构。用于嵌入式存储器的内置自检的方法的一个实施例包括以测试时钟的速度设置多个测试图案，其中测试时钟的速度足够慢以使测试者直接与一个芯片，其中嵌入存储器，并且其中的设置包括将用于将测试图案传送到内置自检系统的一个或多个组件的多个信号状态，将测试图案作为高速微冲速，以速度从嵌入式存储器捕获输出数据，输出数据仅对应于测试模式之一，并且以测试时钟的速度将输出数据与期望数据进行比较。

10. 发明授权

US07689887B2 Automatic shutdown or throttling of a BIST state machine using thermal feedback 失效
标题翻译：使用热反馈自动关闭或调节BIST状态机
公开(公告)号：US07689887B2
公开(公告)日：2010-03-30
申请号：US11962781
申请日：2007-12-21
申请人： Kevin W. Gorman , Emory D. Keller , Michael R. Ouellette
发明人： Kevin W. Gorman , Emory D. Keller , Michael R. Ouellette
IPC分类号： G06F11/00 , G06F13/24 , G01R31/28 , G01R31/00 , G01R31/02
CPC分类号： G11C29/14 , G01K3/005 , G11C29/12 , G11C2029/5002
摘要： A Built-In-Self-Test (BIST) state machine providing BIST testing operations associated with a thermal sensor device(s) located in proximity to the circuit(s) to which BIST testing operations are applied, and a design structure including the BIST state machine embodied in a machine readable medium are provided. The thermal sensor device compares the current temperature value sensed to a predetermined temperature threshold and determines whether the predetermined threshold is exceeded. A BIST control element suspends the BIST testing operation in response to meeting or exceeding said predetermined temperature threshold, and initiates resumption of BIST testing operations when the current temperature value normalizes or is reduced. A BIST testing methodology implements steps for mitigating the exceeded temperature threshold condition in response to determining that the predetermined temperature threshold is met or exceeded. These steps include one of: ignoring the BIST results of the suspect circuit(s), or by causing the BIST state machine to enter a wait state and adjusting operating parameters of the suspect circuits while in the wait state.
摘要翻译：内置自测试（BIST）状态机，提供与位于BIST测试操作所在电路附近的热传感器设备相关联的BIST测试操作，以及包括BIST的设计结构提供了体现在机器可读介质中的状态机。热传感器装置将感测到的当前温度值与预定温度阈值进行比较，并确定是否超过预定阈值。 BIST控制元件响应于满足或超过所述预定温度阈值而暂停BIST测试操作，并且当当前温度值归一化或降低时，启动BIST测试操作的恢复。响应于确定满足或超过预定温度阈值，BIST测试方法实现了减轻超过温度阈值条件的步骤。这些步骤包括：忽略可疑电路的BIST结果，或通过使BIST状态机进入等待状态，并在等待状态下调整可疑电路的工作参数。

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