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    • 5. 发明授权
    • Access line management in a memory device
    • 存储设备中的接入线管理
    • US08638632B2
    • 2014-01-28
    • US12888765
    • 2010-09-23
    • Benjamin LouieAli MohammadzadehAaron Yip
    • Benjamin LouieAli MohammadzadehAaron Yip
    • G11C5/14
    • G11C16/24G11C16/0483G11C16/06G11C16/08G11C16/10G11C16/14G11C16/26
    • Memory devices and methods are disclosed, such as devices configured to store a number of access line biasing patterns to be applied during a memory device operation performed on a particular row of memory cells in the memory device. Memory devices are further configured to support modification of the stored bias patterns, providing flexibility in biasing access lines through changes to the bias patterns stored in the memory device. Methods and devices further facilitate performing memory device operations under multiple biasing conditions to evaluate and characterize the memory device by adjustment of the stored bias patterns without requiring an associated hardware change to the memory device.
    • 公开了存储器件和方法,诸如被配置为存储在对存储器件中的特定行存储器单元执行的存储器件操作期间要施加的多个访问线偏置模式的器件。 存储器设备被进一步配置为支持所存储的偏置图案的修改,通过对存储在存储器件中的偏置图案的改变来偏置访问线路提供灵活性。 方法和设备进一步便于在多个偏置条件下执行存储器件操作,以通过调整存储的偏压图案来评估和表征存储器件,而不需要对存储器件的相关联的硬件改变。
    • 8. 发明授权
    • Sensing scheme in a memory device
    • 存储设备中的感应方案
    • US08593876B2
    • 2013-11-26
    • US13085611
    • 2011-04-13
    • Violante MoschianoGiovanni SantinTommaso Vali
    • Violante MoschianoGiovanni SantinTommaso Vali
    • G11C11/34G11C7/00
    • G11C16/0483G11C16/26
    • Methods of operating memory devices, generating reference currents in memory devices, and sensing data states of memory cells in a memory device are disclosed. One such method includes generating reference currents utilized in sense amplifier circuitry to manage leakage currents while performing a sense operation within a memory device. Another such method activates one of two serially coupled transistors along with activating and deactivating the second transistor serially coupled with the first transistor thereby regulating a current through both serially coupled transistors and establishing a particular reference current.
    • 公开了在存储器件中操作存储器件,产生存储器件中的参考电流以及感测存储器单元的数据状态的方法。 一种这样的方法包括产生在读出放大器电路中使用的参考电流,以在存储器件内进行感测操作的同时管理泄漏电流。 另一种这样的方法激活两个串联耦合晶体管中的一个,同时激活和去激活与第一晶体管串联耦合的第二晶体管,从而调节通过两个串联耦合的晶体管的电流并建立特定的参考电流。
    • 9. 发明授权
    • Programming error correction code into a solid state memory device with varying bits per cell
    • 将错误纠正码编程成固态存储器件,每个单元具有不同位数
    • US08578244B2
    • 2013-11-05
    • US13633158
    • 2012-10-02
    • Micron Technology, Inc
    • Frankie F. RoohparvarVishal SarinJung S. Hoei
    • G11C29/00G11C5/14H03M13/00G06F11/00
    • G06F11/1076G06F11/1072G11C29/12005
    • Memory devices that, in a particular embodiment, receive and transmit analog data signals representative of bit patterns of two or more bits such as to facilitate increases in data transfer rates relative to devices communicating data signals indicative of individual bits. Programming error correction code (ECC) and metadata into such memory devices includes storing the ECC and metadata at different bit levels per cell based on an actual error rate of the cells. The ECC and metadata can be stored with the data block at a different bit level than the data block. If the area of memory in which the block of data is stored does not support the desired reliability for the ECC and metadata at a particular bit level, the ECC and metadata can be stored in other areas of the memory array at different bit levels.
    • 在特定实施例中,存储设备接收和发送表示两个或多个位的位模式的模拟数据信号,以便于相对于传送指示各个位的数据信号的设备的数据传输速率的增加。 编程错误校正码(ECC)和元数据到这种存储器设备中包括基于单元的实际错误率将ECC和元数据存储在每个小区的不同比特级。 ECC和元数据可以与数据块存储在与数据块不同的位级别。 如果其中存储数据块的存储器区域不支持在特定位级别的ECC和元数据的期望的可靠性,则ECC和元数据可以以不同的位电平存储在存储器阵列的其他区域中。